Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献_第8页

Development of autonomous mobile robot for obstacles avoidance 自主移动避障机器人的研制

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352096

M. Uchida, S. Yokoyama, H. Ide

引用次数: 1

High frequency electronic component measuring system 高频电子元件测量系统

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352184

S. Koike, S. Nonaka

引用次数: 0

An abnormal phenomenon due to substrate bias modulation in the integrated PIN photodiode sensor with dielectric isolation 介电隔离集成PIN光电二极管传感器中由于衬底偏置调制引起的异常现象

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352083

M. Kyomasu, T. Suzuki, K. Okajima, M. Sahara

{"title":"An abnormal phenomenon due to substrate bias modulation in the integrated PIN photodiode sensor with dielectric isolation","authors":"M. Kyomasu, T. Suzuki, K. Okajima, M. Sahara","doi":"10.1109/IMTC.1994.352083","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352083","url":null,"abstract":"An abnormal phenomenon was found in the integrated PIN photodiode sensors (which is named PIN Photo Integrated Circuits Sensor: PIN-PICS) combined with a bipolar IC in the same substrate. It was observed in the optical device called \"2 electric wires type photoelectric sensor\". It occurs at the time to drive the external LED by internal timing generator. This phenomenon was investigated by three methods, that is, the failure analysis the measurement of device parameters and both circuit and device simulations. These results show that the problem was induced from the PIN structure forming PIN-PICS. When the switching noise was altered, the most of this noise was transferred to preamplifier through parasitic capacitance of the PIN photodiode connected with a P/sup +/tab across a P-layer, and it distorted the output waveform of preamplifier by differential components. Therefore, in order to prevent this phenomenon, it's necessary to exchange the connection of parasitic capacitance from P/sup +/tab to substrate. We confirmed that an Au back metallization of 3000 /spl Aring/ thickness, or Au-Si alloy die bonding is the most effective.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114878760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Measurement of combustion-chamber volume using an acoustic resonance technique 用声学共振技术测量燃烧室容积

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352029

M. Imanishi, A. Nagashima, A. Moriyama, Y. Ishii

引用次数: 7

Object-oriented synergetic expert system for fault diagnosis 面向对象的协同故障诊断专家系统

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352040

Changshen Xu, Sixing Liu, Zhaoying Zhou, Yaoqing Zhang

引用次数: 2

SAW pressure sensors SAW压力传感器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351789

I.B. Yarovkin, Yu.N. Vlassov, A. Kozlov, N.S. Pashchin

{"title":"SAW pressure sensors","authors":"I.B. Yarovkin, Yu.N. Vlassov, A. Kozlov, N.S. Pashchin","doi":"10.1109/IMTC.1994.351789","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351789","url":null,"abstract":"The design and performance of two types of SAW pressure sensors have been considered. SAW resonator oscillators with metal strip gratings designed for operation at 200 and 360 MHz have been used in both type devices to study the opportunity of the mechanical pressure measurement became of mechanical loading on Rayleigh surface wave propagation. Such electrical characteristics of SAW resonator as amplitude and phase response are discussed, as well as a geometrical dimensions of the sensitive element and a disposition of SAW structures on it. The sensitivity and the non linearity of both sensors with a sensitive element shaped as an integral crystal diaphragm and sensor with mechanically loaded quartz plates measured and discussed too. Experimental data clearly show that sensitivity and threshold are not independent parameters for this kind of pressure sensor. We studied the opportunity to optimize this parameters for a given pressure range. Finally, recommendations are made for optimal configuration of SAW pressure sensor according to pressure and dynamic range demands. These results are important for the design of SAW pressure sensors intended for operation in gaseous or liquid media.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115323416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Software random pulser for use in a laboratory 实验室用随机脉冲发生器软件

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351861

R. Igarashi, H. Funaki, T. Yukawa, Y. Iwaya, M. Sakata

引用次数: 0

The design of the general function generator module based on VXIbus 基于vxi总线的通用函数生成器模块的设计

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352125

Zhang Zhongting, Guo Shize, Jin Xin

引用次数: 2

A method for identifying individuals using angled facial data obtained by bright-spots matrix projection 一种利用亮点矩阵投影获得的角度面部数据识别个体的方法

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351874

K. Terada, J. Yamaguchi, M. Nakajima

{"title":"A method for identifying individuals using angled facial data obtained by bright-spots matrix projection","authors":"K. Terada, J. Yamaguchi, M. Nakajima","doi":"10.1109/IMTC.1994.351874","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351874","url":null,"abstract":"We have already proposed a method for identifying human faces using the three dimensional facial data obtained by setting the fiber grating vision sensor in front of the faces. But in the previous method, there are some problems that these facial data include redundant information because of the bilateral symmetry of the human faces, and in some case, the data behind the nose can't be obtained. In this paper, the authors describe a method for identifying individuals using the angled facial data obtained from the fiber grating vision sensor. We think that we can obtain the more effective data for identifying the faces by setting the fiber grating vision sensor at an angle to the faces. Because we can obtain the effective information from the large region of one side of the faces when we set the sensor like this. In this method, the fiber grating vision sensor which has been developed by the authors, is employed for the three dimensional shape of the faces. Before identifying the facial data, it is necessary to calibrate the position and direction of the facial data. In this method, a set of the directions of normal vectors at data points on the facial surface is obtained, and calibrations are carried out in accordance with the extend of errors in the sets. To identify the human faces, a multi-layered neural network is used in which the inputs are two component values of normal vector on the facial surface. The experiments using the experimental system are performed to demonstrate the efficacy of this method and the experimental results are shown.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124870552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Oversampled interface for IC sensors IC传感器过采样接口

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352014

C. Azeredo Leme, P. Malcovati, H. Baltes

引用次数: 14