ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)最新文献_第10页

The electrical characteristics of oxide due to processing condition 由加工条件决定的氧化物的电学特性

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955595

Nungpyo Hong, D. Choi, Taekoo Lee, Byung-Ha Choi, Tae-hoon Kim, Jin-woong Hong

引用次数: 2

Interpretation of dielectric response measurement data from service aged XLPE-cables 服役老化xlpe电缆介电响应测量数据的解释

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955664

G. Hoff, H. Kranz

引用次数: 6

Experiences with on-site measurements of mass-impregnated cables 有大量浸渍电缆的现场测量经验

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955658

O. Kouzmine, R. Patsch, J. Jung

引用次数: 3

The breakdown study of three-layer solid dielectrics 三层固体电介质的击穿研究

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955685

D. Agoris, V.I. Chichikin, O. S. Gefle, S. M. Lebedev, I. Vitellas

引用次数: 4

Changes of ac loss current and conductivity in open channel region of water treed XLPE with voltage 树形交联聚乙烯明渠区交流损耗电流和电导率随电压的变化

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955662

J. Kawai, S. Nakamura

引用次数: 2

An exploration of physical ageing in electrically-stressed polymeric insulating films using the quartz crystal shear wave sensor technique 利用石英晶体剪切波传感器技术探索电应力聚合物绝缘膜的物理老化

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955506

P. Connor, J.P. Jones, J. Llewellyn, T. J. Lewis

{"title":"An exploration of physical ageing in electrically-stressed polymeric insulating films using the quartz crystal shear wave sensor technique","authors":"P. Connor, J.P. Jones, J. Llewellyn, T. J. Lewis","doi":"10.1109/ICSD.2001.955506","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955506","url":null,"abstract":"The mechanical stress induced by a strong electrical field could be a significant contributing factor to the electrical ageing and breakdown of insulating polymeric materials such as polyethylene. An extensive literature exists describing the nature of the failure of polyethylene under mechanical stress. The initial failure is considered to be the generation of sub-microscopic voids, which coalesce to form a crack, and is accompanied by chain scission and electromagnetic radiation. These features bear remarkable resemblance to those, such as trees, appearing in electrical breakdown. If electrically induced mechanical stress is indeed a significant factor in electrical breakdown, then it might be expected that marked changes in the viscoelastic parameters of the polymer, indicative of morphological change, might accompany electrical stressing. Moreover such changes might appear at stresses well below those for breakdown. To test this there are a number of ways in which conventional mechanical testing at low frequency might be adapted to allow simultaneous electrical stressing. We have adopted an unconventional approach, employing a quartz crystal shear wave sensor to determine the shear wave moduli of polyethylene under electrical stress. The technique has been refined. We are now able to demonstrate that the changes in the mechanical viscoelastic moduli of polyethylene in response to electrical stress are quite complex and polarity dependent.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122193686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Detection of water trees in medium voltage cables by RVM, without reference measurements 用RVM检测中压电缆中的水树，没有参考测量

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955709

B. Alijagic-Jonuz, P. Morshuis, H. van Breen, J. Smit

引用次数: 4

The accelerated ageing of a XLPE cable insulation under the simultaneous action of heat and stationary electric field 热和静电场共同作用下交联聚乙烯电缆绝缘的加速老化

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955512

G. Mares, R. Setnescu

引用次数: 2

Initiation mechanism of electrical tree under alternating stress-electron impact or UV photo-degradation?

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955681

N. Shimizu, T. Takahashi, S. Iemura

引用次数: 9

Use of capacitive couplers for partial discharge measurements in power cables and joints 在电力电缆和接头中使用电容耦合器进行局部放电测量

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955677

L. Zhong, Y. Xu, G. Chen, A. Davies, Z. Richardson, S. Swingler

{"title":"Use of capacitive couplers for partial discharge measurements in power cables and joints","authors":"L. Zhong, Y. Xu, G. Chen, A. Davies, Z. Richardson, S. Swingler","doi":"10.1109/ICSD.2001.955677","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955677","url":null,"abstract":"Partial discharge (PD) detection and measurement is one of the main nondestructive techniques in high voltage cable systems to verify the quality of the manufactured bulk insulation product and to check the integrity of installed cable accessories. To have confidence in the installation and to ensure system reliability, more sensitive on-site testing and on-line pd monitoring is required particularly for transmission class cables. Over the last ten years significant developments have been made and several techniques, including capacitive, dual capacitive, directional coupler, sheath interruption and inductive methods, have been proposed and partially put into practice Due to advances in material processing, manufacturing and factory test procedures, it is unlikely that the cable itself will normally exhibit pd activity. It is the cable accessories (the, joints and terminations) that are the most likely source of PD. Placing a capacitive coupler inside or close to the cable accessory is an attractive PD monitoring option However, a, full understanding of the technique is essential in order to maximise its potential application. This paper reports on some aspects of the theoretical characteristics of the capacitive coupler. Based on an equivalent circuit model, simulations to investigate the influence of different parameters on the performance of the coupler have been undertaken. Experimental results show good agreement with theoretical predictions.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115945224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11