发布求助
文献互助 智能选刊 最新文献

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献

筛选
英文 中文
Simultaneous measurement of temperature and absorption of distributed medium by using infrared emission CT 利用红外发射CT同时测量分布介质的温度和吸收率
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352079
T. Itō, S. Fujimura
{"title":"Simultaneous measurement of temperature and absorption of distributed medium by using infrared emission CT","authors":"T. Itō, S. Fujimura","doi":"10.1109/IMTC.1994.352079","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352079","url":null,"abstract":"We have developed a method for measurement of temperature and absorption of medium distributed in the three dimensional space. To get accurate temperature distribution of the medium, the absorption of the medium must be known. We achieve this by obtaining the projections of thermal radiation from the medium and an external radiator whose temperature is switched from one to another while obtaining projections. We can reconstruct the distributions from the projections by using an emission CT algorithm. We made an experiment to measure temperature and absorption distribution of flame of a Bunsen burner. The results agreed well with the real temperature profile of the cross section of the flame.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124465560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Low noise multirate SC read-out circuitry for thermoelectric integrated infrared sensors 用于热电集成红外传感器的低噪声多速率SC读出电路
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352011
P. Malcovati, C. Leme, R. Lenggenhager, F. Maloberti, H. Baltes
{"title":"Low noise multirate SC read-out circuitry for thermoelectric integrated infrared sensors","authors":"P. Malcovati, C. Leme, R. Lenggenhager, F. Maloberti, H. Baltes","doi":"10.1109/IMTC.1994.352011","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352011","url":null,"abstract":"In this paper we present a switched capacitor multirate read-out circuit for thermoelectric infrared sensors integrated on chip. The target application is a passive intrusion detector. The signal generated by the sensor in this particular application is quite small (few tens of /spl mu/V) and has a narrow bandwidth (0.1+10 Hz). It must be amplified (keeping the noise level as low as possible) and band pass filtered. An auto-zeroed low-noise transconductance stage transforms the sensor output voltage in a current, which is applied to a multirate switched capacitor integrator, performing the signal processing. A prototype was integrated in a 1.2 /spl mu/m CMOS technology. Simulation and experimental results are reported.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117273001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Fault location on optical amplifier submarine systems 光放大器潜艇系统故障定位
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352114
M. Sumida, T. Imai, S. Furukawa
{"title":"Fault location on optical amplifier submarine systems","authors":"M. Sumida, T. Imai, S. Furukawa","doi":"10.1109/IMTC.1994.352114","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352114","url":null,"abstract":"This paper identifies the problems that arise when optical time domain reflectometry (OTDR) is applied to optical amplifiers systems. It formulates the performance impairment induced by these problems in terms of single way dynamic range (SWDR). A new modulation format is proposed to improve SWDR. Experiments successfully demonstrate that the proposed format achieves a 6 dB improvement and confirm that this format is effective in OTDR applications into amplifier systems.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127129324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The on-field application of a measurement test set for the characterization of electrical drives for linear motion 测量测试装置的现场应用，用于表征线性运动的电驱动
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352027
G. Bucci, C. Landi, S. Nuccio, G. R. Galluzzo
{"title":"The on-field application of a measurement test set for the characterization of electrical drives for linear motion","authors":"G. Bucci, C. Landi, S. Nuccio, G. R. Galluzzo","doi":"10.1109/IMTC.1994.352027","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352027","url":null,"abstract":"In this paper an automatic test set, which allows linear induction motors (LIM) to be characterized, is proposed. It allows one to measure the main electrical and mechanical quantities and also some not directly accessible quantities, such as air-gap flux density, thrust and current density in the secondary sheet. The work is completed with experimental results connected to the use of the proposed measurement system on a double-sided LIM prototype.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124898224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
A microprocessor controlled microwave ranging system for high accuracy industrial applications 微处理器控制的高精度工业微波测距系统
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351824
D.L. Maskell, G. Woods, J. Murray
{"title":"A microprocessor controlled microwave ranging system for high accuracy industrial applications","authors":"D.L. Maskell, G. Woods, J. Murray","doi":"10.1109/IMTC.1994.351824","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351824","url":null,"abstract":"A microwave ranging system which employs a composite FMCW/CW measurement technique is described. An FMCW radar is used to find the approximate range of the target. The FMCW radar returns are processed in the spatial domain using the Fast Fourier Transform (FFT). In order to provide higher resolution, without an excessive increase in processing time, a modified \"picket fence\" algorithm is employed. A comparison of experimental results obtained from alternative resolution enhancement techniques is also included. A precision CW distance measurement is able to be resolved on the basis of the FMCW result to provide an accurate sub-millimetre range solution. A microcontroller based X-band prototype system suitable for industrial applications is described.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"330 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125059116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A virtual instrument for the determination of the electric power quality 一种用于测定电能质量的虚拟仪器
