{"title":"Knowledge-based troubleshooting and diagnosis of electronic devices","authors":"R. Vaez-Ghaemi","doi":"10.1109/IMTC.1989.36874","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36874","url":null,"abstract":"The author discusses information acquisition problems in connection with the application of a knowledge-based system for testing and diagnosis of a specific electronic device. The required information is acquired to some extent from CAD/CAE (computer aided design/engineering) data supplied by the design engineer during the development phase. The remaining information is elicited from the designer in a supplementary interview session. After describing the acquisition of graphical data from the CAD/CAE database, the author describes the acquisition of test and diagnostic knowledge and measuring information through the MEXPERT knowledge-based consultant.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121530420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"New internationally adopted reference standards of voltage and resistance based on the Josephson and quantum Hall effects","authors":"B. Taylor","doi":"10.1109/IMTC.1989.36846","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36846","url":null,"abstract":"By international agreement, starting on January 1, 1990, new reference standards of voltage and resistance based on the Josephson and quantum Hall effects, respectively, are to come into effect worldwide. Implementation of the new standards in the US requires that the value of the present national representation of the volt and ohm maintained at the National Institute of Standards and Technology (NIST) be increased by 9.264 and 1.69 parts per million (ppm), respectively. These changes are sufficiently large that literally thousands of electrical standards, measuring instruments, and electronic systems throughout the US will have to be adjusted in order to conform with the new US volt and ohm representation.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132435314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A microprocessor based system for vibration testing of aircraft structures","authors":"S. Ganesan","doi":"10.1109/IMTC.1989.36890","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36890","url":null,"abstract":"The author describes an instrumentation system for studying the dynamics of aircraft structures and helicopter rotor blade models. The requirements of various systems for microprocessor-based vibration control and analysis of various systems and details of the instrument are presented. The design of a microprocessor system based on DSP (digital signal processing) microprocessors, an interface to various signal sensors, sensor mounting and selection criteria, signal transmission from the rotating structure to a microprocessor input port, signal processing algorithms, multiblade coordinate transformation, and mode shape analyzer implementation details are discussed. The advantages of using multiple DSP microprocessors for this application are given. Advantages such as online display of the result at the testing site, flexibility, and accuracy are highlighted.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132011449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Performance of a custom high precision potentiometric device","authors":"E. Arri, N. Locci, M. Tosi","doi":"10.1109/IMTC.1989.36872","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36872","url":null,"abstract":"The authors present the results of laboratory tests performed on an automatic high-precision device for voltage balancing. The system tested is based on an 18-bit D/A (digital/analog) converter and a dedicated null detector, both controlled by a personal computer. The high relative resolution allowed by the D/A converter is exploited by the system in different full-scale ranges (0.1-1-10 V). The relative resolution of balancing is equal to 3.8*10/sup -6/, corresponding to the least significant bit of the 18-bit D/A converter used. The system has been implemented for the purpose of achieving high accuracy with low-cost components and short operating times. The experimental results are in accordance with design specifications, with no significant deterioration of metrological characteristics, especially the relative resolution of the D/A converter.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126373971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electronic measuring structure for ultrasonic analysis of solutions","authors":"A. Barwicz","doi":"10.1109/IMTC.1989.36836","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36836","url":null,"abstract":"An electronic measuring structure (EMS) for ultrasonic analysis of solutions that acquires measurement information by means of an ultrasonic resonator, estimates the concentration of solution components, and represents the results of the measurements is presented. A brief description of the hardware and software and the requirements on which they are based is given. The structure is based on a ceramic resonator and on the phase-locked-loop technique. The adaptation of the structure to a specific solution analysis can be realized by EPROM modification.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124855146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An overview of radar cross section measurement techniques","authors":"T. Tice","doi":"10.1109/IMTC.1989.36882","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36882","url":null,"abstract":"An overview of radar cross section (RCS) measurement techniques is presented. Parameters to be measured include: RCS versus target aspect angle; RCS versus frequency; high-resolution range profiles (one-dimensional images); and high-resolution, two-dimensional ISAR (inverse synthetic aperture radar) images. The review is limited to ground-based radar systems. Targets include: operational full-scale strips and aircraft; full-scale aircraft mounted on pylons; scale-model aircraft mounted on pylons; and scale-model ships in water. The review includes compact ranges in aneochoic chambers.