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Proceedings of Symposium on Electromagnetic Compatibility最新文献

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Frequency characterization of reverberation chambers 混响室的频率特性
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561226
M. Hatfield, M. Slocum
{"title":"Frequency characterization of reverberation chambers","authors":"M. Hatfield, M. Slocum","doi":"10.1109/ISEMC.1996.561226","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561226","url":null,"abstract":"A series of measurements to investigate the modal structure of a reverberation chamber were conducted at the Dahlgren Division of the Naval Surface Warfare Center, Dahlgren, Virginia. These measurements were Phase I of a project to determine the frequency dependent characteristics of the fields in a reverberation chamber. Measurements were taken to compare the modal structure excited by both CW and band limited white Gaussian noise. Measurements were also obtained to determine the required step size for collecting field characterization data using discrete frequency data. The measurements were taken over frequency bands ranging from 1 MHz to 100 MHz using frequency steps from 0.1 to 100 kHz. The frequency bands selected covered frequencies from below the first chamber resonance to 18 GHz. Each frequency band was evaluated for multiple boundary conditions (i.e. independent positions of the paddle wheel tuner). The data collected were analyzed to determine the width of the peaks that occur within the chamber as a function of frequency. The results of the analysis yielded the uncertainty of obtaining the true peak of the fields in the chamber as a function of the width of the frequency band and size of the frequency step.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116470723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Incident field coupling analysis of multiconductor transmission lines using asymptotic waveform evaluation 基于渐近波形评估的多导体传输线入射场耦合分析
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561241
S.K. Das, W. T. Smith
{"title":"Incident field coupling analysis of multiconductor transmission lines using asymptotic waveform evaluation","authors":"S.K. Das, W. T. Smith","doi":"10.1109/ISEMC.1996.561241","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561241","url":null,"abstract":"Asymptotic waveform evaluation (AWE) is a technique for time-domain analysis of electrical interconnects. In this study, AWE is used to simulate incident field coupling effects for electrical interconnects. When a uniform plane wave is incident upon an interconnect network, distributed sources are produced along the length of the interconnects. The formulation used to implement AWE analysis of the incident field excitation problem is presented. Results are shown for transmission lines evaluated in both the frequency and time domains.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128129282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures 电磁兼容测试程序中物理测量分析和测量不确定度的确定过程
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561237
E. Bronaugh, J. Osburn
{"title":"A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures","authors":"E. Bronaugh, J. Osburn","doi":"10.1109/ISEMC.1996.561237","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561237","url":null,"abstract":"The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC measurements and the interpretation of results are described. The development of actual uncertainties for EMC measurements is explained and suggestions for improving uncertainties are included.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132858841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
EMI contribution of the drive current and output phase lag in CMOS gate oscillator CMOS门振荡器驱动电流和输出相位滞后对电磁干扰的贡献
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561204
J. C. Perrin
{"title":"EMI contribution of the drive current and output phase lag in CMOS gate oscillator","authors":"J. C. Perrin","doi":"10.1109/ISEMC.1996.561204","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561204","url":null,"abstract":"Any logic processor needs to run a clock frequency reference, and the oscillator which is most commonly implemented uses the linear characteristic of a CMOS gate. The behavior of such a gate in the linear region of the characteristic is like a quasi amplifier. This is the most simple way to build an oscillator with a digital process, but this type of oscillator is an important source of electromagnetic emission. It creates large loops of high frequency currents with external components and PCB power rails. The amplitude of the emitted electromagnetic field is a function of the current that flows in the power lines of the amplifier and also in the external components, crystal and load capacitors. At low frequency, the behavior of the gate is like a true inverter and the currents trough the two load capacitors are symmetrical. If the voltage gain value is low, the total ground current is close to zero. When operating to highest frequency value, over the cut frequency of the gate, the output signal lagging is more than 180 degrees. This spurious phase shift between the two currents that flow in he load capacitors can cause strong harmonics generation mainly if the gain of the oscillator is still important.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130496785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Real free space antenna factors for validating completely absorber lined chambers? 真实自由空间天线系数验证完全吸收器衬里腔室?
