Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)最新文献

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Large signal simulations of helix TWTs with varying beam tunnel radius 变波束隧道半径螺旋行波管的大信号模拟
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316239
C. Chang, D. Chernin, B. Levush
{"title":"Large signal simulations of helix TWTs with varying beam tunnel radius","authors":"C. Chang, D. Chernin, B. Levush","doi":"10.1109/IVELEC.2004.1316239","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316239","url":null,"abstract":"It is common to have an axially varying beam tunnel radius in helix TWTs. For example, severs separating different sections of helix circuits have radii larger than those of the adjacent helix circuits. Similarly, the beam tunnel expands at the end of the helix circuits where the electron beam emerges from the helix and enters a drift section or collector region. As the beam experiences a change in wall radius, its associated DC space charge potential changes as well, inducing changes in its kinetic energy. It is important to account for such effects in obtaining energy distribution of the spent beam as the beam tunnel opens up to a drift section or collector at the end of the interaction space. This is especially true when the spent beam distribution is transferred to a gun code for the ensuing collector simulation. In such a case, the energy distribution of the spent beam may vary significantly depending on the axial location of the transfer point. The effect on beam energy due to changing tunnel size has been modeled in the large signal code CHRISTINE 3D. Specifically, a fully two-dimensional (R-Z) Poisson solve is applied to the entire beam tunnel region, including the transition from helix circuits to the enlarged drift/collector sections. The resulting DC space charge fields are included in the equations for the beam dynamics. An iterative scheme similar to that employed by steady-state electrostatic gun codes is required to bring convergence between the beam trajectories and the DC fields. We use the parameters from an existing C band TWT as illustration.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124904207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of modern image analysis to quantify dispenser cathode surface condition 应用现代图像分析定量点胶机阴极表面状况
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316241
M. Wijangco, T. Grant
{"title":"Application of modern image analysis to quantify dispenser cathode surface condition","authors":"M. Wijangco, T. Grant","doi":"10.1109/IVELEC.2004.1316241","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316241","url":null,"abstract":"Summary form only given. One of the primary in-process failure modes for guns in vacuum electron devices (VEDs) is poor or low emission due to smearing the cathode pores closed during the fabrication process. The most widely accepted method for verification of open pores, pore size, and distribution is the scanning electron microscope (SEM). However, visual interpretation of the SEM image is still required. A program was launched to evaluate a non-contact, high throughput, optical inspection system that can be utilized to inspect and quantify the dispenser cathode surface porosity or open surface condition by an image analysis application. This presentation summarizes the results of this project.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127751964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Experimental measurements and field modeling for a W-band window w波段窗口的实验测量和场模拟
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316293
L. Earley, E. Smirnova, P. Ferguson
{"title":"Experimental measurements and field modeling for a W-band window","authors":"L. Earley, E. Smirnova, P. Ferguson","doi":"10.1109/IVELEC.2004.1316293","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316293","url":null,"abstract":"An alumina ceramic window was designed and built for the LANL 94 GHz traveling-wave tube amplifier. The window is housed in a cylindrical pillbox cavity and connects to WR-10 waveguide on both input and output. It was designed for low duty operation at the 100 W level. The initial design of the window was performed with the program CASCADE. The transmission through the window was calculated and the window and cylindrical resonator dimensions were optimized for power transmission at 94 GHz and 2 GHz bandwidth. The design was later verified with the code HFSS. Four prototype windows were fabricated and tested.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129441621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Millimeter wave vacuum technology 毫米波真空技术
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316170
P. Kolda
{"title":"Millimeter wave vacuum technology","authors":"P. Kolda","doi":"10.1109/IVELEC.2004.1316170","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316170","url":null,"abstract":"Summary form only given. This paper explores the current state of vacuum technology, specifically in the millimeter wavelength regime. A view of the market priorities and technology development is described. Current applications utilizing millimeter devices are characterized. Areas of interest are industrial microwave heating, satellite communications, and radar. Finally, new applications and research in the areas of millimeter wavelengths are discussed.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129811554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MAGY simulations of 1.5 MW, 110 GHz MIT gyrotron with non-uniform electron emission 具有非均匀电子发射的1.5 MW, 110 GHz MIT回旋管的MAGY模拟
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316355
E. Choi, J. Anderson, J. Sirigiri, M. Shapiro, R. Temkin
{"title":"MAGY simulations of 1.5 MW, 110 GHz MIT gyrotron with non-uniform electron emission","authors":"E. Choi, J. Anderson, J. Sirigiri, M. Shapiro, R. Temkin","doi":"10.1109/IVELEC.2004.1316355","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316355","url":null,"abstract":"We present simulation results from the code MAGY of a 110 GHz, 1.5 MW gyrotron which is currently in short pulse operation at MIT. The experimental peak power is 1.44 MW at 37 % efficiency, when operating in the TE/sub 22,6/ mode, with a velocity ratio (v/sub /spl perp///v/sub /spl par//) of 1.43. The MAGY simulations are done for triplet mode excitation (TE/sub 21,6/, TE/sub 22,6/ and TE/sub 23,6/), and include both velocity spread and the azimuthal nonuniform charge density of the electron beam. For a velocity spread of 5.5 % and the measured value of beam emission nonuniformity, the MAGY simulations are in good agreement with the measured experimental results.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129067615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ka-band klystron with permanent magnets focusing system 带永久磁铁聚焦系统的ka波段速调管
