{"title":"Nonvolatile memristor memory: Device characteristics and design implications","authors":"Y. Ho, Garng M. Huang, Peng Li","doi":"10.1145/1687399.1687491","DOIUrl":"https://doi.org/10.1145/1687399.1687491","url":null,"abstract":"The search for new nonvolatile universal memories is propelled by the need for pushing power-efficient nanocomputing to the next higher level. As a potential contender for the next-generation memory technology of choice, the recently found “the missing fourth circuit element”, memristor, has drawn a great deal of research interests. In this paper, we characterize the fundamental electrical properties of memristor devices by encapsulating them into a set of compact closed-form expressions. Our derivations provide valuable design insights and allow a deeper understanding of key design implications of memristor-based memories. In particular, we investigate the design of read and write circuits and analyze data integrity and noise-tolerance issues.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120946662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Resilience in computer systems and networks","authors":"Kishor S. Trivedi, Dong Seong Kim, R. Ghosh","doi":"10.1145/1687399.1687415","DOIUrl":"https://doi.org/10.1145/1687399.1687415","url":null,"abstract":"The term resilience is used differently by different communities. In general engineering systems, fast recovery from a degraded system state is often termed as resilience. Computer networking community defines it as the combination of trustworthiness (dependability, security, performability) and tolerance (survivability, disruption tolerance, and traffic tolerance). Dependable computing community defined resilience as the persistence of service delivery that can justifiably be trusted, when facing changes. In this paper, resilience definitions of systems and networks will be presented. Metrics for resilience will be compared with dependability metrics such as availability, performance, performability. Simple examples will be used to show quantification of resilience via probabilistic analytic models.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114762568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Alves, Jennifer Dworak, R. I. Bahar, Kundan Nepal
{"title":"Compacting test vector sets via strategic use of implications","authors":"N. Alves, Jennifer Dworak, R. I. Bahar, Kundan Nepal","doi":"10.1145/1687399.1687418","DOIUrl":"https://doi.org/10.1145/1687399.1687418","url":null,"abstract":"As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which in turn makes simple approaches for testing inadequate. Using n-detect testing can improve detect coverage; however, this approach can greatly increase the test set size. In this proof-of-concept paper we investigate the use of logic implication checkers, inserted in hardware, as an aid in compacting n-detect test sets. We show that checker hardware with minimal area overhead can reduce test set size by up to 25%. In addition, this implication checker can serve a dual purpose for online error detection.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122022161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiaoyi Wang, Yici Cai, Qiang Zhou, S. Tan, T. Eguia
{"title":"Decoupling capacitance efficient placement for reducing transient power supply noise","authors":"Xiaoyi Wang, Yici Cai, Qiang Zhou, S. Tan, T. Eguia","doi":"10.1145/1687399.1687538","DOIUrl":"https://doi.org/10.1145/1687399.1687538","url":null,"abstract":"Decoupling capacitance (decap) is an efficient way to reduce transient noise in on-chip power supply networks. However, excessive decap may cause more leakage power, chip resource waste, and even lead to more design iterations. In this paper, we present a novel decap-efficient placement algorithm for transient power supply noise reduction. In contrast to traditional design flow, our approach considers decap impacts at the placement stage to seek the placement minimizing decap requirements while still satisfying the traditional placement objectives. In the new method, we first devise a fast procedure to assess the decap requirement for the force-based placement framework, in which the required decap is modeled as a density function over the chip. Then, we build a corresponding supply and demand system to adjust the placement in favor of minimizing decap. Finally, we develop a decap efficient placement algorithm with a new force induced by imbalance between power supply and power demands. Experimental results show that the new combined placement and decap optimization flow could reduce the minimum decap area by 35% with a wire length increase of only 0.5% at nearly the same computational cost, which is efficient for practical problems.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"202 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124206082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interpolating functions from large Boolean relations","authors":"J. H. Jiang, Hsuan-Po Lin, W. Hung","doi":"10.1145/1687399.1687544","DOIUrl":"https://doi.org/10.1145/1687399.1687544","url":null,"abstract":"Boolean relations are an important tool in system synthesis and verification to characterize solutions to a set of Boolean constraints. For physical realization as hardware, a deterministic function often has to be extracted from a relation. Prior methods however are unlikely to handle large problem instances. From the scalability standpoint this paper demonstrates how interpolation can be exploited to extend determinization capacity. A comparative study is performed on several proposed computation techniques. Experimental results show that Boolean relations with thousands of variables can be effectively determinized and the extracted functional implementations are of reasonable quality.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130333255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Thornquist, E. Keiter, R. Hoekstra, D. Day, E. Boman
