{"title":"Broadband characterization of on-chip RF spiral inductor using multi-line TRL calibration","authors":"Vikas S. Shilimkar, S. Gaskill, A. Weisshaar","doi":"10.1109/ARFTG-2.2013.6737354","DOIUrl":null,"url":null,"abstract":"We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"82nd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG-2.2013.6737354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.