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316271
L. Lei
{"title":"Ka-band klystron with permanent magnets focusing system","authors":"L. Lei","doi":"10.1109/IVELEC.2004.1316271","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316271","url":null,"abstract":"Summary form only given. The simulation of a Ka band klystron with a permanent magnet focusing system is presented in this paper. The klystron is expected to produce 1 kW output peak power at Ka band. Initial simulations with 1D large signal analytic code, JAPANDISK, predicts 25% efficiency.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122799650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nonstationary behavior in 10-vane strapped magnetron oscillator 10叶片捆扎磁控管振荡器的非平稳特性
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316252
J. Kim, J. Won, H. Ha, J. Shon, G. Park
{"title":"Nonstationary behavior in 10-vane strapped magnetron oscillator","authors":"J. Kim, J. Won, H. Ha, J. Shon, G. Park","doi":"10.1109/IVELEC.2004.1316252","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316252","url":null,"abstract":"In this paper, the study on the noise is investigated from the nonstationary behavior. The transition from the stationary state to the nonstationary state of the 10-vane strapped magnetron oscillator is observed as the normalized cathode current is increased using the three-dimensional particle-in-cell code, MAGIC3D.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"341 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117349526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The effects of chemical cleaning on impregnant removal as a function of impregnant type [dispenser cathodes] 化学清洗对浸渍物去除的影响(浸渍物类型的函数)
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316326
J. Farrell, S. Conkwright, J. Tarter
{"title":"The effects of chemical cleaning on impregnant removal as a function of impregnant type [dispenser cathodes]","authors":"J. Farrell, S. Conkwright, J. Tarter","doi":"10.1109/IVELEC.2004.1316326","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316326","url":null,"abstract":"Summary form only given. A liquid cleaning technique, commonly referred to as SRLV or EDTA cleaning, is often used to clean the emitting surface of dispenser cathodes. The process is based on chemical chelating and removes a shallow layer of impregnant material from the impregnated tungsten matrix. This produces a cathode with more predictable activation behavior and reduces initial evaporation products. Additionally, a thoroughly cleaned surface enhances sputtered coatings adhesion. This investigation reports on the amount of impregnant removed as a function of impregnant type and as a function of time. Methods used to evaluate the amount of material removed include copper back filling and metallographic sampling. Variability in the data is primarily due to the complexity of the BaO-CaO-Al/sub 2/O/sub 3/ oxide system and the impregnation process.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"275 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115432498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical process control using key process indicators for vacuum devices 真空装置关键工艺指标的统计过程控制
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316222
W. Gasta
{"title":"Statistical process control using key process indicators for vacuum devices","authors":"W. Gasta","doi":"10.1109/IVELEC.2004.1316222","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316222","url":null,"abstract":"Summary form only given. SPC makes use of many different control charts. Choosing which chart is best depends on the particular kind of data key process indicator (KPI) to be analyzed. The correct KPI must be chosen not only to monitor a products process but to let your customer judge the performance of that product. At MPP/CPI, an Excel spreadsheet was created which allows data entry of critical KPIs for a customer's TWT. This data is then saved to another spreadsheet, a master file, which puts the KPI data into appropriate columns. The columns of the master file are linked to a SPC software program which creates the control charts for each KPI. In conclusion, improvement is never ending. A product can always be improved on. In short, SPC is a tool that can be used to achieve quality in a product or service.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115788715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Selection of dispenser cathode impregnant types 分配器阴极浸渍类型的选择
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786) Pub Date : 2004-04-27 DOI: 10.1109/IVELEC.2004.1316329
J. Tarter, J. Farrell
{"title":"Selection of dispenser cathode impregnant types","authors":"J. Tarter, J. Farrell","doi":"10.1109/IVELEC.2004.1316329","DOIUrl":"https://doi.org/10.1109/IVELEC.2004.1316329","url":null,"abstract":"Summary form only given. The dispenser cathode consists of a porous tungsten matrix impregnated with a barium rich impregnant material. This impregnant material reacts with the tungsten matrix to produce barium which, in conjunction with oxygen, produces a barium-oxygen dipole monolayer on the cathode surface. Many types of impregnant materials have been used over the years. These are identified by their constituent molar ratios of barium oxide (BaO), calcium oxide (CaO) and aluminum oxide (Al/sub 2/O/sub 3/). This paper discusses the relative advantages and disadvantages of several commonly used impregnant types including 5-3-2, 4-1-1, 3-1-1, and 6-1-2. Barium evaporation rate, resistance to poisoning, and common operating temperatures are discussed.","PeriodicalId":283559,"journal":{"name":"Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786)","volume":"380 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131945726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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