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2013 IEEE 14th International Vacuum Electronics Conference (IVEC)最新文献

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Development of a wide-band window in HE1,1 guide for gyrotrons 回旋管he1,1波导宽频带窗口的研制
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2015-08-01 DOI: 10.1109/IRMMW-THZ.2014.6956493
M. Read, T. Bui, D. Marsden, R. Ives, B. Stockwell, J. Neilson
{"title":"Development of a wide-band window in HE1,1 guide for gyrotrons","authors":"M. Read, T. Bui, D. Marsden, R. Ives, B. Stockwell, J. Neilson","doi":"10.1109/IRMMW-THZ.2014.6956493","DOIUrl":"https://doi.org/10.1109/IRMMW-THZ.2014.6956493","url":null,"abstract":"Calabazas Creek Research, Inc. is developing a system for coupling radiation out of gyrotrons that eliminates the external matching optical unit and is broadband. A critical component is a Brewster window in HE1,1 waveguide. This paper describes the design and thermalmechanical modeling of the window.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116852027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
S-band sheet beam klystron research and development at SLAC SLAC s波段片束速调管的研究与开发
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-08-01 DOI: 10.1109/IVEC.2013.6571023
A. Jensen, Fazio, Haase, Jongewaard, Martin, Neilson, Sprehn, Vlieks
{"title":"S-band sheet beam klystron research and development at SLAC","authors":"A. Jensen, Fazio, Haase, Jongewaard, Martin, Neilson, Sprehn, Vlieks","doi":"10.1109/IVEC.2013.6571023","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571023","url":null,"abstract":"Development of a 2.1 GHz, 200 kW CW sheet beam klystron (SBK) for the Navy's free electron laser (FEL) is discussed. Design parameters and simulations of the klystron are presented. Calculations of transverse electric (TE) mode instability and mitigation are addressed.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114479286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The modeling and mesh of a simple cathode-heater assembly structure 简单阴极加热器组件结构的建模和网格划分
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-08-01 DOI: 10.1109/IVEC.2013.6571162
Li Xin-wei, Yu Shi-ji, Su Xiao-bao
{"title":"The modeling and mesh of a simple cathode-heater assembly structure","authors":"Li Xin-wei, Yu Shi-ji, Su Xiao-bao","doi":"10.1109/IVEC.2013.6571162","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571162","url":null,"abstract":"This paper introduced a way of modeling a simple cathode-heater assembly structure with ANSYS software, and list some resolved problems when meshing the structure. The helix structure was finished by extruding a solid circle along with a group of curves. Meanwhile, fast and reliable mesh method was discussed.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128268157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Emittance and emission from arrays with statistical variation 具有统计变化的阵列的发射度和发射度
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-08-01 DOI: 10.1109/IVEC.2013.6571148
J. Petillo, D. Panagos, K. Jensen
{"title":"Emittance and emission from arrays with statistical variation","authors":"J. Petillo, D. Panagos, K. Jensen","doi":"10.1109/IVEC.2013.6571148","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571148","url":null,"abstract":"We report on the incorporation of a model of field emitters based on a Point Charge Model (PCM) that allows for rapid and analytical representations of tip current, variation, and emission statistics and its implementation and usage in the MICHELLE Particle-In-Cell (PIC) code to model the impact of emission variation on current characteristics and emittance. Rather than cold field emission characterized by the Fowler Nordheim equation, a General Thermal-Field (GTF) emission model treats warm and hot field emission sources. We shall compare the increases in emittance and beam radius due to emission non-uniformity as modeled by assuming a Log-Normal (LN) distribution of emitter geometries. The consequences for high frequency devices shall be explored.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124891319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling a gyrotron cavity using a 3D CFDTD PIC method 利用三维CFDTD PIC方法对回旋管腔进行建模
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-06-16 DOI: 10.1109/PLASMA.2013.6634954
M. C. Lin, D. Smithe
{"title":"Modeling a gyrotron cavity using a 3D CFDTD PIC method","authors":"M. C. Lin, D. Smithe","doi":"10.1109/PLASMA.2013.6634954","DOIUrl":"https://doi.org/10.1109/PLASMA.2013.6634954","url":null,"abstract":"Modeling a gyrotron cavity in 3D and time-domain is very challenging due to the open-end features of cavity structure and higher-order mode excitation employed to achieve high efficiency. In this work, a conformal finite-difference time-domain (CFDTD) method is proposed to simulate a gyrotron cavity and a particle-in-cell (PIC) algorithm is used to describe a gyro electron beam. Our preliminary result shows that the 3D CFDTD PIC method could provide an alternative modeling tool for gyrotron research and design.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131772687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Dispersive properties of serpentine and folded waveguide circuits 蛇形和折叠波导电路的色散特性
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-06-16 DOI: 10.1109/PLASMA.2013.6634873
