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2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices最新文献

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Prediction of acentric crystal structure of complex crystals by neural net analysis 用神经网络分析预测复杂晶体的非中心晶体结构
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173916
A. Korotkov, V. Atuchin
{"title":"Prediction of acentric crystal structure of complex crystals by neural net analysis","authors":"A. Korotkov, V. Atuchin","doi":"10.1109/EDM.2009.5173916","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173916","url":null,"abstract":"Neural net analysis is tested as a tool for prediction of acentricity of crystal structure. A set of input parameters is defined that gives the prediction with as high probability as ∼80%. The neural net is used for prediction of new binary acentric molybdates.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126553681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Capacitance sensor with nanoporous insulator for PCR detection 用于PCR检测的纳米多孔绝缘体电容传感器
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173924
M. A. Parashchenko, N. S. Filippov, Natalia V. Vandisheva, V. Kirienko, S. I. Romanov
{"title":"Capacitance sensor with nanoporous insulator for PCR detection","authors":"M. A. Parashchenko, N. S. Filippov, Natalia V. Vandisheva, V. Kirienko, S. I. Romanov","doi":"10.1109/EDM.2009.5173924","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173924","url":null,"abstract":"The purpose of the given work is carrying out and research polymerase chain reaction of a deoxyribonucleic acid (PCR) by capacitor spectrometry method. Research of polymerase chain reaction is planned to spend by capacitance sensor with nanoporous insulator for measurement of dielectric permeability of a liquid. As medium between electrodes of condenser structure it is used nanoporous silicon dioxide. At filling nanoporous dielectric the liquid essentially changes effective dielectric permeability of all structure. The analysis of dependence of effective capacity of structure from dielectric permeability of the liquid filling a porous layer, gives the chance to define liquid type. At the given stage of work the gauge of capacitor type for measurement of dielectric permeability of a liquid on a basis nanoporous dielectric has been created, capacitor dependences for various liquids and biological solutions are removed, essential distinctions in values of capacities are found out.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"239 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121633366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Molecular dynamics simulation of nanodrops 纳米液滴的分子动力学模拟
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173932
G. V. Kharlamov, A. A. Onischuk, Piotr A. Purtov, S. Vosel, A. Bolesta
{"title":"Molecular dynamics simulation of nanodrops","authors":"G. V. Kharlamov, A. A. Onischuk, Piotr A. Purtov, S. Vosel, A. Bolesta","doi":"10.1109/EDM.2009.5173932","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173932","url":null,"abstract":"The results of the structural and thermodynamic properties simulations of the nanodrops, which emerge on the first stage of nanoparticle formation process by supersaturated vapor condensation, are presented in this paper. The systematic calculations of the Lennard-Jones liquid droplets surface tension, depending on equimolar radius (Re) and temperature (T) have been done by the molecular dynamics method. It is shown that surface tension decreases with the decrease of equimolar radius of the drop and it may reach zero at certain R0 depending on temperature. The dependence of the ratio of the droplet surface tension on the liquid - vapor flat surface tension is a universal function of the ratio of the droplet equimolar radius to R0.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"27 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114112413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study ways to assess quality parameters in the current 3G networks online 研究了当前3G网络在线质量参数的评估方法
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173965
A. S. Smagin, Aleksander S. Podgaysky, A. Gyunter
{"title":"Study ways to assess quality parameters in the current 3G networks online","authors":"A. S. Smagin, Aleksander S. Podgaysky, A. Gyunter","doi":"10.1109/EDM.2009.5173965","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173965","url":null,"abstract":"The report discusses a method for estimating the real work of 3G technology in the context of urban megalopolis. Getting information about the parameters of the network (in this case, the speed of information transfer) is necessary to assess the level of network development and identify further steps to streamline and improve its quality of services.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121015525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental installation for test of automatic fire gas explosion suppression system 燃气自动抑爆系统试验装置
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5174004
A. Pavlov, E. S. Povernov, V. Kazantsev, S. Terentiev, E. Sypin
