Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献_第10页

Hybrid FES orthosis for standing up in paraplegia 用于截瘫站立的混合FES矫形器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351894

C. Komiyama, E. Saito, Y. Tomita, S. Honda

{"title":"Hybrid FES orthosis for standing up in paraplegia","authors":"C. Komiyama, E. Saito, Y. Tomita, S. Honda","doi":"10.1109/IMTC.1994.351894","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351894","url":null,"abstract":"Functional Electrical Stimulation (FES) is one of the methods to activate paralyzed muscles for the restoration of functional movements in the patients of spinal cord or central nervous system injury. In the clinical application of FES, the convenience is important as well as safety. Hence, this work combines walker support and orthosis of lower limbs with FES, which is called a hybrid FES. It requires less power of stimulation and it is simple to put pn electrodes comparing with the stand alone FES system. The stimulator applies the constant current stimulus of which rectangular monophasic pulse train is amplitude-modulated. The stimulation is derived through surface electrodes to quadriceps femoris and gluteus maximus muscles. The control strategy is open-loop, based on the stimulus pattern of standing up motion in nonparalyzed persons, whose electromyogram (EMG) is recorded at standing up motion. The envelope of the amplitude of the surface EMG corresponds to the amplitude of the stimulus current. We set the standard stimulus pattern to the maximal pulse height for each paralyzed person and then made their own stimulus pattern of a specified paralyzed persons.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122285354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Instantaneous S parameters measurements of MESFETs under burst bias conditions 脉冲偏置条件下mesfet的瞬时S参数测量

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351974

M. Begin, F. Ghannouchi, L. Selmi, B. Riccò

引用次数: 0

Correction method for a single chip power meter 一种单片功率计的校正方法

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351815

H. Nagura, K. Fujino

{"title":"Correction method for a single chip power meter","authors":"H. Nagura, K. Fujino","doi":"10.1109/IMTC.1994.351815","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351815","url":null,"abstract":"The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from /spl plusmn/0.17%FS to /spl plusmn/0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from /spl plusmn/3%FS to /spl plusmn/0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116521798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Simultaneous measuring the resistivity and permeability of a film sample with double coils 用双线圈同时测量薄膜样品的电阻率和磁导率

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351845

Y. Nonaka, H. Nakane, T. Maeda, K. Hasuike

引用次数: 2

Multiple-driver glitch in digital busses 数字总线中的多驱动器故障

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352031

J. Donohue, I. Novak

引用次数: 0

Development of pulsed L-band ESR spectrometer 脉冲l波段ESR光谱仪的研制

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351930

M. Ono, K. Ito, E. Yoshida, S. Sekimukai, H. Kamada

引用次数: 0

Application generators speed up development of acquisition/analysis/control systems 应用程序生成器加速了采集/分析/控制系统的开发

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352182

S. Usui

{"title":"Application generators speed up development of acquisition/analysis/control systems","authors":"S. Usui","doi":"10.1109/IMTC.1994.352182","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352182","url":null,"abstract":"It is very easy to create your own sophisticated custom Data Acquisition, Analysis and Control Applications using Visual Designer, an application generator software which greatly enhances your productivity by allowing you to create these applications without writing programs. Developed by Intelligent Instrumentation Lnc. in Tucson, Arizona, LISA, a Burr-Brown Company, Visual Designer runs on any ISA/EISA machines under Windows 3. 1 ( DOS/V machines under Windows 3.15 now in Japan). You develop your application software in an integrated development environment, called Diagram, by drawing a block diagram, called FlowGram. The Diagram compiles this into an executable application file, called FlowCode and parameter file. The application FlowCode is then executed from Visual Designer's Run environment. The Run environment can be invoked directly from the Diagram, or it can be done as a stand-alone application. Thus you have your own Windows Application in a drastically short time. Visual Designer has been used in hundreds of applications around the world since its release in November of 1993. It has shortened the development time required for these applications to a fraction of time required by programming languages, either graphical or textual.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126603504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Estimation of heat sources and temperature distribution by boundary integral method 用边界积分法估计热源和温度分布

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352078

S. Inoue, M. Ohmichi, T. Hashimoto

引用次数: 0

A novel equivalent sampling method using in the digital storage oscilloscopes 一种用于数字存储示波器的等效采样方法

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351901

Guo Shize, Sun Shenghe, Zhang Zhongting

引用次数: 15

Pneumatic telecommunication conduit inspection system 气动通信管道检测系统

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352020

T. Tsujimura, T. Yabuta

引用次数: 0