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2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)最新文献

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Industry consensus approach to physics of failure in reliability prediction 可靠性预测中失效物理的工业共识方法
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448043
L. Bechtold
{"title":"Industry consensus approach to physics of failure in reliability prediction","authors":"L. Bechtold","doi":"10.1109/RAMS.2010.5448043","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448043","url":null,"abstract":"Traditional reliability prediction methods are being confounded by current and near future semiconductor technologies, as gate feature sizes shrink below 100 nanometers (nm) causing the emergence of atomic level failure mechanisms and early wearout. These devices and their failure characteristics are rapidly changing as the semiconductor industry aggressively pursues scaling in a highly competitive marketplace. The Physics of Failure (PoF) approach to reliability has advantages for assessing these technologies. Industry groups are adapting PoF research results for use in predicting reliability for these technologies. This paper describes industry collaborative efforts in developing new reliability prediction approaches to meet future industry challenges.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124410121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Enhancing MIL-HDBK-217 reliability predictions with physics of failure methods 用失效物理方法增强MIL-HDBK-217可靠性预测
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448044
J. McLeish
{"title":"Enhancing MIL-HDBK-217 reliability predictions with physics of failure methods","authors":"J. McLeish","doi":"10.1109/RAMS.2010.5448044","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448044","url":null,"abstract":"The Defense Standardization Program Office (DSPO) of the U.S. Department of Defense's (DoD) has initiated a multiphase effort to update MIL-HDBK-217 (217), the military's often imitated and frequently criticized reliability prediction bible for electronics equipment. This document, based on field data fitted empirical models, has not been updated since 1995. The lack of updates led to expectations that its statistically-based empirical approach would be phased out. Especially after science-based Physics of Failure (PoF) [a.k.a. Reliability Physics] research led Gilbert F. Decker, Assistant Secretary of the Army for Research, Development and Acquisition to declare that MIL-HDBK-217 was not to appear in Army RFP acquisition requirements as it had been “shown to be unreliable and its use can lead to erroneous and misleading reliability predictions”[1].","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"71 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120916829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 51
New Army and DoD reliability scorecard 新陆军和国防部可靠性记分卡
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448062
Marguerite H. Shepler, Nancy Welliver
{"title":"New Army and DoD reliability scorecard","authors":"Marguerite H. Shepler, Nancy Welliver","doi":"10.1109/RAMS.2010.5448062","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448062","url":null,"abstract":"As a part of the Department of Defense (DoD) Reliability Improvement Working Group, the U.S. Army Evaluation Center (AEC) and the U.S. Army Materiel Systems Analysis Activity (AMSAA) developed an Excel-based Reliability Program Scorecard tool to standardize the assessment of a program's path to meeting its reliability requirements.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115530958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Revision of MIL-HDBK-217, Reliability Prediction of Electronic Equipment MIL-HDBK-217电子设备可靠性预测的修订
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448046
J. W. Harms
{"title":"Revision of MIL-HDBK-217, Reliability Prediction of Electronic Equipment","authors":"J. W. Harms","doi":"10.1109/RAMS.2010.5448046","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448046","url":null,"abstract":"This paper will discuss current efforts in the revision of MIL-HDBK-217, Military Handbook, Reliability Prediction of Electronic Equipment. It has been over a decade since this reliability prediction handbook was last updated, yet it remains the most widely used reliability prediction method for electronic equipment. In February 2008, the Defense Standardization Program Office (DSPO) tasked the Crane Division, Naval Surface Warfare Center (NSWC Crane), as the Preparing Activity, to revise MIL-HDBK-217. A plan has been created to refresh the handbook and to look at adding a new approach to better reflect reliability of electronic equipment. A working group of individuals representing Department of Defense (DoD) and industry has been established to conduct this revision. Development and implementation of solutions that reflect industry best practices and DoD needs is critical for success. Results of this task are planned to be new revisions of MIL-HDBK-217. These revisions will provide an updated reliability prediction tool that will assist reliability engineers in performing their work.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132415908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 62
Design for reliability in medical devices 医疗设备可靠性设计
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448077
V. Hegde, D. Raheja
{"title":"Design for reliability in medical devices","authors":"V. Hegde, D. Raheja","doi":"10.1109/RAMS.2010.5448077","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448077","url":null,"abstract":"Make sure you define requirements fully at the beginning of the project; try to design failures out of your product; always evaluate the impact of reliability in terms of overall cost, and design for durability and prognostics. In conclusion, apply the five paradigms mentioned in this paper to ensure a successful design for reliability program in the medical device industry.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"177 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115440569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Customized warranty policies for heterogeneous populations 针对异质人群的定制保修政策
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448076
D. St. John, C. R. Cassady