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561219
D.J. Groot Boerle, F. Leferink
{"title":"Real free space antenna factors for validating completely absorber lined chambers?","authors":"D.J. Groot Boerle, F. Leferink","doi":"10.1109/ISEMC.1996.561219","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561219","url":null,"abstract":"The validation of a completely absorber lined chamber (CALC) turned out to be difficult. The first attempt was made with antennas calibrated on an open area test site (OATS). In this case a correction factor was necessary, this factor is related to the ground reflection and thus to the antennas. The validation started with determining the real free space antenna factors (AF/sub FS/). These real free space antenna factors were used for new site attenuation measurements in the CALC. The goal has been to validate the CALC by means of practical measurements. As a result the CALC can meet the normalized site attenuation (NSA) requirements. Because of near field effects and mutual coupling a minor problem area below 80 MHz remains, this problem was not dealt with. In our opinion the CALC should replace the OATS as the reference site. In conclusion, a CALC is the best test site for compliance testing for both immunity and emission, and all radiated EMC-measurements should be normalized to free space.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116376227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Investigation of EMI on multilayer printed circuit boards: /spl Delta/I-noise and power supply decoupling 多层印刷电路板的电磁干扰研究:/spl δ / i噪声与电源去耦
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561408
V. Costa, R. Preatoni, S. Caniggia
{"title":"Investigation of EMI on multilayer printed circuit boards: /spl Delta/I-noise and power supply decoupling","authors":"V. Costa, R. Preatoni, S. Caniggia","doi":"10.1109/ISEMC.1996.561408","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561408","url":null,"abstract":"The aim of the analysis reported in this paper is to investigate /spl Delta/I-noise in multilayer Printed Circuit Boards (PCB's) with respect to the decoupling and the interplane capacitance of the on-board power distribution network. In investigating these phenomena a test set-up was used which emphasizes the problem of 'power-noise', and a simple model for the power bus has been developed. Experimental and analytical studies, and circuit simulation have been conducted to verify the model and the effects of decoupling capacitors. In this analysis the problem of ElectroMagnetic (EM) radiated emissions from such boards is also addressed.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"32 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116126862","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Investigation of EMI on multilayer printed circuit boards: radiated emissions 多层印刷电路板上电磁干扰的研究:辐射发射
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561250
S. Caniggia, V. Costa, L. Vitucci
{"title":"Investigation of EMI on multilayer printed circuit boards: radiated emissions","authors":"S. Caniggia, V. Costa, L. Vitucci","doi":"10.1109/ISEMC.1996.561250","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561250","url":null,"abstract":"This paper investigates the electromagnetic (EM) radiated emissions in multilayer printed circuit boards (PCBs) with respect to the decoupling and intrinsic board capacitances of power distribution. Extensive measurements are performed and a simplified mathematical model is developed to estimate these emissions.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"83 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122946805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Degeneration of shielding effectiveness of planar shields due to oblique incident plane waves 斜入射平面波对平面屏蔽效能的影响
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561206
F. Han, Linchang Zhang
{"title":"Degeneration of shielding effectiveness of planar shields due to oblique incident plane waves","authors":"F. Han, Linchang Zhang","doi":"10.1109/ISEMC.1996.561206","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561206","url":null,"abstract":"This paper addresses shielding effectiveness of multilayer planar shields against oblique incident plane waves in arbitrary polarized and incident direction using transmission line (TL) modelling. New results are presented to confirm the degeneration of the shielding effectiveness due to an oblique incident plane wave. It is also shown that the direction of polarization would be changed when the plane wave penetrates the shield. Previous conclusions for normal incidence can be verified by inserting the normal incidence condition into the new results for oblique incidence.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125180375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
SPICE and IBIS modeling kits the basis for signal integrity analyses SPICE和IBIS建模套件是信号完整性分析的基础
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561229
R.H.G. Cuny
{"title":"SPICE and IBIS modeling kits the basis for signal integrity analyses","authors":"R.H.G. Cuny","doi":"10.1109/ISEMC.1996.561229","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561229","url":null,"abstract":"Reliable high speed board design requires a thorough analog analyzation of interconnect traces. Consequently a broad spectrum of signal integrity simulation tools has been developed and is readily available on the market to satisfy customers needs. All software tools require a large amount of data that describe electrical behavior of the integrated components involved at the interconnect traces. In this paper for the first time two sets of data for signal integrity analyses, SPICE and IBIS modeling kits, are outlined, discussed and compared to each other. The information of the kits provides the user with all data to perform buffer modeling, therefore enabling signal integrity analysis and synthesis on printed circuit boards.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127176327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Compensating for shielded enclosure effects on radiated emissions measurements 补偿屏蔽外壳对辐射发射测量的影响
Proceedings of Symposium on Electromagnetic Compatibility Pub Date : 1996-08-19 DOI: 10.1109/ISEMC.1996.561257
R.B. Smith
{"title":"Compensating for shielded enclosure effects on radiated emissions measurements","authors":"R.B. Smith","doi":"10.1109/ISEMC.1996.561257","DOIUrl":"https://doi.org/10.1109/ISEMC.1996.561257","url":null,"abstract":"This paper compares the differences in open area test site (OATS) derived antenna factors to those derived for a specific location of a shielded enclosure as well as the resultant E-field of a simulated-equipment under test (S-EUT) using each. It will also show that using position specific shielded enclosure derived antenna factors not only produces excellent agreement on the resultant E-field for measurements made in two enclosures, but also to the predicted E-field of the S-EUT.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128857905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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