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82nd ARFTG Microwave Measurement Conference最新文献

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Calculation of the radar ambiguity function from time-domain measurement data for real-time, amplifier-in-the-loop waveform optimization 利用时域测量数据计算雷达模糊度函数，实现实时、环内放大波形优化
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737360
Matthew Fellows, C. Baylis, L. Cohen, R. Marks
{"title":"Calculation of the radar ambiguity function from time-domain measurement data for real-time, amplifier-in-the-loop waveform optimization","authors":"Matthew Fellows, C. Baylis, L. Cohen, R. Marks","doi":"10.1109/ARFTG-2.2013.6737360","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737360","url":null,"abstract":"The ambiguity function is a measure of a radar's range and Doppler detection capability. Cognitive radar systems require the capability to adjust the waveform in realtime to obtain desired range/Doppler detection capability while meeting stringent spectral requirements. While the ambiguity function of the waveform input to the transmitter can be simulated, it is the ambiguity function of the transmitter power amplifier's output waveform that will be used for the detection. As such, it is very helpful to be able to measure the ambiguity function output from a power amplifier in the optimization process. This paper describes a technique that can be used to quickly calculate the ambiguity function for the output waveform from the radar amplifier as measured on an oscilloscope. Brief examination is also given to the effect of amplifier nonlinearity on the ambiguity function.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120892477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Broad-band matching network using band-pass filter with device parasitic absorption 宽带匹配网络采用带通滤波器与器件寄生吸收
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737361
B. Gowrish, K. Rawat, A. Basu, S. Koul
{"title":"Broad-band matching network using band-pass filter with device parasitic absorption","authors":"B. Gowrish, K. Rawat, A. Basu, S. Koul","doi":"10.1109/ARFTG-2.2013.6737361","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737361","url":null,"abstract":"A novel and a robust synthesis technique for designing broad-band matching network is described. Such a matching network will be designed as a band-pass filter that provides broad-band match while absorbing device parasitic within the matching network. This matching network is used in designing a broad-band class AB power amplifier with a flat large signal gain of 12 dB with ±1 dB variation at saturation and output power of 39 dBm over the band from 1.6 GHz to 2.4 GHz with 800 MHz bandwidth. The drain efficiency over 65% is achieved in this entire band of operation corresponding to 40% fractional bandwidth.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127845516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Covariance based uncertainty analysis with unscented transformation 基于协方差的unscented变换不确定性分析
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737337
A. Savin, V. G. Guba, Benjamin D. Maxson
{"title":"Covariance based uncertainty analysis with unscented transformation","authors":"A. Savin, V. G. Guba, Benjamin D. Maxson","doi":"10.1109/ARFTG-2.2013.6737337","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737337","url":null,"abstract":"Application of the unscented transformation (UT) and higher order unscented transformation (HOUT) are considered for uncertainty analysis. Using the principle that a set of discretely sampled points can be used to calculate mean and covariance, we can analyze nonlinear systems without the linearization steps and without defining the Jacobian matrix. An important example is presented.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128472000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Quasi-exact inverse PA model for digital predistorter linearization 数字预失真器线性化的准精确逆PA模型
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737340
Naveen Naraharisetti, P. Roblin, Christophe Quindroit, M. Rawat, S. Gheitanchi
{"title":"Quasi-exact inverse PA model for digital predistorter linearization","authors":"Naveen Naraharisetti, P. Roblin, Christophe Quindroit, M. Rawat, S. Gheitanchi","doi":"10.1109/ARFTG-2.2013.6737340","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737340","url":null,"abstract":"This paper reports the first experimental application of the recently reported quasi-exact inverse (QEI) for memory-polynomial or memory-spline models in the design of a digital predistorter (DPD) linearizing a power amplifier (PA). In comparison to indirect learning architecture, where the coefficients of the DPD are extracted by swapping the input and output variable in any PA model, the DPD extraction is performed from the PA model directly. One of the advantages of using this scheme is that the output noise of the PA is not included in the regression matrix, thus improving the performance. In this paper, B-splines are used to extract the PA model since the performance of the DPD depends on the accuracy of the PA model. The new DPD algorithm relies on an arbitrary number of memory delays as needed for the QEI of the PA model. The evaluation of the model's performance is conducted on a real time application. A Long Term Evolution (LTE) signal of 10 MHz bandwidth is used to compare the performance with a memory polynomial (MP) DPD model used in indirect learning architecture. The measurement results demonstrate that there is a noticeable improvement in terms of Normalised Mean Square Error (NMSE) and Adjacent Channel Power Ratio(ACPR) when using the QEI model for DPD. Note that this is achieved without any iteration as in practical DPD systems. Better results are possible when the PA model represents the PA behavior more accurately.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131949748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Thru-Short-Delay (TSD) calibration technique for one-port measurements 单端口测量的全短延迟(TSD)校准技术
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737362
Jeong-Hwan Kim, Jin-Seob Kang, J. Park, Dae-Chan Kim
{"title":"Thru-Short-Delay (TSD) calibration technique for one-port measurements","authors":"Jeong-Hwan Kim, Jin-Seob Kang, J. Park, Dae-Chan Kim","doi":"10.1109/ARFTG-2.2013.6737362","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737362","url":null,"abstract":"This paper presents a method of vector network analyzer calibration using `Thru-Short-Delay' for one-port measurements, which is expected to give a comparable accuracy to the TRL technique as it does not accompany cable movements. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL' (Open-Short-Load) calibration standards, which are widely used for one-port measurements, together with an air line, preferably one giving a 90-degree phase shift.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125374569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Broadband characterization of on-chip RF spiral inductor using multi-line TRL calibration 用多线TRL校准片上射频螺旋电感器的宽带特性
