IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.最新文献

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Cost-effective radiation hardening technique for combinational logic 组合逻辑的高性价比辐射硬化技术
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/iccad.2004.1382551
Q. Zhou, K. Mohanram
{"title":"Cost-effective radiation hardening technique for combinational logic","authors":"Q. Zhou, K. Mohanram","doi":"10.1109/iccad.2004.1382551","DOIUrl":"https://doi.org/10.1109/iccad.2004.1382551","url":null,"abstract":"A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates that have the lowest logical masking probability to achieve cost-effective tradeoffs between overhead and soft error failure rate reduction. The technique, which decouples the physical from the logical aspects of soft error susceptibility of a gate, uses a gate (transistor) sizing technique that is both efficient and accurate (in comparison to SPICE). A full set of experimental results demonstrate the cost-effective tradeoffs that can be achieved.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116819162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 100
Stochastic analysis of interconnect performance in the presence of process variations 存在工艺变化时互连性能的随机分析
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382698
Janet Roveda, P. Ghanta, S. Vrudhula
{"title":"Stochastic analysis of interconnect performance in the presence of process variations","authors":"Janet Roveda, P. Ghanta, S. Vrudhula","doi":"10.1109/ICCAD.2004.1382698","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382698","url":null,"abstract":"Deformations in interconnect due to process variations can lead to significant performance degradation in deep sub-micron circuits. Timing analyzers attempt to capture the effects of variation on delay with simplified models. The timing verification of RC or RLC networks requires the substitution of such simplified models with spatial stochastic processes that capture the random nature of process variations. The present work proposes a new and viable method to compute the stochastic response of interconnects. The technique models the stochastic response in an infinite dimensional Hilbert space in terms of orthogonal polynomial expansions. A finite representation is obtained by using the Galerkin approach of minimizing the Hilbert space norm of the residual error. The key advance of the proposed method is that it provides a functional representation of the response of the system in terms of the random variables that represent the process variations. The proposed algorithm has been implemented in a procedure called OPERA, results from OPERA simulations on commercial design test cases match well with those from the classical Monte Carlo SPICE simulations and from perturbation methods. Additionally OPERA shows good computational efficiency: speedup factor of 60 has been observed over Monte Carlo SPICE simulations.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126132186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 90
Improving soft-error tolerance of FPGA configuration bits 提高FPGA配置位的软容错性
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382552
S. Srinivasan, Aman Gayasen, N. Vijaykrishnan, M. Kandemir, Yuan Xie, M. J. Irwin
{"title":"Improving soft-error tolerance of FPGA configuration bits","authors":"S. Srinivasan, Aman Gayasen, N. Vijaykrishnan, M. Kandemir, Yuan Xie, M. J. Irwin","doi":"10.1109/ICCAD.2004.1382552","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382552","url":null,"abstract":"Soft errors that change configuration bits of an SRAM based FPGA modify the functionality of the design. The proliferation of FPGA devices in various critical applications makes it important to increase their immunity to soft errors. In this work, we propose the use of an asymmetric SRAM (ASRAM) structure that is optimized for soft error immunity and leakage when storing a preferred value. The key to our approach is the observation that the configuration bitstream is composed of 87% of zeros across different designs. Consequently, the use of ASRAM cell optimized for storing a zero (ASRAM-0) reduces the failure in time by 25% as compared to the original design. We also present an optimization that increases the number of zeros in the bitstream while preserving the functionality.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127330456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 75
Efficient SAT-based unbounded symbolic model checking using circuit cofactoring 基于sat的无界符号模型的高效电路协分解检验
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382631
Malay K. Ganai, Aarti Gupta, P. Ashar
