发布求助
文献互助 智能选刊 最新文献

82nd ARFTG Microwave Measurement Conference最新文献

筛选
英文 中文
Investigations of connection repeatability for waveguides with different size apertures 不同孔径波导连接可重复性的研究
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737353
M. Horibe, R. Kishikawa
{"title":"Investigations of connection repeatability for waveguides with different size apertures","authors":"M. Horibe, R. Kishikawa","doi":"10.1109/ARFTG-2.2013.6737353","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737353","url":null,"abstract":"Connection repeatability is mainly dependant on flange tolerances and aperture misalignment. A waveguide flange design establishing precise connections has been developed for use at millimeter and sub-millimeter wave frequencies up to 1.1 THz [1, 2]. Other research groups have investigated the misalignment effect of waveguide apertures on electromagnetic performance at the interface [3]. This paper describes simulation results of connection repeatability for waveguide TRL “through” line standards with two different sizes of aperture, undersized and about the same size when compared to a test-port aperture, in the WM-864 (WR-3, 220 GHz-330 GHz) frequency band. Comparisons between simulations and measurements are described.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123398382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Digital predistortion method based on dynamic X-parameters 基于动态x参数的数字预失真方法
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737338
J. Verspecht, D. Root, T. Nielsen
{"title":"Digital predistortion method based on dynamic X-parameters","authors":"J. Verspecht, D. Root, T. Nielsen","doi":"10.1109/ARFTG-2.2013.6737338","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737338","url":null,"abstract":"An original way is presented to predistort signals for microwave components that show modulation-induced baseband memory effects. The method is based on the recently introduced dynamic X-parameter modeling technique for power amplifiers.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121553482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Residual errors determination for vector network analyzer at a low resolution in the time domain 时域低分辨率矢量网络分析仪残差的确定
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737335
A. Savin, V. G. Guba, Benjamin D. Maxson
{"title":"Residual errors determination for vector network analyzer at a low resolution in the time domain","authors":"A. Savin, V. G. Guba, Benjamin D. Maxson","doi":"10.1109/ARFTG-2.2013.6737335","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737335","url":null,"abstract":"A method is introduced for determination of a vector network analyzer's calibration residual errors for measurement of the reflection coefficient. The method utilizes unscented Kalman filtering and spline interpolation time domain techniques. All three residual errors are calculated by processing the measured reflection coefficient of a single verification device, such as an air line terminated with a short or open network. The proposed method shows particular advantages when the use of a long verification line is impractical (e.g. at the wafer-level), or for measurements at low frequency ranges or similar cases when the resolution of conventional time domain methods is low. Experimental studies were conducted for two frequency ranges and in coaxial and on-wafer measurement environment. The proposed algorithm is a good candidate for a wide range of practical applications especially for measurement uncertainty estimation of cost-effective vector network analyzers.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133448272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Three-harmonic time-domain load-pull measurement system with the 40-GHz maximum third order harmonic frequency for nonlinear device characterization 三次谐波时域负载-拉力测量系统，最大三次谐波频率为40ghz，用于非线性器件表征
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737344
W. Choi, S. Nelson, D.W. Ferwalt, R. Mongia, H. Shichijo, K. O. Kenneth
{"title":"Three-harmonic time-domain load-pull measurement system with the 40-GHz maximum third order harmonic frequency for nonlinear device characterization","authors":"W. Choi, S. Nelson, D.W. Ferwalt, R. Mongia, H. Shichijo, K. O. Kenneth","doi":"10.1109/ARFTG-2.2013.6737344","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737344","url":null,"abstract":"A three-harmonic time-domain load-pull measurement system, which operates up to 40 GHz for the highest harmonic, is demonstrated. The system uses a 50-GHz nonlinear vector network analyzer. The load generator is comprised of three synchronized signal generators and a harmonic combining network using cascaded broadband diplexers, as well as an optional mechanical tuner. Load-pull measurements are validated up to 16-GHz fundamental frequency by comparing the source impedance measured using a network analyzer and the Γopt measured using the load-pull measurement system. Measurements of a 0.25-μm GaN HEMT at 6-GHz fundamental frequency and a 0.5-μm InP HBT at 10-GHz fundamental frequency suggest that the power efficiency of amplifiers using the devices can be improved by 3-6% using the measurement results.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126900733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Error propagation with different VNA calibration techniques at millimeter frequencies 毫米频率下不同VNA校准技术的误差传播
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737351
N. Shoaib, M. Sellone, A. Ferrero, L. Oberto, L. Brunetti
{"title":"Error propagation with different VNA calibration techniques at millimeter frequencies","authors":"N. Shoaib, M. Sellone, A. Ferrero, L. Oberto, L. Brunetti","doi":"10.1109/ARFTG-2.2013.6737351","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737351","url":null,"abstract":"This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130707208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimization of UWB applicator for hyperthermia treatment of human head 超宽带应用于人体头部热疗的优化
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737363
I. Elshafiey, A. Sheta, M. Aldhaeebi, Mohammed A. Alzabidi, Z. Siddiqui
