Y. Ho, G. Chen, A. Davies, R. N. Hampton, S. Swingler, S. Sutton
{"title":"Do semicons affect space charge?","authors":"Y. Ho, G. Chen, A. Davies, R. N. Hampton, S. Swingler, S. Sutton","doi":"10.1109/ICSD.2001.955526","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955526","url":null,"abstract":"This paper reports on space charge measurements on /spl sim/1.5 mm thick XLPE and polyolefinic plaques with two different treatments and semicon electrodes, namely, the same XLPE and polyolefin loaded with carbon. Samples were subjected to both DC and 50 Hz AC electric stresses in the region of 25 kV/mm (at room temperature). Measurements of charge profiles and stress distributions were made using the modified laser induced pressure propagation system. Emphasis has been placed on comparing the space charge characteristics of the two insulation systems with the different sernicon electrodes. The effects of sample treatment (i.e. degassing) on the space charge dynamics are also presented.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133828346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Influence of thermal cycling on the cable-joint interfacial pressure","authors":"N. Amyot, D. Fournier","doi":"10.1109/ICSD.2001.955505","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955505","url":null,"abstract":"Cable joints are generally known to be the weak points of underground distribution lines. One of the most common failure modes of premolded cable joints is linked to the occurrence of dielectric breakdown at the interface. Many parameters may influence the dielectric strength of a cable-joint interface: surface roughness, the presence of dielectric grease, and the length of the interface to name a few. Nevertheless, interfacial pressure is known to be a key factor that sets the cable-joint interfacial breakdown strength. AC dielectric breakdown strength is proportional to interfacial pressure up to a threshold pressure. A high interfacial pressure leads to good dielectric breakdown strength whereas a lower pressure leads to a poor long-term performance. Interfacial pressure decreases with the number of thermal cycles. Moreover, partial discharge (PD) monitoring during thermal cycles with thermal gradients in the insulation, following IEEE 404 standard protocol, did reveal a maximum PD intensity at the end of the temperature decrease for each cycle. This could be linked to a decrease in the interfacial pressure. We study the behavior of interfacial pressure when a cable-joint assembly is thermally cycled and identify the worse case for cycles at 75, 90 and 130/spl deg/C with thermal gradients in the bulk of the insulation. The cycling protocol is based on existing IEEE 404 standard for cable joints for use with extruded dielectric cable rated 5-138 kV.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"519 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134316755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On the evaluation of intrinsic distributions of relaxation timies using blocking electrodes","authors":"R. Pelster, F. Henn, J. Giuntini, S. Devautour","doi":"10.1109/ICSD.2001.955516","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955516","url":null,"abstract":"We have shown that the use of blocking electrodes results in a spectrum of effective relaxation times, which considerably differs from the intrinsic one characterising the dynamics of bulk material. An effective medium analysis allows us to transform the effective distribution into the intrinsic one and vice versa. The procedure can be applied to data obtained by dielectric relaxation spectroscopy as well as to TSDC data.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"43 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132483893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"In-situ diagnostic of polypropylene degradation by electrical discharge induced luminescence at room temperature","authors":"M. Duran, G. Teyssèdre, F. Massines, C. Laurent","doi":"10.1109/ICSD.2001.955504","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955504","url":null,"abstract":"Cold electrical discharges or plasma are widely used to modify polymer properties whereas long interaction can lead to polymer degradation. Discharges are also commonly used to charge dielectric materials in order to study charge storage capabilities of the material and its evolution with time, using as example surface potential measurement. The interest of plasma-induced luminescence (PIL) technique would be to develop a new in-situ diagnostic of discharge-polymer interaction. The aim of the present work is to determine the way a plasma created by a cold electrical discharge can induce polymer luminescence at room temperature and how this PIL can be used for the diagnostic of polymer surface transformations and degradation.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131667595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Acedo, I. Radu, F. Frutos, J. Filippini, A. Jimenez, J.A. Perez-Gomez, A. Jadraque
{"title":"The characterization of a LDPE affected by different levels of water tree degradation using absorption current measurements","authors":"M. Acedo, I. Radu, F. Frutos, J. Filippini, A. Jimenez, J.A. Perez-Gomez, A. Jadraque","doi":"10.1109/ICSD.2001.955711","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955711","url":null,"abstract":"In this work, in order to characterize the conduction process in polymer dielectrics, we focus our interest on the absorption current through LDPE. We have experimentally considered the influence of the degree of degradation or degraded width percentage and polarization voltage on the measurements of absorption current and capacitance. From the point of view of accelerated ageing, the typical electro-chemical degradation process of service power cables known as \"water treeing\" was simulated in the laboratory. Then we measured absorption currents for specimens with a different degree of treed degradation and finally, a correlation between the degree of ageing and the fitting parameters of current experimental data to the Curie-von Schweidler law was proposed.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133009205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Sylvestre, P. Rain, N. Raphoz, A. Khomsi, J. Gatellet
