{"title":"Plasma emission spectroscopy related to the optical properties of silicon oxynitride films for inhomogeneous filters","authors":"Ramón Rodríguez López Rrl, Noemi Abundiz Cisneros Nac, Roberto Sanginés de Castro RSC, Juan Águila Muñoz Jam, Roberto Machorro Mejía RMM.","doi":"10.1364/oic.2022.wc.6","DOIUrl":"https://doi.org/10.1364/oic.2022.wc.6","url":null,"abstract":"The optical plasma spectroscopy was correlated with the optical properties of SiNxOy synthesized by reactive magnetron sputtering. A principal component analysis of the system data was developed to monitor the synthesis of inhomogeneous filters.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114380789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Perner, G. Winkler, G. Truong, D. Follman, J. Fellinger, Maximilian Prinz, S. Puchegger, G. Cole, O. Heckl
{"title":"High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers","authors":"L. Perner, G. Winkler, G. Truong, D. Follman, J. Fellinger, Maximilian Prinz, S. Puchegger, G. Cole, O. Heckl","doi":"10.1364/oic.2022.wa.5","DOIUrl":"https://doi.org/10.1364/oic.2022.wa.5","url":null,"abstract":"We report a method to measure the refractive index of two or more materials in as-deposited thin-film structures by analysis of FTIR transmittance spectra and extraction of layer thicknesses via SEM, yielding excellent results for a GaAs/AlGaAs DBR.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114518694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Light-Scattering Properties of Low Refractive Index SiO2 Optical Thin Films Deposited by a Combination Coating Method of Sputter Deposition and Electron Beam Deposition","authors":"Taisei Wakamiya, H. Murotani, Takayuki Matsudaira","doi":"10.1364/oic.2022.tha.10","DOIUrl":"https://doi.org/10.1364/oic.2022.tha.10","url":null,"abstract":"This report discusses a method for evaluating the light-scattering properties by pores in low refractive index SiO2 optical thin films that were deposited by a combination coating method of sputter deposition and electron beam deposition.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124962406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Amochkina, M. Trubetskov, V. Janicki, J. Parramon
{"title":"Characterization of Electron-beam Deposited TiO2/SiO2 Coatings Based on Multi-Sample Photometric and Ellipsometric Data","authors":"T. Amochkina, M. Trubetskov, V. Janicki, J. Parramon","doi":"10.1364/oic.2022.tha.5","DOIUrl":"https://doi.org/10.1364/oic.2022.tha.5","url":null,"abstract":"A post-production characterization approach based on spectral photometric and ellipsometric data related to a specially developed set of samples is proposed. Reliability of the approach is demonstrated.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"52 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129395386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Qian, O. Zabeida, A. Argoitia, R. Sargent, J. Klemberg-Sapieha, L. Martinu
{"title":"SiO2 and TiO2 encapsulation of light interference pigments by Fluidized Bed Chemical Vapor Deposition (FBCVD)","authors":"J. Qian, O. Zabeida, A. Argoitia, R. Sargent, J. Klemberg-Sapieha, L. Martinu","doi":"10.1364/oic.2022.fb.10","DOIUrl":"https://doi.org/10.1364/oic.2022.fb.10","url":null,"abstract":"SiO2 and TiO2 coatings were deposited by using fluidized bed chemical vapor deposition (FBCVD) process on the light interference pigments made of multi-layer flakes to improve their corrosion resistance for waterborne applications.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132048043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Pulse Ionized Silicon Nanostructures: Investigation of Optical Properties","authors":"Nishant Singh Jamwal, Amirkianoosh Kiani","doi":"10.1364/oic.2022.md.4","DOIUrl":"https://doi.org/10.1364/oic.2022.md.4","url":null,"abstract":"We introduce a method for increasing silicon band gap via ultrashort laser pulse ionization. Different silicon nanostructures have been generated by varying the ablation scanning speed and the optical properties were examined.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123753368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Hahner, Philipp Steinleitner, Yu Chen, K. Mak, F. Krausz, V. Pervak
{"title":"Third-order dispersion compensating mirror pair for 2µm-based laser systems","authors":"D. Hahner, Philipp Steinleitner, Yu Chen, K. Mak, F. Krausz, V. Pervak","doi":"10.1364/oic.2022.ta.6","DOIUrl":"https://doi.org/10.1364/oic.2022.ta.6","url":null,"abstract":"A third-order dispersion compensating mirror pair was designed, produced and characterized. It covers the spectral range from 1.2-3.2µm. This is shown by the application in a Cr:ZnS laser system.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131182141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kristin Gerold, V. Beladiya, Pallabi Paul, David Kästner, M. Saarniheimo, Kalle Niiranen, S. Schröder, A. Szeghalmi
{"title":"Conformal antireflection coatings on large optical cubes","authors":"Kristin Gerold, V. Beladiya, Pallabi Paul, David Kästner, M. Saarniheimo, Kalle Niiranen, S. Schröder, A. Szeghalmi","doi":"10.1364/oic.2022.tc.3","DOIUrl":"https://doi.org/10.1364/oic.2022.tc.3","url":null,"abstract":"Complex 3D-shaped optics are difficult to coat with conventional technologies. In this study, atomic layer deposition was applied to realize uniform antireflection properties on simultaneously coated large, top-open optical cubes with a 100mm side length.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116525869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical properties of obliquely deposited silver on a periodically structured surface","authors":"Y. Jen, Chi-Chan Jao, Xing-Hao Lo, Tingting Lin","doi":"10.1364/oic.2022.fb.13","DOIUrl":"https://doi.org/10.1364/oic.2022.fb.13","url":null,"abstract":"Oblique angle deposition was adopted to deposit silver onto a dielectric nanoimprint grating to reveal high TM reflection band associated with reversal of localized magnetic field. The TM reflectance peak was varied with deposition angle.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127811279","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Domaradzki, M. Mazur, D. Wojcieszak, A. Wiatrowski, Ewa Mankowska
{"title":"Analysis of optical properties of transparent (Ti,Cu)Ox gradient thin film","authors":"J. Domaradzki, M. Mazur, D. Wojcieszak, A. Wiatrowski, Ewa Mankowska","doi":"10.1364/oic.2022.td.5","DOIUrl":"https://doi.org/10.1364/oic.2022.td.5","url":null,"abstract":"Performed reverse engineering analysis showed the complex dependence of the optical properties on the material composition and the microstructure properties of the (Ti,Cu)Ox gradient thin film prepared using multi-magnetron co-sputtering.","PeriodicalId":301400,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2022","volume":"291 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132622073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}