A. Vlasov, I. Chernyavskiy, B. Levush, D. Chernin, T. Antonsen, K. Nguyen
{"title":"Dispersive properties of serpentine and folded waveguide circuits","authors":"A. Vlasov, I. Chernyavskiy, B. Levush, D. Chernin, T. Antonsen, K. Nguyen","doi":"10.1109/PLASMA.2013.6634873","DOIUrl":"https://doi.org/10.1109/PLASMA.2013.6634873","url":null,"abstract":"Results are reported from a comprehensive study of the dispersive properties of serpentine and folded waveguide circuits. The dependence of various features of the dispersion on geometrical parameters is illustrated. Comparisons with predictions of a model circuit consisting of a periodically loaded transmission line are presented.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128375931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Affordable, short pulse Marx modulator 价格合理，短脉冲马克思调制器
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-06-01 DOI: 10.1109/PPC.2013.6627652
R. Phillips, M. Kempkes, M. Gaudreau, K. Ostlund, J. Casey
{"title":"Affordable, short pulse Marx modulator","authors":"R. Phillips, M. Kempkes, M. Gaudreau, K. Ostlund, J. Casey","doi":"10.1109/PPC.2013.6627652","DOIUrl":"https://doi.org/10.1109/PPC.2013.6627652","url":null,"abstract":"Under a U.S. Department of Energy grant, Diversified Technologies, Inc. (DTI) is developing a short pulse, solid-state Marx modulator (Figure 1). The modulator is designed for high efficiency in the 100 kV to 500 kV range, for currents up to 500 A, pulse lengths of 0.2 to 5.0 μs, and risetimes <;300 ns. Key objectives of the development effort are modularity and scalablity, combined with low cost and ease of manufacture. For short-pulse modulators, this Marx topology provides a means to achieve fast risetimes and flattop control that are not available with hard switch or transformer-coupled topologies.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128132641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver 电子入射角对银总电子发射产率影响的实验研究
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-05-21 DOI: 10.1109/IVEC.2013.6571182
T. Gineste, M. Belhaj, N. Bundaleski, O. Teodoro, C. Pons, J. Puech, N. Balcon
{"title":"Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver","authors":"T. Gineste, M. Belhaj, N. Bundaleski, O. Teodoro, C. Pons, J. Puech, N. Balcon","doi":"10.1109/IVEC.2013.6571182","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571182","url":null,"abstract":"The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124282969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent development on the modeling of electrical contact 电接触建模的最新进展
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-05-21 DOI: 10.1109/IVEC.2013.6571177
Peng Zhang, Y. Lau
{"title":"Recent development on the modeling of electrical contact","authors":"Peng Zhang, Y. Lau","doi":"10.1109/IVEC.2013.6571177","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571177","url":null,"abstract":"Contact problems account for 40 percent of all electrical/electronic failures, ranging from small scale consumer electronic devices to large scale military and aerospace systems. This paper summarizes recent development on the theory of bulk contact and thin-film contacts, whose contact members may possess vastly different electrical resistivities. Current crowding at the rim of an electrode, scaling laws for contact resistance in a general geometry, and the novel relation between AC bulk contact resistance and DC thin film contact resistance are addressed.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116922764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-source, complex beamline model development in MICHELLE eBEAM MICHELLE eBEAM中多源、复杂光束线模型的开发
2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-05-21 DOI: 10.1109/IVEC.2013.6571082
S. Ovtchinnikov, S. Cooke, M. Mkrtchyan, R. Shtokhamer, A. Vlasov, J. Petillo, B. Levush
{"title":"Multi-source, complex beamline model development in MICHELLE eBEAM","authors":"S. Ovtchinnikov, S. Cooke, M. Mkrtchyan, R. Shtokhamer, A. Vlasov, J. Petillo, B. Levush","doi":"10.1109/IVEC.2013.6571082","DOIUrl":"https://doi.org/10.1109/IVEC.2013.6571082","url":null,"abstract":"Simulations of modern, high current electron beam lithography devices may require modeling of optical components and multiple electron sources that are positioned in an oblique fashion with respect to the main device axis and include counter streaming regions, where two beams are co-located in space while propagating in opposite directions. Modeling such complex multi-beam systems presents different computational challenges depending on the specific device and regime being modeled. Applications of interest require in some cases the model of both global and stochastic space charge, where the latter requires direct evaluation of Coulomb interactions. A new approach implemented in MICHELLE-eBEAM is designed to take advantage of the GPU hardware acceleration and novel algorithms to efficiently capture particle dynamics for complex beamlines. In this paper we report on our latest progress and show for a high current electron beam lithography application the achieved accuracy and performance of the new code.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121071812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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