2012 IEEE 18th International On-Line Testing Symposium (IOLTS)最新文献_第3页

Logic masking for SET Mitigation Using Approximate Logic Circuits 使用近似逻辑电路的SET抑制逻辑屏蔽

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313868

A. Sánchez-Clemente, L. Entrena, M. García-Valderas, C. López-Ongil

引用次数: 34

Reliable and secure memories based on algebraic manipulation correction codes 基于代数操作校正码的可靠和安全的存储器

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313861

Zhen Wang, M. Karpovsky

引用次数: 20

A real-case application of a synergetic design-flow-oriented SER analysis 协同设计流导向SER分析的实际应用

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313839

M. Vilchis, R. Venkatraman, Enrico Costenaro, D. Alexandrescu

引用次数: 4

Cross-level protection of circuits against faults and malicious attacks 防止电路故障和恶意攻击的跨级保护

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313862

V. Tomashevich, S. Srinivasan, Fabian Foerg, I. Polian

{"title":"Cross-level protection of circuits against faults and malicious attacks","authors":"V. Tomashevich, S. Srinivasan, Fabian Foerg, I. Polian","doi":"10.1109/IOLTS.2012.6313862","DOIUrl":"https://doi.org/10.1109/IOLTS.2012.6313862","url":null,"abstract":"Nanoscale electronics is increasingly affected by disturbances caused by radiation, noise and effects of statistical process variations. Moreover, deliberate injection of faults into cryptographic circuits is used by malicious attackers to perform cryptanalysis and gain access to sensitive information. Error-detecting codes are employed to protect circuits against such disturbances, and new advanced codes specifically designed to counter malicious attacks have recently been introduced. However, a number of logic gates in the circuit are not adequately protected by the error-detecting code, as faults affecting these gates escape detection with a relatively high probability. We introduce a cross-level protection solution, where a light-weight error-detecting code is combined with hardening of insufficiently protected gates using transistor resizing. Such gates are determined by FPGA-supported fault injection. A thorough electrical analysis is performed in order to modify the electrical parameters of these gates such that faults are highly unlikely. We report area and power overhead for a number of error-detecting codes. To the best of our knowledge, this is the first work which co-optimizes fault handling by information redundancy based on error-detecting codes and by hardening individual circuit elements.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124164723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 14

Event-driven on-line co-simulation with fault diagnostic 带有故障诊断的事件驱动在线联合仿真

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313854

M. Baklashov

{"title":"Event-driven on-line co-simulation with fault diagnostic","authors":"M. Baklashov","doi":"10.1109/IOLTS.2012.6313854","DOIUrl":"https://doi.org/10.1109/IOLTS.2012.6313854","url":null,"abstract":"This paper introduces a functional co-validation technique realized inside co-simulation methodology, environment and tool. On-line co-simulation intends to concurrently simulate an execution of original binary applications and their binary translated images. Both, original and translated instructions execute under an Instruction Set Simulator (ISS) in a Virtual System Prototyping Environment (VSPE) that models hardware platform or chipset targeted to a given Instruction Set Architecture (ISA). Real world applications accounting for billions of instructions executing in VSPE under Operating System (OS) control may exhibit hard to reproduce and debug fatal failures. When dealing with such enormous state space, co-validation becomes a critical factor under tight schedules of the software/hardware co-design. The paper presents a mathematical model that allows for abstracting the huge co-simulated state space and special events of interest. A fault diagnostic mode implemented inside the tool couples run time software exception handling mechanisms with the events thus accommodating application runs to runtime failures for further debugging guidance. The tool implemented in C++ runs seamlessly inside VSPE.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133711832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis 基于模型异常诊断的导频符号驱动的射频发射系统电退化监测

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313860

Sabyasachi Deyati, A. Banerjee, A. Chatterjee

{"title":"Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis","authors":"Sabyasachi Deyati, A. Banerjee, A. Chatterjee","doi":"10.1109/IOLTS.2012.6313860","DOIUrl":"https://doi.org/10.1109/IOLTS.2012.6313860","url":null,"abstract":"Modern RF circuits suffer from increased electrical degradation induced by electrical stress and thermal effects due to the high speeds of operation and the effects of technology scaling. Detection of such degradation is important, particularly in wireless basestations which must operate round-the-clock with high dependability. In this paper, a new approach for detecting degradation in RF transmitter systems using pilot symbols is proposed and is superior to prior algorithms because degradation can be monitored on a frame-to-frame basis independent of the data being transmitted. The response of the RF transmitter to known pilot symbols is captured at the output of the RF power amplifier using an envelope detector and is fitted to a third order transmitter model using a model-parameter solving algorithm. It is shown that the computed model parameters deviate away from their nominal values, exhibiting model anomalies once nonidealities due to electrical degradation start affecting transmitter behavior. The amount of the degradation is proportional to the magnitude of this deviation as measured by a distance metric and is easily computed using simple algorithms running on the baseband processor. Preliminary results indicate the feasibility and low cost of the proposed approach.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129218479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Neutron radiation test of graphic processing units 图形处理装置的中子辐射试验

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313841

P. Rech, C. Aguiar, R. Ferreira, C. Frost, L. Carro

引用次数: 28

Do more camera pixels result in a better picture? 相机像素越多，照片就越好吗?

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313844

G. Chapman, I. Koren, Z. Koren

{"title":"Do more camera pixels result in a better picture?","authors":"G. Chapman, I. Koren, Z. Koren","doi":"10.1109/IOLTS.2012.6313844","DOIUrl":"https://doi.org/10.1109/IOLTS.2012.6313844","url":null,"abstract":"A digital camera sensor will incur pixel defects both in fabrication and during its lifetime. While manufacturing defects are corrected in the factory, in-field defects are prohibitively expensive to fix, and can eventually affect the picture quality. During the last 10 years, we have conducted a study of defect development in digital imagers, in which we had access to about 40 cameras and a database of past photos taken by them. The data we collected allows us to quantify characteristics of defect growth. Our investigations have shown that pixel defects are permanent, and their number grows with time. We found that the main type of defect is hot pixels, which are pixels that appear as a bright spot in the image even without any illumination. We also observed that the defects are distributed randomly over the sensor area and are not clustered. By studying past pictures of each given camera we found that the defect growth rate is constant over time. These spatial and temporal characteristics led us to the conclusion that defects are not likely related to material degradation or imperfect fabrication, but are caused by environmental stress such as cosmic rays radiation. Measuring the effect on the defect rate of sensor parameters such as sensor area, number of pixels, pixel size, and sensor technology (CCD - Charge Coupled Device vs. APS - Active Pixel Sensor) yielded a power law, implying that increasing the number of pixels by shrinking the pixel size will result in a higher defect rate and is, therefore, not recommended.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"599 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116462756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

On line monitoring of RF power amplifiers with embedded temperature sensors 嵌入式温度传感器射频功率放大器的在线监测

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313850

J. Altet, D. Mateo, D. Gómez

引用次数: 4

Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons 基于故障的地面辐射电子系统上界可靠设计，包括介子、电子、质子和低能中子

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI: 10.1109/IOLTS.2012.6313840

E. Ibe, Tadanobu Toba, K. Shimbo, H. Taniguchi

引用次数: 8