电子入射角对银总电子发射产率影响的实验研究

2013 IEEE 14th International Vacuum Electronics Conference (IVEC) Pub Date : 2013-05-21 DOI:10.1109/IVEC.2013.6571182

T. Gineste, M. Belhaj, N. Bundaleski, O. Teodoro, C. Pons, J. Puech, N. Balcon

{"title":"电子入射角对银总电子发射产率影响的实验研究","authors":"T. Gineste, M. Belhaj, N. Bundaleski, O. Teodoro, C. Pons, J. Puech, N. Balcon","doi":"10.1109/IVEC.2013.6571182","DOIUrl":null,"url":null,"abstract":"The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver\",\"authors\":\"T. Gineste, M. Belhaj, N. Bundaleski, O. Teodoro, C. Pons, J. Puech, N. Balcon\",\"doi\":\"10.1109/IVEC.2013.6571182\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.\",\"PeriodicalId\":283300,\"journal\":{\"name\":\"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2013.6571182\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2013.6571182","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在工业银上实验研究了入射角对总发射电子产率(TEEY)的影响。观察到TEEY随入射角的增加，且与入射能量密切相关。实验结果与本次会议提出的新模型基本一致。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2013 IEEE 14th International Vacuum Electronics Conference (IVEC)

自引率

0.00%

发文量