{"title":"Experimental installation for test of automatic fire gas explosion suppression system","authors":"A. Pavlov, E. S. Povernov, V. Kazantsev, S. Terentiev, E. Sypin","doi":"10.1109/EDM.2009.5174004","DOIUrl":"https://doi.org/10.1109/EDM.2009.5174004","url":null,"abstract":"The article describes experimental installation, allowing to conduct tests of optic-electronic instruments and systems and automatic fire gas explosion suppression system in conditions closing to the real. Results of tests of the automatic explosion suppression system consisting of optic-electronic instrument for ignition center two-dimensional coordinates detection and dust thrower gas-dynamic mortar are shown.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"216 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121185212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Use of load factor in probability of failure calculation for aircraft generating system 载荷因子在飞机发电系统失效概率计算中的应用
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5174015
Y. Zolotukhin, N.V. Bedina
{"title":"Use of load factor in probability of failure calculation for aircraft generating system","authors":"Y. Zolotukhin, N.V. Bedina","doi":"10.1109/EDM.2009.5174015","DOIUrl":"https://doi.org/10.1109/EDM.2009.5174015","url":null,"abstract":"The paper describes the correction of probability calculation procedure for aircraft electrical energy generation system.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124368585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft threshold decoding of convolutional self-orthogonal codes 卷积自正交码的软阈值译码
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173970
Ekaterina V. Shulepova
{"title":"Soft threshold decoding of convolutional self-orthogonal codes","authors":"Ekaterina V. Shulepova","doi":"10.1109/EDM.2009.5173970","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173970","url":null,"abstract":"Soft threshold decoding of convolutional self-orthogonal codes (CSOC) was first examined in [1]. In this work the appendix of this method is offered to the iteration threshold decoding taking into account the practically used gradation of quality of channel on eight discrete levels.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125346330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Definition of initial data for model construction of burning evolution in three-component disperse environments 三组分分散环境下燃烧演化模型初始数据的定义
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5174010
I. A. Uskova, A. Pavlov, N. Tupikina, E.V. Baryshnikova, E. V. Sypin
{"title":"Definition of initial data for model construction of burning evolution in three-component disperse environments","authors":"I. A. Uskova, A. Pavlov, N. Tupikina, E.V. Baryshnikova, E. V. Sypin","doi":"10.1109/EDM.2009.5174010","DOIUrl":"https://doi.org/10.1109/EDM.2009.5174010","url":null,"abstract":"In the article development of the ignition center at an early stage in the conditions close to coal mine is analysed, and the factors influencing an intensification of given process are certain. This research can be used as initial data for model construction of burning distributions in three- component disperse environments.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131744566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transient injection currents in PbSnTe:In films PbSnTe薄膜中的瞬态注入电流
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173944
Denis V. Ischenko, A. Klimov, N. S. Paschin, V. Shumsky
{"title":"Transient injection currents in PbSnTe:In films","authors":"Denis V. Ischenko, A. Klimov, N. S. Paschin, V. Shumsky","doi":"10.1109/EDM.2009.5173944","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173944","url":null,"abstract":"In the present paper, experimental data and an analysis of dark transient injection currents in PbSnTe:In films at helium temperature are presented.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132182451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Anisotropy of current-voltage characteristics in PbSnTe:In film structures 薄膜结构中PbSnTe电流-电压特性的各向异性
2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices Pub Date : 2009-07-01 DOI: 10.1109/EDM.2009.5173945
V. S. Epov, A. Klimov, V. Shumsky
{"title":"Anisotropy of current-voltage characteristics in PbSnTe:In film structures","authors":"V. S. Epov, A. Klimov, V. Shumsky","doi":"10.1109/EDM.2009.5173945","DOIUrl":"https://doi.org/10.1109/EDM.2009.5173945","url":null,"abstract":"In the present work, we propose a model to describe the anisotropy of current-voltage characteristics in PbSnTe:In films at low temperatures under electron injection out of contacts. The model is developed considering the ferroelectric properties of PbSnTe:In. Data on the temperature dependence of the anisotropy are reported.","PeriodicalId":262499,"journal":{"name":"2009 International Conference and Seminar on Micro/Nanotechnologies and Electron Devices","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120920941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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