2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)最新文献

筛选
英文 中文
Design enablement of CFET devices for sub-2nm CMOS nodes 亚2nm CMOS节点的CFET器件的设计实现
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774720
O. Zografos, B. Chehab, P. Schuddinck, G. Mirabelli, N. Kakarla, Y. Xiang, P. Weckx, J. Ryckaert
{"title":"Design enablement of CFET devices for sub-2nm CMOS nodes","authors":"O. Zografos, B. Chehab, P. Schuddinck, G. Mirabelli, N. Kakarla, Y. Xiang, P. Weckx, J. Ryckaert","doi":"10.23919/DATE54114.2022.9774720","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774720","url":null,"abstract":"Novel devices that optimize their structure in a three-dimensional fashion and offer significant area gains by reducing standard cell track height are adopted to scale silicon technologies beyond the 5nm node. Such a device is the Complementary FET (CFET), which consists of an n-type channel stacked vertically over a p-type channel. In this paper we review the significant benefits of CFET devices as well as the challenges that arise with their use. More specifically, we focus on the standard cell design challenges as well as the physical implementation ones. We show that to fully exploit the area benefits of the CFET devices, one must carefully select the metal stack used for the physical implementation of a large design.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130063604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Leakage Power Analysis in Different S-Box Masking Protection Schemes 不同s盒屏蔽保护方案的泄漏功率分析
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774763
Javad Bahrami, Mohammad Ebrahimabadi, J. Danger, S. Guilley, Naghmeh Karimi
{"title":"Leakage Power Analysis in Different S-Box Masking Protection Schemes","authors":"Javad Bahrami, Mohammad Ebrahimabadi, J. Danger, S. Guilley, Naghmeh Karimi","doi":"10.23919/DATE54114.2022.9774763","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774763","url":null,"abstract":"Internet-of- Things (IoT) devices are natural targets for side-channel attacks. Still, side-channel leakage can be com-plex: its modeling can be assisted by statistical tools. Projection of the leakage into an orthonormal basis allows to understand its structure, typically linear (1st-order leakage) or non-linear (sometimes referred to as glitches). In order to ensure cryptosystems protection, several masking methods have been published. Unfortunately, they follow different strategies; thus it is hard to compare them. Namely, ISW is constructive, GLUT is systematic, RSM is a low-entropy version of GLUT, RSM-ROM is a further optimization aiming at balancing the leakage further, and TI aims at avoiding, by design, the leakage arising from the glitches. In practice, no study has compared these styles on an equal basis. Accordingly, in this paper, we present a consistent methodology relying on a Walsh-Hadamard transform in this respect. We consider different masked implementations of substitution boxes of PRESENT algorithm, as this function is the most leaking in symmetric cryptography. We show that ISW is the most secure among the considered masking implementations. For sure, it takes strong advantage of the knowledge of the PRESENT substitution box equation. Tabulated masking schemes appear as providing a lesser amount of security compared to unprotected counterparts. The leakage is assessed over time, i.e., considering device aging which contributes to mitigate the leakage differently according to the masking style.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"458 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131246713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
On the Optimal OBDD Representation of 2-XOR Boolean Affine Spaces 2-XOR布尔仿射空间的最优OBDD表示
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774551
A. Bernasconi, V. Ciriani, Marco Longhi
{"title":"On the Optimal OBDD Representation of 2-XOR Boolean Affine Spaces","authors":"A. Bernasconi, V. Ciriani, Marco Longhi","doi":"10.23919/DATE54114.2022.9774551","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774551","url":null,"abstract":"A Reduced Ordered Binary Decision Diagram (ROBDD) is a data structure widely used in an increasing number of fields of Computer Science. In general, ROBDD representations of Boolean functions have a tractable size, polynomial in the number of input variables, for many practical applications. However, the size of a ROBDD, and consequently the complexity of its manipulation, strongly depends on the variable ordering: depending on the initial ordering of the input variables, the size of a ROBDD representation can grow from linear to exponential. In this paper, we study the ROBDD representation of Boolean functions that describe a special class of Boolean affine spaces, which play an important role in some logic synthesis applications. We first discuss how the ROBDD representations of these functions are very sensitive to variable ordering, and then provide an efficient linear time algorithm for computing an optimal variable ordering that always guarantees a ROBDD of size linear in the number of input variables.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127643001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Accurate Probabilistic Miss Ratio Curve Approximation for Adaptive Cache Allocation in Block Storage Systems 块存储系统自适应缓存分配的精确概率缺失率曲线逼近