{"title":"Influence of electro-thermal aging on the space charges measurements in epoxy resins","authors":"A. Sylvestre, P. Rain, N. Raphoz, A. Khomsi, J. Gatellet","doi":"10.1109/ICSD.2001.955534","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955534","url":null,"abstract":"The role of space charges in the prebreakdown phenomena of polymers is commonly admitted and intensively studied. The behavior of space charges is quickly affected by aging and thus may lighten the influence of the various aging factors. The Laser Induced Pressure Pulse (LIPP) method has been mainly dedicated to the characterization of polyethylene materials submitted to DC voltage. Very few studies have concerned epoxy resins. The purpose of this study is to investigate how the LIPP method may be relevant in characterizing the aging under AC voltage and temperature of epoxy resins. This characterization may require the application of electrical fields and temperatures on the samples. However, it should not damage nor induce irreversible degradation of the tested samples whose aging should proceed. This possible degradation due to the measurements has first been studied using unaged samples submitted to various conditions of temperature, stress and duration of voltage application.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114465620","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experimental research of the correlation between partial discharges in polyethylene insulation and fractal characteristics of causing them treeing","authors":"M. Rezinkina, O. Rezinkin","doi":"10.1109/ICSD.2001.955673","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955673","url":null,"abstract":"The following correlations between partial discharge (PD) distributions and fractal characteristics of calling them dendrites are revealed in an outcome of the experimental researches reported. Asymmetrical distribution effect on the positive and the negative half-wave of the applied voltage distributions of frequencies of phases of PD appearances with smoothed tops are intrinsic to a bushing-like treeing. The distributions of frequencies of phases of PD appearance on the negative and the positive half-wave of the applied voltage are similar to a treeing-like dendrites with low fractal dimension: they are positively asymmetric and weakly pointed. It is observed, that lengthwise growth of a bush-Eke dendrite decelerates or ceases, an average PD quantity during a period decreases, a diameter of branches thickens from 1-3 micron to 6-10 micron at various magnitudes of the applied voltage. This phenomenon is connected with different character of electric field strength distribution at a treeing-like and a bush-like form of a dendrite and accordingly with different coefficients of electrical field heterogeneity.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124346672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Influence of ionic impurities on the AC breakdown and its frequency dependence in the polymer thin film","authors":"K. Miyairi, E. Itoh","doi":"10.1109/ICSD.2001.955572","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955572","url":null,"abstract":"In this study, we investigated the AC breakdown strength of poly (N-vinylcarbazole) (PVCz) and poly(methyl methacrylate) (PMMA) thin films sandwiched with two metal electrodes at the frequencies between 10Hz- 3kHz. We then investigated the influence of ionic impurity doping such as LiClO/sub 4/ on the AC breakdown properties in PMMA films. It was found that the electrical strength of AC breakdown increased with the increment of the frequencies and decreased with the increment of temperature especially at the temperatures between 30 and 200/spl deg/C for PVCz films and at the temperatures between 30 and below T/sub g/ (/spl eDot/110/spl deg/C) for PMMA films. It was also found that the AC breakdown strength decreased significantly for the doping of LiClO/sub 4/ larger than 2wt% probably due to the accumulation of hetero-ionic space charges at the electrode/film interface.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116004370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The evolution of moisture transport phenomena in partially saturated dielectric materials","authors":"B. Punantapong","doi":"10.1109/ICSD.2001.955539","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955539","url":null,"abstract":"This research is devoted to identifying and analysing the numerical strategies that are necessary to provide fast and accurate computations of the equations which govern the evolution of moisture transport phenomena in partially saturated dielectric materials. An alternative approach is to develop a computational model which predict the behaviour of the dielectric materials throughout the heat and mass transfer phenomena. Therefore, the model described here endeavours to identify and subsequently tract when these changes of state occur, so that the resulting numerical technique allows the evolution of the distributions of these state variables to be analysed throughout the process.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123220497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B.R. Hamerling, F. Wester, E. Gulski, J. Smit, E. Groot
{"title":"Fundamental aspects of on-line PD measurements on distribution power cables","authors":"B.R. Hamerling, F. Wester, E. Gulski, J. Smit, E. Groot","doi":"10.1109/ICSD.2001.955674","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955674","url":null,"abstract":"In this paper the fundamental aspects of online partial discharge detection on distribution power cables as a tool for insulation condition assessment are discussed. In particular, based on laboratory and field tests, the online PD diagnostics is presented to be a good PD detection diagnostic.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121397376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}