电接触建模的最新进展

Peng Zhang, Y. Lau
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引用次数: 0

摘要

接触问题占所有电气/电子故障的40%,范围从小型消费电子设备到大型军事和航空航天系统。本文综述了体触点和薄膜触点理论的最新进展。讨论了电极边缘的电流拥挤、接触电阻在一般几何结构中的标度规律以及交流体接触电阻与直流薄膜接触电阻之间的新关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Recent development on the modeling of electrical contact
Contact problems account for 40 percent of all electrical/electronic failures, ranging from small scale consumer electronic devices to large scale military and aerospace systems. This paper summarizes recent development on the theory of bulk contact and thin-film contacts, whose contact members may possess vastly different electrical resistivities. Current crowding at the rim of an electrode, scaling laws for contact resistance in a general geometry, and the novel relation between AC bulk contact resistance and DC thin film contact resistance are addressed.
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