{"title":"电接触建模的最新进展","authors":"Peng Zhang, Y. Lau","doi":"10.1109/IVEC.2013.6571177","DOIUrl":null,"url":null,"abstract":"Contact problems account for 40 percent of all electrical/electronic failures, ranging from small scale consumer electronic devices to large scale military and aerospace systems. This paper summarizes recent development on the theory of bulk contact and thin-film contacts, whose contact members may possess vastly different electrical resistivities. Current crowding at the rim of an electrode, scaling laws for contact resistance in a general geometry, and the novel relation between AC bulk contact resistance and DC thin film contact resistance are addressed.","PeriodicalId":283300,"journal":{"name":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent development on the modeling of electrical contact\",\"authors\":\"Peng Zhang, Y. Lau\",\"doi\":\"10.1109/IVEC.2013.6571177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Contact problems account for 40 percent of all electrical/electronic failures, ranging from small scale consumer electronic devices to large scale military and aerospace systems. This paper summarizes recent development on the theory of bulk contact and thin-film contacts, whose contact members may possess vastly different electrical resistivities. Current crowding at the rim of an electrode, scaling laws for contact resistance in a general geometry, and the novel relation between AC bulk contact resistance and DC thin film contact resistance are addressed.\",\"PeriodicalId\":283300,\"journal\":{\"name\":\"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2013.6571177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 14th International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2013.6571177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Recent development on the modeling of electrical contact
Contact problems account for 40 percent of all electrical/electronic failures, ranging from small scale consumer electronic devices to large scale military and aerospace systems. This paper summarizes recent development on the theory of bulk contact and thin-film contacts, whose contact members may possess vastly different electrical resistivities. Current crowding at the rim of an electrode, scaling laws for contact resistance in a general geometry, and the novel relation between AC bulk contact resistance and DC thin film contact resistance are addressed.