{"title":"Efficient SAT-based unbounded symbolic model checking using circuit cofactoring","authors":"Malay K. Ganai, Aarti Gupta, P. Ashar","doi":"10.1109/ICCAD.2004.1382631","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382631","url":null,"abstract":"We describe an efficient approach for SAT-based quantifier elimination that significantly improves the performance of pre-image and fixed-point computation in SAT-based unbounded symbolic model checking (UMC). The proposed method captures a larger set of new states per SAT-based enumeration step during quantifier elimination, in comparison to previous approaches. The novelty of our approach is in the use of circuit-based cofactoring to capture a large set of states, and in the use of a functional hashing based simplified circuit graph to represent the captured states. We also propose a number of heuristics to further enlarge the state set represented per enumeration, thereby reducing the number of enumeration steps. We have implemented our techniques in a SAT-based UMC framework where we show the effectiveness of SAT-based existential quantification on public benchmarks, and on a number of large industry designs that were hard to model check using purely BDD-based techniques. We show several orders of improvement in time and space using our approach over previous CNF-based approaches. We also present controlled experiments to demonstrate the role of several heuristics proposed in the paper. Importantly, we were able to prove using our method the correctness of a safety property in an industry design that could not be proved using other known approaches.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125653397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 88
Accurate estimation of global buffer delay within a floorplan 准确估计一个平面图内的全局缓冲延迟
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382667
C. Alpert, Jiang Hu, S. Sapatnekar, C. Sze
{"title":"Accurate estimation of global buffer delay within a floorplan","authors":"C. Alpert, Jiang Hu, S. Sapatnekar, C. Sze","doi":"10.1109/ICCAD.2004.1382667","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382667","url":null,"abstract":"Closed formed expressions for buffered interconnect delay approximation have been around for some time. However, previous approaches assume that buffers are free to be placed anywhere. In practice, designs frequently have large blocks that make the ideal buffer insertion solution unrealizable. The theory of Otten (1998) is extended to show how one can model the blocks into a simple delay estimation technique that applies both to two-pin and to multi-pin nets. Even though the formula uses one buffer type, it shows remarkable accuracy in predicting delay when compared to an optimal realizable buffer insertion solution. Potential applications include wire planning, timing analysis during floorplanning or global routing. Our experiments show that our approach accurately predicts delay when compared to constructing a realizable buffer insertion with multiple buffer types.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130944989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Reducing cache misses by application-specific re-configurable indexing 通过特定于应用程序的可重新配置索引减少缓存丢失
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382556
Kimish Patel, E. Macii, L. Benini, M. Poncino
{"title":"Reducing cache misses by application-specific re-configurable indexing","authors":"Kimish Patel, E. Macii, L. Benini, M. Poncino","doi":"10.1109/ICCAD.2004.1382556","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382556","url":null,"abstract":"The predictability of memory access patterns in embedded systems can be successfully exploited to devise effective application-specific cache optimizations. In this work, we propose an improved indexing scheme for direct-mapped caches, which drastically reduces the number of conflict misses by using application-specific information; the scheme is based on the selection of a subset of the address bits. With respect to similar approaches, our solution has two main strengths. First, it models the misses analytically by building a miss equation, and exploits a symbolic algorithm to compute the exact optimum solution (i.e., the subset of address bits to be used as cache index that minimizes conflict misses). Second, we designed a re-configurable bit selector, which can be programmed at run-time to fit the optimal cache indexing to a given application. Results show an average reduction of conflict misses of 24%, measured over a set of standard benchmarks, and for different cache configurations.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131423863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
On per-test fault diagnosis using the X-fault model 基于x故障模型的每次测试故障诊断
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382653
X. Wen, T. Miyoshi, S. Kajihara, Laung-Terng Wang, K. Saluja, K. Kinoshita
{"title":"On per-test fault diagnosis using the X-fault model","authors":"X. Wen, T. Miyoshi, S. Kajihara, Laung-Terng Wang, K. Saluja, K. Kinoshita","doi":"10.1109/ICCAD.2004.1382653","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382653","url":null,"abstract":"This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses to extract diagnostic information and to score the results of diagnosis. Experimental results show the effectiveness of our method.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122898186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Robust analog/RF circuit design with projection-based posynomial modeling 基于投影多项式建模的鲁棒模拟/射频电路设计
