不同s盒屏蔽保护方案的泄漏功率分析

Javad Bahrami, Mohammad Ebrahimabadi, J. Danger, S. Guilley, Naghmeh Karimi
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引用次数: 6

摘要

物联网(IoT)设备是侧信道攻击的天然目标。尽管如此,侧通道泄漏可能是复杂的:它的建模可以借助于统计工具。将泄漏投影到标准正交基中可以理解其结构,通常是线性的(一阶泄漏)或非线性的(有时称为小故障)。为了确保密码系统的保护,已经发布了几种屏蔽方法。不幸的是,他们遵循不同的策略;因此很难对它们进行比较。即,ISW是建设性的,GLUT是系统性的,RSM是GLUT的低熵版本,RSM- rom是进一步优化,旨在进一步平衡泄漏,TI旨在通过设计避免故障引起的泄漏。在实践中,没有研究在平等的基础上比较这些风格。因此,在本文中,我们在这方面提出了一种依赖于Walsh-Hadamard变换的一致方法。由于PRESENT算法的替换盒函数是对称密码学中最容易泄漏的函数,我们考虑了不同的掩码实现。我们证明了ISW在考虑的屏蔽实现中是最安全的。当然,它充分利用了PRESENT代换框方程的知识。与未受保护的对应方案相比,列表屏蔽方案提供的安全性较低。随着时间的推移评估泄漏,即考虑器件老化,这有助于根据屏蔽风格不同地减轻泄漏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Leakage Power Analysis in Different S-Box Masking Protection Schemes
Internet-of- Things (IoT) devices are natural targets for side-channel attacks. Still, side-channel leakage can be com-plex: its modeling can be assisted by statistical tools. Projection of the leakage into an orthonormal basis allows to understand its structure, typically linear (1st-order leakage) or non-linear (sometimes referred to as glitches). In order to ensure cryptosystems protection, several masking methods have been published. Unfortunately, they follow different strategies; thus it is hard to compare them. Namely, ISW is constructive, GLUT is systematic, RSM is a low-entropy version of GLUT, RSM-ROM is a further optimization aiming at balancing the leakage further, and TI aims at avoiding, by design, the leakage arising from the glitches. In practice, no study has compared these styles on an equal basis. Accordingly, in this paper, we present a consistent methodology relying on a Walsh-Hadamard transform in this respect. We consider different masked implementations of substitution boxes of PRESENT algorithm, as this function is the most leaking in symmetric cryptography. We show that ISW is the most secure among the considered masking implementations. For sure, it takes strong advantage of the knowledge of the PRESENT substitution box equation. Tabulated masking schemes appear as providing a lesser amount of security compared to unprotected counterparts. The leakage is assessed over time, i.e., considering device aging which contributes to mitigate the leakage differently according to the masking style.
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