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737354
Vikas S. Shilimkar, S. Gaskill, A. Weisshaar
{"title":"Broadband characterization of on-chip RF spiral inductor using multi-line TRL calibration","authors":"Vikas S. Shilimkar, S. Gaskill, A. Weisshaar","doi":"10.1109/ARFTG-2.2013.6737354","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737354","url":null,"abstract":"We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124863927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Multimode analysis of transmission lines and substrates for (sub)mm-wave calibration 用于(次)毫米波校准的传输线和基板的多模分析
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737356
M. Spirito, G. Gentile, A. Akhnoukh
{"title":"Multimode analysis of transmission lines and substrates for (sub)mm-wave calibration","authors":"M. Spirito, G. Gentile, A. Akhnoukh","doi":"10.1109/ARFTG-2.2013.6737356","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737356","url":null,"abstract":"In this contribution we present a numerical and experimental analysis of the multimode propagation over coplanar transmission lines, in order to define guidelines for substrate selection to achieve accurate wafer-level (sub)mm-wave calibrations. Losses and coupling effects resulting from the multiple propagating modes on transmission lines conventionally employed for probe-level calibrations, are analysed by means of 3D electro-magnetic simulations. A low loss-tangent, low dielectric constant material (i.e., fused silica), providing low radiation losses due to mode coupling, is proposed as substrate to achieve accurate (sub)mm-wave calibrations. The structures required to perform a TRL calibration are integrated on the proposed fused silica substrate and the experimental data of probe-level calibration performed in the 220-325GHz band are presented.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126295709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
An automated method for VNA accuracy verification using the modified calibration comparison technique 一种利用改进的校准比较技术自动验证VNA精度的方法
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737366
V. G. Guba, A. Savin, O. N. Bykova, A. Rumiantsev, Benjamin D. Maxson
{"title":"An automated method for VNA accuracy verification using the modified calibration comparison technique","authors":"V. G. Guba, A. Savin, O. N. Bykova, A. Rumiantsev, Benjamin D. Maxson","doi":"10.1109/ARFTG-2.2013.6737366","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737366","url":null,"abstract":"This article presents a new method of accuracy verification of calibrated vector network analyzers based on the modified calibration comparison technique. The method is of particular interest for low frequency ranges as well as for cost-effective S-parameter measurement systems where the use of conventional ripple test and precision reference air line standards may be impractical and/or relatively expensive. Moreover, it allows automation, significantly reducing the time required and drastically simplifying the system verification procedure. Through experimental results and comparison against conventional procedures the approach has been validated on a commercially available low-cost reflectometer in the frequency range of 100 MHz to 4.8 GHz.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"160 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127199130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Correction factor evaluation technique for a rectangular waveguide microcalorimeter 矩形波导微热量计校正因子评估技术
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737349
Xiaohai Cui, Yong Li, Xiaoxun Gao, Zhenfei Song, Weijie Sun
{"title":"Correction factor evaluation technique for a rectangular waveguide microcalorimeter","authors":"Xiaohai Cui, Yong Li, Xiaoxun Gao, Zhenfei Song, Weijie Sun","doi":"10.1109/ARFTG-2.2013.6737349","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737349","url":null,"abstract":"Most microwave power standards adopt calorimetry techniques to calibrate the effective efficiency of a thermistor mount as transfer standard. Correction factor of the calorimeter is the key coefficent. To correct the influence of the power loss of the transmission line to the thermopile in the calorimeter, a thin copper flat foil will usually be put before the mount's input port to terminate the signal, as so to separate the transmission line (including the thermal isolation section and the interface flange) and foil dissipate RF power from the DUT. The flat foil short's reflection coefficient measurement is the main uncertainty contributer of the total calorimter measurement uncertainty. In this paper, we introduce a new evaluation technique which will reasonably reduce the correction factor uncertainty. The technique is based on electromagnetic field theory to get the short's RF dissipation power. The detailed analysis of its princple and results are provided.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128214301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Measurement system transient and power questions in mm-wave high resolution pulsed S-parameter measurements 毫米波高分辨率脉冲s参数测量中的测量系统瞬态和功率问题
82nd ARFTG Microwave Measurement Conference Pub Date : 2013-11-01 DOI: 10.1109/ARFTG-2.2013.6737347
J. Martens
{"title":"Measurement system transient and power questions in mm-wave high resolution pulsed S-parameter measurements","authors":"J. Martens","doi":"10.1109/ARFTG-2.2013.6737347","DOIUrl":"https://doi.org/10.1109/ARFTG-2.2013.6737347","url":null,"abstract":"Mm-wave pulse profile measurements can present challenges in part due to high multiplication factors sometimes needed, the position of stimulus modulation (often part way in a multiplier chain), video poles present in some of the elements and generally more difficult linearity questions. These issues have been explored in the 80-500 GHz range and the behavior between modulation and final multiplication was the most dynamic introducing both easily correctable distortions and single-shot effects that are more challenging to process. Resolution, down to the scale of a few ns, did not seem to be affected when reasonable alignment and isothermal procedures were followed. The stimulus power effects also seemed to be minimal when coupled with sufficiently linear receivers. Example calibrations and measurements have been performed for ~20 dBm W-band and D-band systems and lower power WR-2.2 systems.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134150968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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