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774516
Rongshang Li, Yingtian Tang, Qiquan Shi, Hui Mao, Lei Chen, Jikun Jin, Peng Lu, Zhuo Cheng
{"title":"Accurate Probabilistic Miss Ratio Curve Approximation for Adaptive Cache Allocation in Block Storage Systems","authors":"Rongshang Li, Yingtian Tang, Qiquan Shi, Hui Mao, Lei Chen, Jikun Jin, Peng Lu, Zhuo Cheng","doi":"10.23919/DATE54114.2022.9774516","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774516","url":null,"abstract":"Cache plays an important role in storage systems. With better allocation of cache space to each storage device, total I/O latency can be reduced remarkably. To achieve this goal, we propose an Accurate Probabilistic miss ratio curve approximation for Adaptive Cache allocation (APAC) system. APAC can obtain near-optimal performance for allocating cache space with low overhead. Specifically, with a linear-time probabilistic approximation of reuse distance of all blocks inside each device, APAC can accurately estimate the miss ratio curve (MRC). Furthermore, APAC utilizes the MRCs to obtain the near-optimal configuration of cache allocation by dynamic programming. Experimental results show that APAC achieves higher accuracy in MRC approximation compared to the state-of-the-art methods, leading to higher hit ratio and lower latency of the block storage systems.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115081418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
GATLB: A Granularity-Aware TLB to Support Multi-Granularity Pages in Hybrid Memory System 支持混合内存系统中多粒度页面的粒度感知TLB
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774723
Yujuan Tan, Yujie Xie, Zhulin Ma, Zhichao Yan, Zhichao Zhang, Duo Liu, Xianzhang Chen
{"title":"GATLB: A Granularity-Aware TLB to Support Multi-Granularity Pages in Hybrid Memory System","authors":"Yujuan Tan, Yujie Xie, Zhulin Ma, Zhichao Yan, Zhichao Zhang, Duo Liu, Xianzhang Chen","doi":"10.23919/DATE54114.2022.9774723","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774723","url":null,"abstract":"The parallel hybrid memory system that combines Non-volatile Memory (NVM) and DRAM can effectively expand the memory capacity. But it puts lots of pressure on TLB due to a limited TLB capacity. The superpage technology that manages pages with a large granularity (e.g., 2MB) is usually used to improve the TLB performance. However, its coarse-grained granularity conflicts with the fine-grained page migration in the hybrid memory system, resulting in serious invalid migration and page fragmentation problems. To solve these problems, we propose to maintain the coexistence of multi-granularity pages, and design a smart TLB called GATLB to support multi-granularity page management, coalesce consecutive pages and adapt to various changes in page size. Compared with the existing TLB technologies, GATLB can not only perceive page granularity to effectively expand the TLB coverage and reduce miss rate, but also provide faster address translation with a much lower overhead. Our experimental evaluations show that GATLB can expand the TLB coverage by 7.09x, reduce the TLB miss rate by 91.1%, and shorten the address translation cycle by 49.41%.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124677205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Deep-Learning Approach to Side-Channel Based CPU Disassembly at Design Time 设计时基于侧信道的CPU拆卸的深度学习方法
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774531
Hedi Fendri, Marco Macchetti, Jérôme Perrine, Mirjana Stojilović
{"title":"A Deep-Learning Approach to Side-Channel Based CPU Disassembly at Design Time","authors":"Hedi Fendri, Marco Macchetti, Jérôme Perrine, Mirjana Stojilović","doi":"10.23919/DATE54114.2022.9774531","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774531","url":null,"abstract":"Side-channel CPU disassembly is a side-channel attack that allows an adversary to recover instructions executed by a processor. Not only does such an attack compromise code confidentiality, it can also reveal critical information on the system's internals. Being easily accessible to a vast number of end users, modern embedded devices are highly vulnerable against disassembly attacks. To protect them, designers deploy countermeasures and verify their efficiency in security