{"title":"Optimization of UWB applicator for hyperthermia treatment of human head","authors":"I. Elshafiey, A. Sheta, M. Aldhaeebi, Mohammed A. Alzabidi, Z. Siddiqui","doi":"10.1109/ARFTG-2.2013.6737363","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737363","url":null,"abstract":"An Ultra-Wideband (UWB) applicator for hyperthermia treatment of human head is developed. The system depends on the design of an array of small foot-print horn elements to allow the construction of large sized-array to surround the human-head. A waveform optimization tool is developed based on genetic algorithms to localize the energy into the tumor location. Computational analysis is performed using CST and experimental measurements are obtained using DASY5 system. Results of the field and SAR image distributions within the human head phantom illustrate the promising performance of this applicator design.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129381914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Improvements in high power LDMOS amplifier efficiency realized through the application of mixed-signal active loadpull 通过混合信号有源负载拉的应用，实现了大功率LDMOS放大器效率的提高
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737345
T. Barbieri, B. Noori
{"title":"Improvements in high power LDMOS amplifier efficiency realized through the application of mixed-signal active loadpull","authors":"T. Barbieri, B. Noori","doi":"10.1109/ARFTG-2.2013.6737345","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737345","url":null,"abstract":"This paper presents the results of experimental large-signal characterization of a high power LDMOS amplifier using a mixed-signal active load pull system. The architecture of the system provides the freedom to present unique and independent reflection coefficients at multiple different frequencies. In this case the fundamental frequency, and the 2nd harmonic frequency were chosen, and the reflection coefficients presented to the output terminal of the transistor were captured at these two frequencies. A high voltage LDMOS power amplifier from Freescale Semiconductor was studied and the results will demonstrate that a distinct improvement in drain efficiency is realized through careful magnitude and phase selection of the reflection coefficient at the 2nd harmonic frequency while keeping the refection coefficient presented at the fundamental frequency at a constant optimized value.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121688129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Trap model for GaN RF HEMT power switch GaN射频HEMT功率开关的陷阱模型
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737339
Aaron T. Pereira, S. Albahrani, A. Parker, M. Heimlich, N. Weste, L. Dunleavy, S. Skidmore
{"title":"Trap model for GaN RF HEMT power switch","authors":"Aaron T. Pereira, S. Albahrani, A. Parker, M. Heimlich, N. Weste, L. Dunleavy, S. Skidmore","doi":"10.1109/ARFTG-2.2013.6737339","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737339","url":null,"abstract":"RF GaN HEMTs were characterized as power switches using pulsed IV system. The devices exhibited current collapse and ON resistance modulation. These trap effects were highly dependent on off state quiescent drain bias voltages. At higher switch voltages, the output power was reduced due increase in the ON resistance and collapse of drain current. Traps located on the surface between gate and drain caused RON modulation while the traps in the bulk beneath the gate plate caused current collapse. A power HEMT model incorporating traps was developed and simulations correctly predicted knee walk out due to increase in the ON resistance and current collapse due to bulk traps.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116997303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Non-contact probe calibration for THz-frequency device characterization 太赫兹频率器件特性的非接触式探针校准
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737357
C. Caglayan, G. Trichopoulos, K. Sertel
{"title":"Non-contact probe calibration for THz-frequency device characterization","authors":"C. Caglayan, G. Trichopoulos, K. Sertel","doi":"10.1109/ARFTG-2.2013.6737357","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737357","url":null,"abstract":"We present a non-contact, on-wafer, broadband device and component testing methodology scalable to the THz band. The “contactless” probe setup is based on radiative coupling of vector network analyzer test ports onto the coplanar waveguide environment of monolithic devices and integrated circuits. Efficient power coupling is achieved via planar, broadband, antennas that act as the “virtual” probe-tips on the chip under test. For accurate S-parameter measurements, repeatable errors in the setup are calibrated. In this paper, we demonstrate for the first time experimental validation of the calibration of the new non-contact probes for the 325-500 GHz band (using WR 2.2 frequency extenders and a standard vector network analyzer as the backend). This non-contact probe setup is accurate, low-cost and is readily scalable down to the mmW band and up to the THz band (60GHz-3THz).","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115530748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new technique for vector network analyzer calibration verification using a single reconfigurable device 一种利用单个可重构器件进行矢量网络分析仪标定验证的新技术
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737352
Stergios Papantonis, N. Ridler, S. Lucyszyn
{"title":"A new technique for vector network analyzer calibration verification using a single reconfigurable device","authors":"Stergios Papantonis, N. Ridler, S. Lucyszyn","doi":"10.1109/ARFTG-2.2013.6737352","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737352","url":null,"abstract":"A novel technique for verifying the calibration of systems, such as vector network analyzers, used for measuring air-filled metal-pipe rectangular waveguides is presented. The key aspect of the proposed method is that the verification device can be reconfigured to enable its characteristics to be changed by known amounts. The device introduces relative changes in its reflected and transmitted waves and is insensitive to errors introduced by waveguide flange misalignments. These errors would normally become increasingly more significant as frequency increases from the microwave to terahertz frequency ranges. A suitably modified WR-15 waveguide, operating in the 50 to 75 GHz frequency range, is presented as a proof-of-concept verification device and experimentally validated.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115214948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信