{"title":"Customized warranty policies for heterogeneous populations","authors":"D. St. John, C. R. Cassady","doi":"10.1109/RAMS.2010.5448076","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448076","url":null,"abstract":"Warranty policies are typically optimized under the assumption that customer populations are homogeneous—each customer's time to failure is calculated from the same probability distribution. A more realistic approach to the study of optimal warranty duration leads to the consideration of heterogeneous customer populations, where customers can be divided into groups, with each group following a separate failure distribution. This situation can be addressed in two ways. First, the individual failure distributions can be used to find optimal warranty durations for each customer group. Second, the distributions of the groups can be mixed to form a single distribution, used to optimize a warranty policy for the entire population. In this study, our objective is to analyze the economic impact of implementing a customized warranty policy. We begin by calculating failure distributions for each customer group that are dependent on the differentiating customer characteristic as well as one for the entire population. In addition, we develop a demand curve that is a function of the warranty duration and a profit function that utilizes demand, population, and failure properties to determine the total profit generated by each customer group. We can maximize this profit by changing the duration of the warranty to find an optimal warranty policy for each of these customer profiles. The same profit optimization is then used to develop a warranty policy for the overall distribution situation. We find that the implementation of customized warranty policies increases the profitability of the system when operating under the assumption that customization does not change the demand profile.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115702711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Downwards propagating: Bayesian analysis of complex on-demand systems 向下传播:复杂按需系统的贝叶斯分析
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448023
C. Jackson, A. Mosleh
{"title":"Downwards propagating: Bayesian analysis of complex on-demand systems","authors":"C. Jackson, A. Mosleh","doi":"10.1109/RAMS.2010.5448023","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448023","url":null,"abstract":"A Bayesian approach for inference from multiple overlapping higher level data sets on component failure probabilities within complex on demand systems is presented in this paper (systemic or sub-systemic data is referred to as higher level data as it appears ‘higher’ in visualization methodologies). The approach is based on a detailed understanding of the system logic represented using fault-trees, reliability block diagrams or another similar representation. Structure functions of the relevant sensors in terms of component states are used in conjunction with the probability of all possible system states to generate the likelihood function of overlapping evidence. This forms the basis of the likelihood function used in the Bayesian analysis of the overlapping data sets.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123181413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Step-Stress ADT data estimation based on time series method 基于时间序列方法的阶跃应力ADT数据估计
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448025
Li Wang, Xiaoyang Li, B. Wan, T. Jiang
{"title":"Step-Stress ADT data estimation based on time series method","authors":"Li Wang, Xiaoyang Li, B. Wan, T. Jiang","doi":"10.1109/RAMS.2010.5448025","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448025","url":null,"abstract":"For long lifetime and high reliability products, it is difficult to obtain failure time data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases that few or no failure time data could be obtained but degradation data of the primary parameter of the product are available. Step-Stress ADT (SSADT) is commonly used for the advantage that it needs only a few test samples to conduct a life test. For reliability and lifetime evaluation in SSADT, previous works use deterministic functions to represent the product performance degradation process. However, it does not represent performance degradation information adequately. It is necessary to add stochastic information description to performance degradation process. Time series analysis can represent stochastic information. During the last two decades, considerable research has been carried out in time series analysis. However, only few papers have studied the degradation data analyze method based on time series method. Moreover, SSADT data analysis based on time series method has not been reported in literature at present.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123450908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A general framework for modeling equipment aging 设备老化建模的一般框架
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5447987
J. A. Nachlas, C. R. Cassady
{"title":"A general framework for modeling equipment aging","authors":"J. A. Nachlas, C. R. Cassady","doi":"10.1109/RAMS.2010.5447987","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5447987","url":null,"abstract":"For many types of devices and systems, age is not well described by duration of ownership. The most obvious example of the distinction between age and clock time occurs when a device may be turned off or is not used continuously. More interesting cases are those in which age is accumulated at a variable rate as a consequence of the operational profile the device experiences. In this paper, we develop a general model that permits the analyst to portray three specific features of equipment use in the calculation of age accumulation. The three features are (1) variation in intensity of use, (2) variation in ambient operating conditions and (3) changes in device technology associated with different vintages of the equipment. The general model allows for any or all of these aspects of aging to be represented. Several analytical examples are constructed and analyzed. The analysis shows that the model provides greater sensitivity to operating profiles than previously used aging models and also that those previous models can be obtained as special cases of the model developed here. Thus, previous models are approximations for the model defined here. It is shown that an important implication of the more precise computation of equipment age is the ability to construct more effective preventive maintenance plans.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121110738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Development of photonics component failure rate models 光电元件故障率模型的建立
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448045
D. Nicholls, J. Mazurowski, A. Avak, M. Hackert
{"title":"Development of photonics component failure rate models","authors":"D. Nicholls, J. Mazurowski, A. Avak, M. Hackert","doi":"10.1109/RAMS.2010.5448045","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448045","url":null,"abstract":"This paper summarizes the results of a photonics component and subsystem reliability modeling study that was performed by Quanterion Solutions Incorporated (QSI) under a project sponsored through the Penn State Electro-Optics Center (EOC) by the Naval Air Systems Command under Contract Number N00421-03-D-0044 Delivery Order 08 (approved for public release: control number 09-770) [1]. The overall project consisted of four separate tasks.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"276 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121295147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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