{"title":"True crosstalk aware incremental placement with noise map","authors":"Haoxing Ren, D. Pan, P. Villarrubia","doi":"10.1109/ICCAD.2004.1382608","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382608","url":null,"abstract":"Crosstalk noise has become an important issue as technology scales down for timing and signal integrity closure. Existing works to fix crosstalk noise are mostly done at the routing or post routing stage, which may be too late. Since placement determines the overall routing congestion, which correlates with the coupling capacitance, which in turn correlates with the crosstalk noise, placement shall be a good level to do early noise mitigation. The only existing work for the crosstalk aware placement (to our best knowledge) is by Lou and Chen (2004), which uses the coupling capacitance map to guide placement. However, crosstalk is determined not only by the coupling capacitance, but also by many other factors, such as the driver resistance of the victim net and the coupling location (near source vs near sink coupling) (Cong et al., 2001). We introduce a concept of noise map which takes those factors into account. Guided by this accurate noise map explicitly, we propose an incremental placement technique to mitigate noise without disturbing the global placement order. Our incremental placement has two key steps, namely noise aware cell inflation and local refinement. Experimental results on industrial circuits show that our approach is able to reduce the number of top noise nets by 25% and improve the timing (300ps on the worst slack), with no wire length penalty or CPU overhead. Our incremental approach is also able to maintain the placement stability.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"324 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124299581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling unbuffered latches for timing analysis","authors":"C. Amin, F. Dartu, Y. Ismail","doi":"10.1109/ICCAD.2004.1382582","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382582","url":null,"abstract":"Unbuffered latches are often used in high-performance designs with custom timing flows. Adding these circuits to a standard library enables improved designs without blowing the library size. We observe a high potential frequency gain (up to 16%) for smaller power consumption. Accurate models for static timing analysis are required to reach a good point on the safety to performance trade-off. We are proposing a complete modeling methodology that can fit in a standard timing analysis flow. An accurate n-model is presented for the input impedance of an unbuffered latch with less than 2% error. We also present a new setup criteria required for these latches. We also show that more advanced waveform models are required to model the output. A Weibull waveform model proves to be effective in this case.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124480822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On interactions between routing and detailed placement","authors":"Devang Jariwala, J. Lillis","doi":"10.1109/ICCAD.2004.1382606","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382606","url":null,"abstract":"The main goal of This work is to develop deeper insights into viable placement-level optimization of routing. Two primary contributions are made. First, an experimental framework in which the viability of predictive models of routing congestion for optimization during detailed placement can be evaluated, is developed. The main criteria of consideration in these experiments is how (un)reliably various models from the literature detect routing hot-spots. We conclude that such models appear to be too unreliable for detailed placement optimization. Second, motivated by the first result, we present a unified combinatorial framework in which cell placement and exact routing structures are captured and optimized; the framework relies on the trunk-decomposition of global routing structures and optimization is performed by a generalized optimal interleaving algorithm (Hur and Lillis, 2000). A proof of concept implementation of this framework is studied in the FPGA domain. The technique can reduce the number of channels at maximum density by almost 45% on average with maximum reduction of 68% for optimized global routing.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126478382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chen Li, M. Xie, Cheng-Kok Koh, J. Cong, P. Madden
{"title":"Routability-driven placement and white space allocation","authors":"Chen Li, M. Xie, Cheng-Kok Koh, J. Cong, P. Madden","doi":"10.1109/TCAD.2006.884575","DOIUrl":"https://doi.org/10.1109/TCAD.2006.884575","url":null,"abstract":"We present a congestion-driven placement flow. First, we consider in the global placement stage the routing demand to replace cells in order to avoid congested regions. Then we allocate appropriate amounts of white space into different regions of the chip according to the congestion map. Finally, a detailed placer is applied to legalize placements while preserving the distributions of white space. Experimental results show that our placement flow can achieve the best routability with the shortest routed wirelength among all publicly available placement tools. Moreover, our white space allocation approach can significantly improve the routabilities of placements generated by other placement tools.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128003748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Backend CAD flows for \"restrictive design rules\"","authors":"M. Lavin, Fook-Luen Heng, G. Northrop","doi":"10.1109/ICCAD.2004.1382674","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382674","url":null,"abstract":"To meet challenges of deep-subwavelength technologies (particularly 130 nm and following), lithography has come to rely increasingly on data processes such as shape fill, optical proximity correction, and RETs like altPSM. For emerging technologies (65 nm and following) the computation cost and complexity of these techniques are themselves becoming bottlenecks in the design-silicon flow. This has motivated the recent calls for restrictive design rules such as fixed width/pitch/orientation of gate-forming polysilicon features. We have been exploring how design might take advantage of these restrictions, and present some preliminary ideas for how we might reduce the computational cost throughout the back end of the design flow through the post-tapeout data processes while improving quality of results: the reliability of OPC/RET algorithms and the accuracy of models of manufactured products. We also believe that the underlying technology, including simulation and analysis, may be applicable to a variety of approaches to design for manufacturability (DFM).","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131436047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated oscillator macromodelling