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ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)最新文献

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Dielectric sample with narrow bulk charge distribution 体电荷分布窄的介电样品
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955705
J. Holbøll, M. Henriksen, J. Hjerrild
{"title":"Dielectric sample with narrow bulk charge distribution","authors":"J. Holbøll, M. Henriksen, J. Hjerrild","doi":"10.1109/ICSD.2001.955705","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955705","url":null,"abstract":"Flat test samples of PMMA, with a 50 nm gold layer included in the middle of the sample, have been developed and are shown to be extremely suitable for calibration and testing of space charge measurement systems. A DC voltage was applied to the gold layer and the connected electrodes generating a very narrow charge layer inside the dielectric, which enables application of pulse response based deconvolution methods covering the whole detection system, electrically and acoustically.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132278102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Partial discharge on-line monitoring in switchgears and bus ducts 开关设备和母线管道局部放电在线监测
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955654
Z. Berler, I. Blokhintsev, A. Golubev
{"title":"Partial discharge on-line monitoring in switchgears and bus ducts","authors":"Z. Berler, I. Blokhintsev, A. Golubev","doi":"10.1109/ICSD.2001.955654","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955654","url":null,"abstract":"The paper describes the positive practical experience in PD measurements in switchgears and bus ducts using a portable computerized partial discharge analyzer UPDA. On-line PD technology proved to be a fast, convenient and cost effective non-invasive tool in revealing numerous places of worsened insulation and other defects (bad contacts, loose insulators, insufficient distances between HV bus and secondary wiring, etc.) in switchgears and bus ducts of medium voltages. This technology was successfully applied to numerous objects in electric utilities, industrial customers and nuclear power plants.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"96 1 Pt 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129610727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Space charge measurements on power cable length 电力电缆长度的空间电荷测量
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955667
S. Agnel, P. Notingher, A. Toureille
{"title":"Space charge measurements on power cable length","authors":"S. Agnel, P. Notingher, A. Toureille","doi":"10.1109/ICSD.2001.955667","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955667","url":null,"abstract":"The set up of nondestructive techniques for measuring space charge has allowed to prove the importance of these charges on the longtime behaviour of cable insulation. It seems today more and more probable that the decrease of performance and breakdown of polyethylene-insulated power cables are related to the appearance and the development of space charges. In this work, we show how one can, using the Thermal Step Method (TSM), to evaluate the electrical state of a significant cable length, both locally and globally. We also compare the charging ability of a cable insulation after two types of applied stress: poling at room temperature and under a thermal gradient similar to the one which appears in cable during operation.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132257121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
An invariant diagnostic marker for the identification of partial discharge sources in electrical apparatus 电气设备局部放电源识别的一种不变诊断标记
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955626
A. Contin, G. Montanari, M. Conti, M. Cacciari
{"title":"An invariant diagnostic marker for the identification of partial discharge sources in electrical apparatus","authors":"A. Contin, G. Montanari, M. Conti, M. Cacciari","doi":"10.1109/ICSD.2001.955626","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955626","url":null,"abstract":"The problem of the identification of Partial Discharge (PD) phenomena in electrical apparatus, where the PD signals detected at the measurement bus can be significantly attenuated and distorted by the transmission path, is dealt with. Recently, it has been shown that the shape parameter of the Weibull function, /spl beta/, can be used to identify PD-source typologies, even in the presence of different PD phenomena simultaneously active. This paper provides further contributions to the validation of /spl beta/ as aging marker, focusing on the behavior of /spl beta/ in the presence of distortion and attenuation of PD signals due to the influence of the transmission path between the detection point and the PD source. For this purpose, different PD sources, such as internal void, surface and corona discharges, were considered in the experiments.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"13 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132390364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A new approach to the modelling of the conduction processes in a water tree degraded LDPE 水树降解LDPE中传导过程建模的新方法
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955577
F. Frutos, M. Acedo, I. Radu, A. Jimenez, J.A. Perez-Gomez, J. Filippini, A. Jadraque
{"title":"A new approach to the modelling of the conduction processes in a water tree degraded LDPE","authors":"F. Frutos, M. Acedo, I. Radu, A. Jimenez, J.A. Perez-Gomez, J. Filippini, A. Jadraque","doi":"10.1109/ICSD.2001.955577","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955577","url":null,"abstract":"A new conduction model that takes into account dipole interactions is presented from a modification of the two-wells Debye model. The proposed model provides easy analytical expressions for the dependencies of the experimental Curie-von-Schweidler parameters on both microscopic and macroscopic variables of the LDPE plane-plane samples under test. From the evolution of these variables with water tree degradation width, g, and polarization voltage, V/sub DC/, we could simulate polarization currents that had a good deal of accord for measurements in accelerated-aged LDPE specimens.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124203594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Correlation of acoustic emission method and electrical method for detection of partial discharges in transformers 变压器局部放电检测的声发射法与电法的相关性
