2014 15th Latin American Test Workshop - LATW最新文献_第2页

Hierarchical identification of NBTI-critical gates in nanoscale logic 纳米级逻辑中nbti临界门的层次识别

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841926

S. Kostin, J. Raik, R. Ubar, M. Jenihhin, F. Vargas, L. Bolzani, T. Copetti

引用次数: 12

Efficient metric for register file criticality in processor-based systems 基于处理器的系统中寄存器文件临界性的有效度量

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841922

Felipe Restrepo-Calle, S. Cuenca-Asensi, A. Martínez-Álvarez, E. Chielle, F. Kastensmidt

引用次数: 3

Simplified stimuli generation for scenario and assertion based verification 简化了基于场景和断言验证的刺激生成

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841904

Luca Piccolboni, G. Pravadelli

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引用次数: 10

SEU fault-injection at system level: Method, tools and preliminary results 系统级的SEU故障注入:方法、工具和初步结果

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841907

W. Mansour, P. Ramos, R. Ayoubi, R. Velazco

引用次数: 4

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing 模拟/射频交替测试中间接测量选择策略的评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841930

S. Larguech, F. Azaïs, S. Bernard, V. Kerzérho, M. Comte, M. Renovell

引用次数: 8

Fault tolerance evaluation of RFID tags RFID标签的容错评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841902

Omar Abdelmalek, D. Hély, V. Beroulle

引用次数: 4

Implementation and experimental evaluation of a CUDA core under single event effects 单事件效应下CUDA核心的实现与实验评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841913

Werner Nedel, F. Kastensmidt, J. Azambuja

引用次数: 2

Schmitt trigger on output inverters of NCL gates for soft error hardening: Is it enough? 对NCL门输出逆变器的施密特触发器进行软错误强化:是否足够?

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841925

R. Guazzelli, G. Heck, Matheus T. Moreira, Ney Laert Vilar Calazans

引用次数: 3

Specification test minimization for given defect level 针对给定的缺陷级别，规范测试最小化

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841927

S. Sindia, V. Agrawal

引用次数: 2

Improving the robustness of a switch box in a mesh of clusters FPGA 提高集群网格FPGA中开关盒的鲁棒性

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841901

Arwa Ben Dhia, M. Slimani, L. Naviner

引用次数: 0