techniques for capturing amplitude variations and injection locking","authors":"X. Lai, J. Roychowdhury","doi":"10.1109/ICCAD.2004.1382663","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382663","url":null,"abstract":"We present a method for extracting comprehensive amplitude and phase macromodels of oscillators from their circuit descriptions. The macromodels are based on combining a scalar, nonlinear phase equation with a small linear time-varying system to capture slowly-dying amplitude variations. The comprehensive macromodels are able to correctly predict oscillator response in the presence of interference at far lower computational cost than that of full SPICE-level simulation. We also present an efficient numerical method for capturing injection locking in oscillators, thereby improving on the classic technique of Adler (1946) in terms of accuracy and applicability to any kind of oscillator. We demonstrate the proposed techniques on LC and ring oscillators, comparing results from the macromodels against full SPICE-like simulation. Numerical experiments demonstrate speed tips of orders of magnitude, while retaining excellent accuracy.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132046336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An efficient method for improving the quality of per-test fault diagnosis","authors":"Chunsheng Liu","doi":"10.1109/ICCAD.2004.1382655","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382655","url":null,"abstract":"Per-test fault diagnosis methodology has been shown to be an effective one for the identification of complex defects. We improve a recent per-test technique by applying additional diagnosis on the outputs of the circuit. The new method brings in more evidence to support the true failures, hence improves the diagnostic quality. We show that this method can very well address several problems in previous work.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133298729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"How to bridge the abstraction gap in system level modeling and design","authors":"A. Bernstein, M. Burton, F. Ghenassia","doi":"10.1109/ICCAD.2004.1382705","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382705","url":null,"abstract":"As more and more processors and subsystems are integrated in a single system, the verification bottleneck is driving designers away from RTL and RTL-like strategies for verification and design to higher abstraction levels. Increasing system complexity at the other hand requires much faster simulation and analysis tools. This is leading to new standards and tools around transaction level modeling. Languages such as SystemC and SystemVerilog are rich in behavioral and structural constructs which enable modeling designs at different levels of abstraction without imposing a top-down or bottom-up design flow. In fact, most design flows are iterative and modules at different levels of abstractions have to be considered. A more abstract model is very useful to increase simulation speed and to improve formal verification. SystemC and SystemVerilog stress the importance of verification support for complex SOCs including improvement for hardware verification as well as for the verification of hardware dependent software. In todays design flows the software development can often only start after the hardware is available. This causes unacceptable delays for the software development. The idea of transaction level modeling (TLM) is to provide in an early phase of the hardware development transaction level models of the hardware. Based on these TLMs a fast enough simulation environment is the basis for the development of hardware and hardware dependent software. The presumption is to run these transaction level models at several tens or some hundreds of thousand transactions per second which should be fast enough for system level modeling and verification.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"258 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114547850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analyzing software influences on substrate noise: an ADC perspective","authors":"F. Ghenassia, N. Vijaykrishnan, M. J. Irwin","doi":"10.1109/ICCAD.2004.1382707","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382707","url":null,"abstract":"Substrate noise affects the performance of mixed signal integrated circuits. Power supply (di/dt) noise is the dominant source of substrate noise. There have been various attempts at the circuit and software levels to estimate this noise. Software-level noise estimation is especially important, as designing noise tolerant circuits for all circumstances may be prohibitively expensive. In this paper, we propose a new software approach for estimating di/dt noise and incorporate it into a power simulator in order to investigate the influence of software on substrate noise. As a case study, we investigate how an analog-to-digital converter (ADC) can be designed to adapt its resolution in the presence of substrate noise generated by a embedded processor core. The proposed strategies prevent unexpected ADC performance degradations.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116462024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DAOmap: a depth-optimal area optimization mapping algorithm for FPGA designs","authors":"Deming Chen, J. Cong","doi":"10.1109/ICCAD.2004.1382677","DOIUrl":"https://doi.org/10.1109/ICCAD.2004.1382677","url":null,"abstract":"In This work we study the technology mapping problem for FPGA architectures to minimize chip area, or the total number of lookup tables (LUTs) of the mapped design, under the chip performance constraint. This is a well-studied topic and a very difficult task (NP-hard). The contributions of This work are as follows: (i) we consider the potential node duplications during the cut enumeration/generation procedure so the mapping costs encoded in the cuts drive the area-optimization objective more effectively; (ii) after the timing constraint is determined, we will relax the non-critical paths by searching the solution space considering both local and global optimality information to minimize mapping area; (iii) an iterative cut selection procedure is carried out that further explores and perturbs the solution space to improve solution quality. We guarantee optimal mapping depth under the unit delay model. Experimental results show that our mapping algorithm, named DAOmap, produces significant quality and runtime improvements. Compared to the state-of-the-art depth-optimal, area minimization mapping algorithm CutMap (Cong and Hwan, 1995), DAOmap is 16.02% better on area and runs 24.2X faster on average when both algorithms are mapping to FPGAs using LUTs of five inputs. LUTs of other inputs are also used for comparisons.","PeriodicalId":255227,"journal":{"name":"IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116494015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}