Knowledge-based troubleshooting and diagnosis of electronic devices

Abstract

The author discusses information acquisition problems in connection with the application of a knowledge-based system for testing and diagnosis of a specific electronic device. The required information is acquired to some extent from CAD/CAE (computer aided design/engineering) data supplied by the design engineer during the development phase. The remaining information is elicited from the designer in a supplementary interview session. After describing the acquisition of graphical data from the CAD/CAE database, the author describes the acquisition of test and diagnostic knowledge and measuring information through the MEXPERT knowledge-based consultant.<>