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351816
L. Cristaldi, A. Ferrero
{"title":"A virtual instrument for the determination of the electric power quality","authors":"L. Cristaldi, A. Ferrero","doi":"10.1109/IMTC.1994.351816","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351816","url":null,"abstract":"The number and power of loads that pollute, from an electric point of view, the electric network (non-linear, time-variant loads, ...) is constantly increasing. Their connection to the electric network causes a significant distortion in the line current and, when their overall power is no longer negligible with respect to the network power, also some distortion in the line voltage, thus deteriorating the electric supply quality. The availability of accurate instruments able to detect the presence of a polluting load and to quantify the resulting deterioration of the supply quality is hence an important and critical point for the correct operation of the electric power system. The paper proposes a method, based on the evaluation of the harmonic powers, to identify whether the source producing distortion in the line currents and voltages of a three-phase system is the presence of a polluting load after the metering section or is the distortion of the line voltages. Some parameters are also defined in order to quantify the effects of the polluting load on the power quality. A Virtual Instrument is also described, realized to implement the proposed method and to verify it experimentally. The instrument accuracy is discussed.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126132754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
SDH equipment testing: an Italian experience towards standard test specifications SDH设备测试:意大利标准测试规范的经验
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352018
S. Bregni, M. D'Agrosa, L. Valtriani
{"title":"SDH equipment testing: an Italian experience towards standard test specifications","authors":"S. Bregni, M. D'Agrosa, L. Valtriani","doi":"10.1109/IMTC.1994.352018","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352018","url":null,"abstract":"Managing world spreading of Synchronous Digital Hierarchy technology, nowadays and even more in the future, implies having extensive standard test procedures. SIRTI, on behalf of the Italian long distance operator IRITEL, tested STM-1 Add Drop Multiplexers and STM-16 Line Terminals provided by four different suppliers. The field-trial covered detailed testing of equipment. This paper details the test procedure we accomplished in order to fully check the functions of a single equipment. The most significant measurement set-ups are outlined, and some of the most interesting results are also shown. The test set herein presented is an attempt to build a first core of measures towards the future indispensable developing of standard test specifications.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"22 17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123423131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A neural network-based approach for fault diagnosis in non-linear analog systems 基于神经网络的非线性模拟系统故障诊断方法
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352093
G. Iuculano, M. Catelani, M. Gori, S. Bagnoli, D. Billi
{"title":"A neural network-based approach for fault diagnosis in non-linear analog systems","authors":"G. Iuculano, M. Catelani, M. Gori, S. Bagnoli, D. Billi","doi":"10.1109/IMTC.1994.352093","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352093","url":null,"abstract":"A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A multi-layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT).<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125688546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Efficient four-standard calibration procedure for six-port reflectometers 有效的四标准校准程序的六端口反射计
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351938
L. Qiao, S. Yeo
{"title":"Efficient four-standard calibration procedure for six-port reflectometers","authors":"L. Qiao, S. Yeo","doi":"10.1109/IMTC.1994.351938","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351938","url":null,"abstract":"A more efficient implementation of an earlier four-standard calibration procedure for six-port reflectometers (utilizing simple iteration computations instead of other more cumbersome optimization techniques) is presented. Test results show that the calibration software that has been developed is capable of yielding reasonably good accuracies even in the presence of measurement noise.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116439513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A simple dual-tone calibration of diode detectors 一个简单的双音校准二极管探测器
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352074
J. Li, R. Bosisio, K. Wu
{"title":"A simple dual-tone calibration of diode detectors","authors":"J. Li, R. Bosisio, K. Wu","doi":"10.1109/IMTC.1994.352074","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352074","url":null,"abstract":"A new dual-tone method to linearize diode detectors is proposed, in which two closely spaced CW carriers with equal amplitudes are fed into the diode detector to be calibrated. It is found that the output waveform of the detector is a distorted sinusoidal wave of the frequency difference between the two carriers. The deviation from the square-law response can be found from the distorted signal which is attributed to the detector through a simple iterative calculation. Measurement performed at 40 GHz has shown an error within 0.2 dB over a 40 dB dynamic range.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122286794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信