2014 15th Latin American Test Workshop - LATW最新文献_第2页

Fault tolerant linear state machines 容错线性状态机

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841914

S. Weidling, M. Gössel

引用次数: 0

Hierarchical identification of NBTI-critical gates in nanoscale logic 纳米级逻辑中nbti临界门的层次识别

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841926

S. Kostin, J. Raik, R. Ubar, M. Jenihhin, F. Vargas, L. Bolzani, T. Copetti

引用次数: 12

Efficient metric for register file criticality in processor-based systems 基于处理器的系统中寄存器文件临界性的有效度量

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841922

Felipe Restrepo-Calle, S. Cuenca-Asensi, A. Martínez-Álvarez, E. Chielle, F. Kastensmidt

引用次数: 3

Simplified stimuli generation for scenario and assertion based verification 简化了基于场景和断言验证的刺激生成

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841904

Luca Piccolboni, G. Pravadelli

{"title":"Simplified stimuli generation for scenario and assertion based verification","authors":"Luca Piccolboni, G. Pravadelli","doi":"10.1109/LATW.2014.6841904","DOIUrl":"https://doi.org/10.1109/LATW.2014.6841904","url":null,"abstract":"Simulation-based approaches that require to drive the design under verification (DUV) to specific conditions, like for example, scenario-based testing and dynamic assertion-based verification (ABV), cannot rely on generic coverage-driven stimuli generators. On the contrary, constraint-based generation must be adopted. In this context, among several solutions, the Universal Verification Methodology (UVM) and the SystemC Verification Library (SCV) represent the main alternatives. However, their powerfulness is paid in term of easiness of use. In fact, their application generally requires to write complex pieces of code to specify the constraints that must be satisfied by the stimuli generator to produce the desired sequences of values. More is the complexity of setting up an effective stimuli generator, more is the risk of failing to capture the right behaviour and/or having a longer verification time. To overcome these problems, the paper presents a framework and a corresponding language for the automatic generation of stimuli that requires to write intuitive and compact directives representing the desired constraints. The approach is independent from the language adopted for the DUV implementation and it works for both embedded hardware as well as embedded software.","PeriodicalId":305922,"journal":{"name":"2014 15th Latin American Test Workshop - LATW","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126861768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

SEU fault-injection at system level: Method, tools and preliminary results 系统级的SEU故障注入:方法、工具和初步结果

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841907

W. Mansour, P. Ramos, R. Ayoubi, R. Velazco

引用次数: 4

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing 模拟/射频交替测试中间接测量选择策略的评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841930

S. Larguech, F. Azaïs, S. Bernard, V. Kerzérho, M. Comte, M. Renovell

引用次数: 8

Fault tolerance evaluation of RFID tags RFID标签的容错评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841902

Omar Abdelmalek, D. Hély, V. Beroulle

引用次数: 4

Implementation and experimental evaluation of a CUDA core under single event effects 单事件效应下CUDA核心的实现与实验评估

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841913

Werner Nedel, F. Kastensmidt, J. Azambuja

引用次数: 2

Schmitt trigger on output inverters of NCL gates for soft error hardening: Is it enough? 对NCL门输出逆变器的施密特触发器进行软错误强化:是否足够?

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841925

R. Guazzelli, G. Heck, Matheus T. Moreira, Ney Laert Vilar Calazans

引用次数: 3

Harmonic distortion correction for 8-bit delay line ADC using gray code 用灰度码校正8位延迟线ADC的谐波失真

2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841928

Hsun-Cheng Lee, J. Abraham

引用次数: 2