图形处理装置的中子辐射试验

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) Pub Date : 2012-06-27 DOI:10.1109/IOLTS.2012.6313841

P. Rech, C. Aguiar, R. Ferreira, C. Frost, L. Carro

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引用次数: 28

摘要

本文报道并分析了在现代商用图形处理器(GPU)上中子辐射测试活动的结果。提出了一套在cpu上进行加速辐射实验的指导方针，强调了简化测试和获得有意义的数据所必需的精明。给出并讨论了辐射测试结果，重点介绍了不同GPU内存和逻辑资源在海平面中子失效(FIT)方面的中子敏感性。

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Neutron radiation test of graphic processing units

This paper reports and analyzes the results of neutrons radiation testing campaigns on a modern commercial-off-the-shelf Graphic Processing Unit (GPU). A set of guidelines for accelerated radiation experiments on CPUs is presented, emphasizing the shrewdness necessary to ease the test and gain meaningful data. Radiation test results are presented and discussed, highlighting the neutrons sensitivities of the different GPU memory and logic resources in terms of Failure In Time (FIT) due to neutrons at sea level.

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2012 IEEE 18th International On-Line Testing Symposium (IOLTS)

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