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955631
R. Menon, S. Kolambekar, N. J. Buch, M. Ramamoorty
{"title":"Correlation of acoustic emission method and electrical method for detection of partial discharges in transformers","authors":"R. Menon, S. Kolambekar, N. J. Buch, M. Ramamoorty","doi":"10.1109/ICSD.2001.955631","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955631","url":null,"abstract":"In this paper, the detection and location of partial discharges by using acoustic emission (AE) method and the experiments and experience in the correlation of the test results by both the electrical detection method and the AE method are elaborated.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129234638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Treeing phenomena in EVA with various barrier films of polymers 各种聚合物阻隔膜在EVA中的树状现象
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955682
H. Uehara, T. Arai, T. Kanno, K. Kudo
{"title":"Treeing phenomena in EVA with various barrier films of polymers","authors":"H. Uehara, T. Arai, T. Kanno, K. Kudo","doi":"10.1109/ICSD.2001.955682","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955682","url":null,"abstract":"In this paper, we investigate the tree growth and complete breakdown characteristics of samples with a layer of polymer film molded in EVA where their interfaces are perpendicular to an electric field using a point to plane electrode geometry, under ac or impulse voltage application. In addition, we compare the experimental results with those obtained from 3-dimensional tree simulation based on a DBM model considering growth probability.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117319953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
On-line PD detection techniques for assessment of the dielectric condition of HV components 高压元件介电状态评估的在线PD检测技术
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955700
W. Rutgers, R. Ross, T.G.M. van Rijn
{"title":"On-line PD detection techniques for assessment of the dielectric condition of HV components","authors":"W. Rutgers, R. Ross, T.G.M. van Rijn","doi":"10.1109/ICSD.2001.955700","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955700","url":null,"abstract":"Corrective and time based maintenance of expensive components in electrical infrastructures are increasingly replaced by condition based maintenance (CBM). The implementation of CBM requires suitable diagnostic and condition assessment techniques and tools. During the last five years KEMA has developed a set of diagnostic techniques that are in use now on switch-gear, transformers, cables and generators. This paper focuses on on-line partial discharge (PD) diagnosis of HV components to provide information about the dielectric integrity during service. The measurements are done on suspect components or during regular maintenance schedules.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124140148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
An investigation on the distribution of ions and water in water trees by FTIR microspectroscopy 傅立叶红外光谱法研究水树中离子和水的分布
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955661
O. Visata, G. Teissèdre, J. Filippini, P. Notingher
{"title":"An investigation on the distribution of ions and water in water trees by FTIR microspectroscopy","authors":"O. Visata, G. Teissèdre, J. Filippini, P. Notingher","doi":"10.1109/ICSD.2001.955661","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955661","url":null,"abstract":"Water treeing is an important degradation phenomenon which takes place in the polymeric insulation of electrical cables, under the action of an ac field and in the presence of moisture. The water tree consists of microvoids more or less connected by microchannels or tracks, the density of microvoids (number/volume unit) decreasing from the root to the front of the water tree. The microvoids contain the water and ions which have penetrated the polymer under the action of the electric field. The mechanisms involved are not yet really well understood. Until now, water and ions in the water tree had been examined separately, by different methods, such as infrared spectroscopy, neutron activation analysis or X-ray analysis. In this communication, we present a study of water and ions distribution in the same water tree by FTIR microspectroscopy and we try to correlate our results with the proposed mechanisms for the growth of water trees.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115940943","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
PD inception conditions and PD pattern of defects in PILC PILC中缺陷的PD起始条件和PD模式
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955659
Y. Muramoto, E. Gulski, F. Wester, J. Smit
{"title":"PD inception conditions and PD pattern of defects in PILC","authors":"Y. Muramoto, E. Gulski, F. Wester, J. Smit","doi":"10.1109/ICSD.2001.955659","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955659","url":null,"abstract":"A new medium voltage paper-insulated lead cable (PILC) network represents a large investment, and it is from the economic point of view essential to extend the life time of the medium voltage power cables as much as possible. It is known that with increasing age, the number of faults will increase and the power supply quality might deteriorate. Important symptoms of this degradation process can be related to discharging local insulation imperfections or defects which may occur in particular cable sections or cable accessories: joints and terminations. The PILC section may consist of species of different insulation types and multiple defects may occur at the same time. As a result complex partial discharge (PD) pictures may be measured representing the PD information of all these particular elements. In this study we look at the typical PILC insulation related PD induced dielectric failure processes from the physical point of view.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123156522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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