{"title":"A parallel preconditioning strategy for efficient transistor-level circuit simulation","authors":"H. Thornquist, E. Keiter, R. Hoekstra, D. Day, E. Boman","doi":"10.1145/1687399.1687477","DOIUrl":"https://doi.org/10.1145/1687399.1687477","url":null,"abstract":"We describe a parallel computing approach for large-scale SPICE-accurate circuit simulation, which is based on a new strategy for the parallel preconditioned iterative solution of circuit matrices. This strategy consists of several steps, including singleton removal, block triangular form (BTF) reordering, hypergraph partitioning, and a block Jacobi pre-conditioner. Our parallel implementation makes use of a mixed load balance, employing a different parallel partition for the matrix load and solve. Based on message-passing, our circuit simulation code was originally designed for large parallel computers, but for the purposes of this paper we demonstrate that it also gives good parallel speedup in modern multi-core environments. We show that our new parallel solver outperforms a serial direct solver, a parallel direct solver and an alternative iterative solver on a set of circuit test problems.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127366789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Smita Krishnaswamy, Haoxing Ren, Nilesh A. Modi, R. Puri
{"title":"DeltaSyn: An efficient logic difference optimizer for ECO synthesis","authors":"Smita Krishnaswamy, Haoxing Ren, Nilesh A. Modi, R. Puri","doi":"10.1145/1687399.1687546","DOIUrl":"https://doi.org/10.1145/1687399.1687546","url":null,"abstract":"During the IC design process, functional specifications are often modified late in the design cycle, after placement and routing are completed. However, designers are left either to manually process such modifications by hand or to restart the design process from scratch - a very costly option. In order to address this issue, we present DeltaSyn, a method for generating a highly optimized logic difference between a modified high-level specification and an implemented design. DeltaSyn has the ability to locate boundaries in implemented logic within which changes can be confined. Delta-Syn demarcates the boundary in two phases. The first phase employs fast functional and structural analysis techniques to identify equivalent signals forming the input-side boundary of the changes. The second phase locates the output-side boundary of the changes through a novel dynamic algorithm that detects matching logic downstream from the changes required by the ECO. Experiments on industrial designs show that together these techniques successfully implement ECOs while preserving an average of 97% of the existing logic. Unlike previous approaches, the use of bit-parallel logic simulation and fast SAT solvers enables high performance and scalability. DeltaSyn can process and verify a typical ECO for a design of around 10K gates in about 200 seconds or less.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127426178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chih-Hung Liu, Shih-Yi Yuan, S. Kuo, Jung-Hung Weng
{"title":"Obstacle-avoiding rectilinear Steiner tree construction based on Steiner point selection","authors":"Chih-Hung Liu, Shih-Yi Yuan, S. Kuo, Jung-Hung Weng","doi":"10.1145/1687399.1687406","DOIUrl":"https://doi.org/10.1145/1687399.1687406","url":null,"abstract":"For the obstacle-avoiding rectilinear Steiner minimal tree (OARSMT) problem, this paper presents a Steiner-point based algorithm to achieve the best practical performance in wirelength and run time. Unlike many previous works, the Steiner-based framework is more focused on the usage of Steiner points instead of the handling of obstacles. This paper also proposes a new concept of Steiner point locations to provide an effective as well as efficient way to generate desirable Steiner point candidates. Experimental results show that this algorithm achieves the best solution quality in Θ(n log n) empirical time, which was originally generated by applying the maze routing on an Ω(n2)-space graph. The Steiner-point based framework and the new concept of Steiner point locations can be applied to future research on the OARSMT problem and its generations, such as the multi-layer OARSMT problem. Categories and Subject Descriptors: B.7.2 [Integrated Circuits]: Design Aids General Terms: Algorithms, Performance, Design","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127965710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Consistency-based characterization for IC Trojan detection","authors":"Y. Alkabani, F. Koushanfar","doi":"10.1145/1687399.1687426","DOIUrl":"https://doi.org/10.1145/1687399.1687426","url":null,"abstract":"A Trojan attack maliciously modifies, alters, or embeds unplanned components inside the exploited chips. Given the original chip specifications, and process and simulation models, the goal of Trojan detection is to identify the malicious components. This paper introduces a new Trojan detection method based on nonintrusive external IC quiescent current measurements. We define a new metric called consistency. Based on the consistency metric and properties of the objective function, we present a robust estimation method that estimates the gate properties while simultaneously detecting the Trojans. Experimental evaluations on standard benchmark designs show the validity of the metric, and demonstrate the effectiveness of the new Trojan detection.","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129798940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"From 2D to 3D NoCs: A case study on worst-case communication performance","authors":"Yue Qian, Zhonghai Lu, Wenhua Dou","doi":"10.1145/1687399.1687504","DOIUrl":"https://doi.org/10.1145/1687399.1687504","url":null,"abstract":"Advanced integration technologies enable the construction of Network-on-Chip (NoC) from two dimensions to three dimensions. Studies have shown that 3D NoCs can improve average communication performance because of the possibility of using the additional dimension to shorten communication distance. In this paper, we present a detailed case study on worst-case communication performance in regular k-ary-2-mesh networks. Through both analysis and simulation, we show that, while 3D networks achieve better average performance, this may not be the case for worst-case performance mainly due to constraints on vertical channels. Our analysis is based on network calculus, which allows to calculate theoretical delay bounds for constrained flows traversing network elements. Categories and Subject Descriptors B.4 [Input/Output and Data Communications]: Performance Analysis and Design Aids General Terms Design, Performance","PeriodicalId":256358,"journal":{"name":"2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers","volume":"4 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128962968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}