基于知识的电子设备故障排除和诊断

6th IEEE Conference Record., Instrumentation and Measurement Technology Conference Pub Date : 1989-04-25 DOI:10.1109/IMTC.1989.36874

R. Vaez-Ghaemi

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引用次数: 3

摘要

作者讨论了应用基于知识的系统对特定电子设备进行检测和诊断的信息获取问题。所需的信息在一定程度上是从设计工程师在开发阶段提供的CAD/CAE(计算机辅助设计/工程)数据中获得的。其余的信息是在补充采访中从设计师那里获得的。在描述了从CAD/CAE数据库中获取图形数据后，作者描述了通过基于MEXPERT的知识咨询器获取测试诊断知识和测量信息。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Knowledge-based troubleshooting and diagnosis of electronic devices

The author discusses information acquisition problems in connection with the application of a knowledge-based system for testing and diagnosis of a specific electronic device. The required information is acquired to some extent from CAD/CAE (computer aided design/engineering) data supplied by the design engineer during the development phase. The remaining information is elicited from the designer in a supplementary interview session. After describing the acquisition of graphical data from the CAD/CAE database, the author describes the acquisition of test and diagnostic knowledge and measuring information through the MEXPERT knowledge-based consultant.<>

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6th IEEE Conference Record., Instrumentation and Measurement Technology Conference

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