基于神经网络的非线性模拟系统故障诊断方法

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI:10.1109/IMTC.1994.352093

G. Iuculano, M. Catelani, M. Gori, S. Bagnoli, D. Billi

{"title":"基于神经网络的非线性模拟系统故障诊断方法","authors":"G. Iuculano, M. Catelani, M. Gori, S. Bagnoli, D. Billi","doi":"10.1109/IMTC.1994.352093","DOIUrl":null,"url":null,"abstract":"A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A multi-layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT).<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A neural network-based approach for fault diagnosis in non-linear analog systems\",\"authors\":\"G. Iuculano, M. Catelani, M. Gori, S. Bagnoli, D. Billi\",\"doi\":\"10.1109/IMTC.1994.352093\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A multi-layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT).<<ETX>>\",\"PeriodicalId\":231484,\"journal\":{\"name\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"volume\":\"113 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1994.352093\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.352093","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

提出了一种新的非线性模拟系统故障诊断方法。该方法基于神经网络插值器在频域构造故障字典。为了定位和识别被测系统(System Under Test, SUT)中最有可能出现故障的元素，选择了带有一个隐藏层的多层体系结构。

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A neural network-based approach for fault diagnosis in non-linear analog systems

A new interesting technique for fault diagnosis in non-linear analog systems is presented. The approach is based on a neural network interpolator for the construction of a fault dictionary in the frequency domain. A multi-layered architecture with one hidden layer is chosen in order to locate and to identify the most likely faulty element of the System Under Test (SUT).<>

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Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)

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