laboratories. Clearly, any vulnerability discovered at that point, after the integrated circuit has been manufactured, represents an important setback. In this paper, we address the above issues in two steps: Firstly, we design a framework that takes a design netlist and outputs simulated power side-channel traces, with the goal of assessing the vulnerability of the device at design time. Secondly, we propose a novel side-channel disassembler, based on multilayer perceptron and sparse dictionary learning for feature engineering. Experimental results on simulated and measured side-channel traces of two commercial RISC-V devices, both working on operating frequencies of at least 100 MHz, demonstrate that our disassembler can recognize CPU instructions with success rates of 96.01% and 93.16%, respectively.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128497125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Bioformers: Embedding Transformers for Ultra-Low Power sEMG-based Gesture Recognition 生物变形:超低功耗基于表面肌电信号的手势识别嵌入变压器
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.48550/arXiv.2203.12932
A. Burrello, Francesco Bianco Morghet, Moritz Scherer, S. Benatti, L. Benini, E. Macii, M. Poncino, D. J. Pagliari
{"title":"Bioformers: Embedding Transformers for Ultra-Low Power sEMG-based Gesture Recognition","authors":"A. Burrello, Francesco Bianco Morghet, Moritz Scherer, S. Benatti, L. Benini, E. Macii, M. Poncino, D. J. Pagliari","doi":"10.48550/arXiv.2203.12932","DOIUrl":"https://doi.org/10.48550/arXiv.2203.12932","url":null,"abstract":"Human-machine interaction is gaining traction in rehabilitation tasks, such as controlling prosthetic hands or robotic arms. Gesture recognition exploiting surface electromyographic (sEMG) signals is one of the most promising approaches, given that sEMG signal acquisition is non-invasive and is directly related to muscle contraction. However, the analysis of these signals still presents many challenges since similar gestures result in similar muscle contractions. Thus the resulting signal shapes are almost identical, leading to low classification accuracy. To tackle this challenge, complex neural networks are employed, which require large memory footprints, consume relatively high energy and limit the maximum battery life of devices used for classification. This work addresses this problem with the introduction of the Bioformers. This new family of ultra-small attention-based architectures approaches state-of-the-art performance while reducing the number of parameters and operations of 4.9 ×. Additionally, by introducing a new inter-subjects pre-training, we improve the accuracy of our best Bioformer by 3.39 %, matching state-of-the-art accuracy without any additional inference cost. Deploying our best performing Bioformer on a Parallel, Ultra-Low Power (PULP) microcontroller unit (MCU), the GreenWaves GAP8, we achieve an inference latency and energy of 2.72 ms and 0.14 mJ, respectively, 8.0× lower than the previous state-of-the-art neural network, while occupying just 94.2 kB of memory.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129680219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Learning to Design Accurate Deep Learning Accelerators with Inaccurate Multipliers
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774607
Paras Jain, Safeen Huda, Martin Maas, Joseph Gonzalez, I. Stoica, Azalia Mirhoseini
{"title":"Learning to Design Accurate Deep Learning Accelerators with Inaccurate Multipliers","authors":"Paras Jain, Safeen Huda, Martin Maas, Joseph Gonzalez, I. Stoica, Azalia Mirhoseini","doi":"10.23919/DATE54114.2022.9774607","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774607","url":null,"abstract":"Approximate computing is a promising way to improve the power efficiency of deep learning. While recent work proposes new arithmetic circuits (adders and multipliers) that consume substantially less power at the cost of computation errors, these approximate circuits decrease the end-to-end accuracy of common models. We present AutoApprox, a framework to automatically generate approximate low-power deep learning accelerators without any accuracy loss. AutoApprox generates a wide range of approximate ASIC accelerators with a TPUv3 systolic-array template. AutoApprox uses a learned router to assign each DNN layer to an approximate systolic array from a bank of arrays with varying approximation levels. By tailoring this routing for a specific neural network architecture, we discover circuit designs without the accuracy penalty from prior methods. Moreover, AutoApprox optimizes for the end-to-end performance, power and area of the the whole chip and PE mapping rather than simply measuring the performance of the arithmetic units in iso-lation. To our knowledge, our work is the first to demonstrate the effectiveness of custom-tailored approximate circuits in delivering significant chip-level energy savings with zero accuracy loss on a large-scale dataset such as ImageNet. AutoApprox synthesizes a novel approximate accelerator based on the TPU that reduces end-to-end power consumption by 3.2% and area by 5.2% at a sub-10nm process with no degradation in ImageNet validation top-1 and top-5 accuracy.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"220 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127326252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PiMulator: a Fast and Flexible Processing-in-Memory Emulation Platform 一个快速灵活的内存处理仿真平台
