{"title":"用多线TRL校准片上射频螺旋电感器的宽带特性","authors":"Vikas S. Shilimkar, S. Gaskill, A. Weisshaar","doi":"10.1109/ARFTG-2.2013.6737354","DOIUrl":null,"url":null,"abstract":"We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Broadband characterization of on-chip RF spiral inductor using multi-line TRL calibration\",\"authors\":\"Vikas S. Shilimkar, S. Gaskill, A. Weisshaar\",\"doi\":\"10.1109/ARFTG-2.2013.6737354\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.\",\"PeriodicalId\":290319,\"journal\":{\"name\":\"82nd ARFTG Microwave Measurement Conference\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"82nd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG-2.2013.6737354\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"82nd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG-2.2013.6737354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Broadband characterization of on-chip RF spiral inductor using multi-line TRL calibration
We demonstrate characterization of an on-chip spiral inductor up to 40 GHz based on a one-tier multi-line TRL method and compare it with a conventional two-tier method. We provide details of the calibration standard design. Monte-Carlo based uncertainty analyses demonstrate the repeatability of the measurement results. A comparison of the measurement results with full-wave simulation results shows good agreement.
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