Jeong-Hwan Kim, Jin-Seob Kang, J. Park, Dae-Chan Kim
{"title":"Thru-Short-Delay (TSD) calibration technique for one-port measurements","authors":"Jeong-Hwan Kim, Jin-Seob Kang, J. Park, Dae-Chan Kim","doi":"10.1109/ARFTG-2.2013.6737362","DOIUrl":null,"url":null,"abstract":"This paper presents a method of vector network analyzer calibration using `Thru-Short-Delay' for one-port measurements, which is expected to give a comparable accuracy to the TRL technique as it does not accompany cable movements. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL' (Open-Short-Load) calibration standards, which are widely used for one-port measurements, together with an air line, preferably one giving a 90-degree phase shift.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"82nd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG-2.2013.6737362","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents a method of vector network analyzer calibration using `Thru-Short-Delay' for one-port measurements, which is expected to give a comparable accuracy to the TRL technique as it does not accompany cable movements. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL' (Open-Short-Load) calibration standards, which are widely used for one-port measurements, together with an air line, preferably one giving a 90-degree phase shift.