N. Shoaib, M. Sellone, A. Ferrero, L. Oberto, L. Brunetti
{"title":"毫米频率下不同VNA校准技术的误差传播","authors":"N. Shoaib, M. Sellone, A. Ferrero, L. Oberto, L. Brunetti","doi":"10.1109/ARFTG-2.2013.6737351","DOIUrl":null,"url":null,"abstract":"This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Error propagation with different VNA calibration techniques at millimeter frequencies\",\"authors\":\"N. Shoaib, M. Sellone, A. Ferrero, L. Oberto, L. Brunetti\",\"doi\":\"10.1109/ARFTG-2.2013.6737351\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.\",\"PeriodicalId\":290319,\"journal\":{\"name\":\"82nd ARFTG Microwave Measurement Conference\",\"volume\":\"92 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"82nd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG-2.2013.6737351\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"82nd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG-2.2013.6737351","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error propagation with different VNA calibration techniques at millimeter frequencies
This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.