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382694
Xin Li, P. Gopalakrishnan, Yang Xu, L. Pileggi
{"title":"Robust analog/RF circuit design with projection-based posynomial modeling","authors":"Xin Li, P. Gopalakrishnan, Yang Xu, L. Pileggi","doi":"10.1109/ICCAD.2004.1382694","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382694","url":null,"abstract":"We propose a robust analog design tool (ROAD) for post-tuning analog/RF circuits. Starting from an initial design derived from hand analysis or analog circuit synthesis based on simplified models, ROAD extracts accurate posynomial performance models via transistor-level simulation and optimizes the circuit by geometric programming. Importantly, ROAD sets up all design constraints to include large-scale process variations to facilitate the tradeoff between yield and performance. A novel convex formulation of the robust design problem is utilized to improve the optimization efficiency and to produce a solution that is superior to other local tuning methods. In addition, a novel projection-based approach for posynomial fitting is used to facilitate scaling to large problem sizes. A new implicit power iteration algorithm is proposed to find the optimal projection space and extract the posynomial coefficients with robust convergence. The efficacy of ROAD is demonstrated on several circuit examples.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134319471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 68
Best practices in low power design. 1. Power reduction techniques [Tutorial 1] 低功耗设计的最佳实践。1. 节能技术[教程1]
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382523
E. Mocii, Massoud Pedram
{"title":"Best practices in low power design. 1. Power reduction techniques [Tutorial 1]","authors":"E. Mocii, Massoud Pedram","doi":"10.1109/ICCAD.2004.1382523","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382523","url":null,"abstract":"Description: In the last decade, huge effort has been invested to come up with a wide range of design solutions that help in solving the power consumption problem for different types of electronic devices, components and systems. Some of those solutions turned out to be very practical and effective, thus finding a path into commercial products of a different nature. Other approaches, which sounded promising on paper, showed too many limitations for attracting the attention of real designers. The objective of this tutorial is to offer the attendees some wellestablished, yet innovative recipes for addressing the power problem in real life. The presentation will be structured into two half-day tutorials. The moming tutorial will describe basic techniques, applicable at different levels of abstraction, that have proven to hold great potential for power optimization in practical design environments. They range from RTL power management and clock-tree architecture design to memory and bus interface design. Also some of the latest solutions regarding frequency and voltage dynamic control, as well as solutions for leakage power management will be discussed.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129193689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Code partitioning for synthesis of embedded applications with phantom 用幻影合成嵌入式应用程序的代码划分
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. Pub Date : 2004-11-07 DOI: 10.1109/ICCAD.2004.1382569
A. C. Nacul, T. Givargis
{"title":"Code partitioning for synthesis of embedded applications with phantom","authors":"A. C. Nacul, T. Givargis","doi":"10.1109/ICCAD.2004.1382569","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382569","url":null,"abstract":"In a large class of embedded systems, dynamic multitasking using traditional OS techniques is infeasible because of memory and processing overheads or lack of operating systems availability for the target embedded processor. Serializing compilers have been proposed as an alternative solution, enabling a designer to develop multitasking applications without the need of OS support. A serializing compiler is a source-to-source translator that takes a POSIX compliant multitasking C program as input and generates an equivalent, embedded processor independent, single-threaded ANSI C program, to be compiled using the embedded processor-specific tool chain. Such serializing compilers work by partitioning each task into blocks of code and synthesizing a scheduler that dynamically switches among these blocks. The quality of the compiled code in terms of multitasking overhead and task latency is highly dependent on the partitioning algorithm. In this work, we give our solution to the partitioning problem in the context of serializing compilers. We show that it is possible to provide the designer with a set of Pareto-optimal solutions that trade off multitasking overhead for task latency.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134377765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
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