2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)最新文献

Extraction of deterministic and random LSI noise models with the printed reverberation board 用印刷混响板提取确定性和随机的大规模集成电路噪声模型

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/emccompo.2013.6735166

U. Paoletti, T. Suga

引用次数: 1

Characterization of conducted emission at high frequency under different temperature 不同温度下高频传导发射特性的研究

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735190

N. Berbel, R. Fernández-García, I. Gil

引用次数: 1

Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers 评估衬底噪声对汽车微控制器传导EMI的影响

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735186

M. Cazzaniga, Patrice Joubert Doriol, Aurora Sanna, Emmanuel Blanc, V. Liberali, D. Pandini

{"title":"Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers","authors":"M. Cazzaniga, Patrice Joubert Doriol, Aurora Sanna, Emmanuel Blanc, V. Liberali, D. Pandini","doi":"10.1109/EMCCOMPO.2013.6735186","DOIUrl":"https://doi.org/10.1109/EMCCOMPO.2013.6735186","url":null,"abstract":"Board-level I/Os signal integrity and conducted EMI have become a critical concern for high-speed circuit and package designers, and a major element of performance and reliability degradation in modern electronic systems, in particular for automotive microcontrollers, which must satisfy stringent low-EMI and noise immunity requirements. One of the most detrimental root causes of I/O signals conducted EMI is the simultaneous switching noise generated by the toggling I/Os (SSO) on the power distribution network of the I/O ring. However, this is not the only noise source that must be considered. In fact, an often overlooked contributor to SSO is the noise generated by the switching digital core that propagates to the I/Os and the noise-sensitive on-chip analog circuitry throughout the common silicon substrate. In this work, we analyze the impact of substrate noise on the I/O signals conducted EMI of an industrial automotive microcontroller, and we compare it against other noise sources. Moreover, we demonstrate the effectiveness of the technological protections against substrate noise in a leading-edge technology.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123371596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI 辐射和电磁干扰下嵌入式系统片上看门狗的可靠性分析

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735179

C. Oliveira, J. Benfica, L. Bolzani, F. Vargas, J. Lipovetzky, A. Lutenberg, E. Gatti, F. Hernandez, A. Boyer

{"title":"Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI","authors":"C. Oliveira, J. Benfica, L. Bolzani, F. Vargas, J. Lipovetzky, A. Lutenberg, E. Gatti, F. Hernandez, A. Boyer","doi":"10.1109/EMCCOMPO.2013.6735179","DOIUrl":"https://doi.org/10.1109/EMCCOMPO.2013.6735179","url":null,"abstract":"Due to stringent constraints such as battery-powered, high-speed, low-voltage power supply and noise-exposed operation, safety-critical real-time embedded systems are often subject to transient faults originated from a large spectrum of noisy sources; among them, conducted and radiated Electromagnetic Interference (EMI). As the major consequence, the system's reliability degrades. In this paper, we present the most recent results involving the reliability analysis of a hardware-based intellectual property (IP) core, namely Real-Time Operating System - Guardian (RTOS-G). This is an on-chip watchdog that monitors the RTOS' activity in order to detect faults that corrupt tasks' execution flow in embedded systems running preemptive RTOS. Experimental results based on the Plasma processor IP core running different test programs that exploit several RTOS resources have been developed. During test execution, the proposed system was aged by means of total ionizing dose (TID) radiation and then, exposed to radiated EMI according to the international standard IEC 62.132-2 (TEM Cell Test Method). The obtained results demonstrate the proposed approach provides higher fault coverage and reduced fault latency when compared to the native (software) fault detection mechanisms embedded in the kernel of the RTOS.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134355650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs 射频集成电路中存在带内干扰时无线通信性能的基于测量的诊断

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735169

M. Nagata, S. Shimazaki, N. Azuma, Shin-ichiro Takahashi, M. Murakami, K. Hori, S. Tanaka, M. Yamaguchi

{"title":"Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs","authors":"M. Nagata, S. Shimazaki, N. Azuma, Shin-ichiro Takahashi, M. Murakami, K. Hori, S. Tanaka, M. Yamaguchi","doi":"10.1109/EMCCOMPO.2013.6735169","DOIUrl":"https://doi.org/10.1109/EMCCOMPO.2013.6735169","url":null,"abstract":"In-band interferers in wireless communication channels are due to the high order harmonics of multiple clock frequencies used by baseband digital signal processing in a single-chip solution. The impacts of in-band spurious tones on wireless performance are explored with hardware-in-the-loop simulation (HILS) of the LTE compliant systems. RF receiver circuits fabricated in a 65 nm CMOS technology are involved in the HILS, for combining circuit-level interactions at the front end and system-level digital signal processing in the back end. Experiments exhibit the sensitivity of LTE communication throughput against substrate coupling noise from a digital noise emulator to the RF receiver circuits on the same chip. The observed response is equivalently confirmed with the input referred RF sinusoidal noise components intentionally added to the input RF signal with LTE modulation. The HILS enables hierarchical diagnosis of a wireless communication system from circuit-level interactions to system-level responses against noise coupling.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131478500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Discrete low-frequency transistors subjected to high-frequency CW and pulse-modulated sine signals 受高频连续波和脉冲调制正弦信号影响的分立低频晶体管

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735204

S. Jarrix, J. Raoult, A. Doridant, C. Pouant, P. Hoffmann

引用次数: 1

Active magnetic field canceling system 主动磁场抵消系统

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735184

Weiyang Sun, Feng-Chang Chuang, Yu-Lin Song, Chwen Yu, T. Ma, Tzong-Lin Wu, Luh-Maan Chang

引用次数: 4

Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator DPI法定量LDO调压器射频传导免疫重现性的改进

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735173

T. Matsushima, Nobuaki Ikehara, T. Hisakado, O. Wada

引用次数: 6

Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission 数字集成电路电应力的表征与建模，功率完整性与传导发射

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735199

A. Boyer, S. Bendhia

引用次数: 5

Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulator 基于CMOS数字噪声仿真器的射频集成电路衬底噪声耦合测量与仿真

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2013-12-01 DOI: 10.1109/EMCCOMPO.2013.6735170

N. Azuma, S. Shimazaki, N. Miura, M. Nagata, T. Kitamura, Shin-ichiro Takahashi, M. Murakami, K. Hori, A. Nakamura, K. Tsukamoto, M. Iwanami, E. Hankui, S. Muroga, Y. Endo, S. Tanaka, M. Yamaguchi

引用次数: 14