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126338454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A PC-based real time measurement system for factory automation on quality control and production control","authors":"C.E. Lin, L. Lee","doi":"10.1109/IMTC.1989.36820","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36820","url":null,"abstract":"The authors present a real-time measurement system for factory automation that improves the operations of quality control and production control. The factory under study has multiple production lines in separate areas. The system is designed to monitor quantities at all check points in the production line, to calculate exact man-hours worked during production, to measure all characteristic test data, and to convert the measurement data into analytical statistics. A local measurement unit (LMU) is designed using a Z-80 microprocessor, which handles all operational functions. The LMU is capable of bypass data transmission and cascade expansion for larger factory arrangements. The main system is designed with a PC-XT microcomputer for data storage and analysis. System analysis is described together with the automatic test procedures and time-sharing programming. It was found that significant improvement in operational efficiency and labor reduction for quality control and production control was achieved.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128881753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of a new radiation thermometry method to galvannealed and cold-rolled steels","authors":"F. Tanaka, H. Ohira, Y. Naganuma","doi":"10.1109/IMTC.1989.36814","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36814","url":null,"abstract":"The authors describe an experimental and analytical study of a novel radiation thermometry method. The method uses a priori knowledge concerning the reciprocal relationship between two uniquely defined spectral emissivities, making quite accurate temperature measurement possible for materials to which conventional spectral and ratio methods are not applicable. The validity of the method is demonstrated by experimental results on galvannealed and cold-rolled steel specimens, whose emissivity changes by alloying and oxidation, respectively. Zinc film thickness, steel grade, and alloying temperature had little effect on the reciprocity function for the two emissivities. It is concluded that the use of two polarized spectral emissivities at the same wavelength can be advantageous in measuring the temperature and emissivities of cold-rolled steel in a continuous annealing furnace.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131161480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A novel digital implementation of a Gaussian noise generator","authors":"N. Golshan","doi":"10.1109/IMTC.1989.36864","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36864","url":null,"abstract":"A method is proposed and studied for digital generation of analog Gaussian noise. In the proposed system, the parallel output from a maximal-length shift register (MSR) forms a sequence of random numbers with equal probability, which are then transformed into a Gaussian distribution by a mapping table. The system is different in its principle of operation and performance from the well-established technique of summing a large number of consecutive random outputs of an MSR to generate a Gaussian noise by virtue of the central limit theorem. Furthermore, it can be made to generate any arbitrary probability distribution function by changing the mapping table. The generator can be realized readily both in hardware as a physical instrument and in a software package as a simulated instrument. While the probability distribution of the generated noise is governed by the mapping table, its random properties are dominated by the behavior of the MSR.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133182063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A hybrid digital and analog controller for DC and brushless servomotors","authors":"H. Yokote, K. Watanabe, K. Mutoh, Y. Yamazaki","doi":"10.1109/IMTC.1989.36833","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36833","url":null,"abstract":"A hybrid digital and analog controller for DC and brushless servomotors is described. Given a serial pulse train whose pulse count and frequency specify the target position and the velocity of the motor under control, respectively, the digital position loop compares it in real time with the actual position indexed by the incremental encoder, to drive the motor to the specified position. When the motor reaches the specified position, the position control is automatically switched to the analog position loop. Operating as a proportional-derivative regulator in the steady state, the analog position loop eliminates the instability that would otherwise be caused by the response delay of the digital loop. Each block necessary for implementing the hybrid controller is integrated into a monolithic or hybrid IC form for easy assembly. The resultant controller is compact and can be widely applied to robots, numerical control machinery, and measurement instruments.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133299136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}