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774614
Sergiu Mosanu, M. N. Sakib, Tommy Tracy, Ersin Cukurtas, Alif Ahmed, Preslav Ivanov, S. Khan, K. Skadron, M. Stan
{"title":"PiMulator: a Fast and Flexible Processing-in-Memory Emulation Platform","authors":"Sergiu Mosanu, M. N. Sakib, Tommy Tracy, Ersin Cukurtas, Alif Ahmed, Preslav Ivanov, S. Khan, K. Skadron, M. Stan","doi":"10.23919/DATE54114.2022.9774614","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774614","url":null,"abstract":"Motivated by the memory wall problem, researchers propose many new Processing-in-Memory (PiM) architectures to bring computation closer to data. However, evaluating the performance of these emerging architectures involves using a myriad of tools, including circuit simulators, behavioral RTL or software simulation models, hardware approximations, etc. It is challenging to mimic both software and hardware aspects of a PiM architecture using the currently available tools with high performance and fidelity. Until and unless actual products that include PiM become available, the next best thing is to emulate various hardware PiM solutions on FPGA fabric and boards. This paper presents a modular, parameterizable, FPGA synthesizable soft PiM model suitable for prototyping and rapid evaluation of Processing-in-Memory architectures. The PiM model is implemented in System Verilog and allows users to generate any desired memory configuration on the FPGA fabric with complete control over the structure and distribution of the PiM logic units. Moreover, the model is compatible with the LiteX framework, which provides a high degree of usability and compatibility with the FPGA and RISC-V ecosystem. Thus, the framework enables architects to easily prototype, emulate and evaluate a wide range of emerging PiM architectures and designs. We demonstrate strategies to model several pioneering bitwise-PiM architectures and provide detailed benchmark performance results that demonstrate the platform's ability to facilitate design space exploration. We observe an emulation vs. simulation weighted-average speedup of 28× when running a memory benchmark workload. The model can utilize 100% BRAM and only 1% FF and LUT of an Alveo U280 FPGA board. The project is entirely open-source.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130144709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Twine: A Chisel Extension for Component-Level Heterogeneous Design Twine:组件级异构设计的扩展
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2022-03-14 DOI: 10.23919/DATE54114.2022.9774555
Shibo Chen, Yonathan Fisseha, Jean-Baptiste Jeannin, T. Austin
{"title":"Twine: A Chisel Extension for Component-Level Heterogeneous Design","authors":"Shibo Chen, Yonathan Fisseha, Jean-Baptiste Jeannin, T. Austin","doi":"10.23919/DATE54114.2022.9774555","DOIUrl":"https://doi.org/10.23919/DATE54114.2022.9774555","url":null,"abstract":"Algorithm-oriented heterogeneous hardware design has been one of the major driving forces for hardware improvement in the post-Moore's Law era. To achieve the swift development of heterogeneous designs, designers reuse existing hardware components to craft their systems. However, current hardware design languages either require tremendous efforts to customize designs, or sacrifice quality for simplicity. Chisel, while attracting more users for its capability to easily recon-figure designs, lacks a few key features to further expedite the heterogeneous design flow. In this paper, we introduce Twine-a Chisel extension that provides high-level semantics to efficiently generate heterogeneous designs. Twine standardizes the interface for better reusability and supports control-free specification with flexible data type conversion, which saves designers from the busy-work of interconnecting modules. Our results show that Twine provides a smooth on-boarding experience for hardware designers, considerably improves reusability, and reduces design complexity for heterogeneous designs while maintaining high design quality.","PeriodicalId":232583,"journal":{"name":"2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128905221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信