Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)最新文献_第3页

A fully differential, vertically structured and compensated subranging A/D-converter 一种全差分、垂直结构和补偿的分差A/ d转换器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351966

P. Low

引用次数: 0

Electric load monitoring and control in the domestic environment 家庭环境用电负荷监测与控制

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351898

G. Hancke, D. Vrey

引用次数: 9

Two-way optical fiber wideband FM signal transmission using LEDs 双向光纤宽带调频信号传输采用led

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351867

N. Abd Rabou, H. Ikeda, H. Yoshida, S. Shinohara

引用次数: 2

How the electro-optic probing system can contribute to LSI testing? 电光探测系统如何有助于大规模集成电路测试?

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352177

H. Takahashi, S. Aoshima, Y. Tsuchiya

引用次数: 3

Optical fiber strain distribution measurement by a Brillouin frequency shift technique 用布里渊频移技术测量光纤应变分布

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352180

Li-Zhi-Xien, N. Takeuchi

{"title":"Optical fiber strain distribution measurement by a Brillouin frequency shift technique","authors":"Li-Zhi-Xien, N. Takeuchi","doi":"10.1109/IMTC.1994.352180","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352180","url":null,"abstract":"Brillouin scattering in optical fibers is a nonlinear phenomenon in which monochromatic light undergoes a shift by the frequency characteristic of the medium and is scattered as a result of interaction with a acoustic wave in the optical fiber. This frequency shift is referred to as the Brillouin frequency shift. The Brillouin frequency shift is proportional to the speed of the acoustic wave in the optical fiber. which depends largely on the stress applied to the optical fiber, so that it is highly dependent on the tensile strain induced in the optical fiber. The basic configuration of the measurement system is shown. In this measurement system, which is based upon an end-to-end lightwave measurement technique, the change in probe light waveform with time is continuously measured while varying the relative pump light-probe light frequency difference, and the relative frequency difference. The present measurement system has enabled measurement of optical fiber strains in the longitudinal direction, the time for measurement being successfully reduced to within one minute. This measurement system, which permits real-time strain measurement, promises to find a widespread range of applications in various fields.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115784609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

A new efficient method for analog circuit testability measurement 一种新的有效的模拟电路可测试性测量方法

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.352094

A. Liberatore, S. Manetti, M. Piccirilli

{"title":"A new efficient method for analog circuit testability measurement","authors":"A. Liberatore, S. Manetti, M. Piccirilli","doi":"10.1109/IMTC.1994.352094","DOIUrl":"https://doi.org/10.1109/IMTC.1994.352094","url":null,"abstract":"Testing an electronic circuit is a vital part of its overall design and fabrication process. This problem is even going to be more critical with technology improvements and with the coexistence on a chip of analog and digital components. In fact the testing of mixed signal microsystems is very difficult compared to digital only devices. They do not lend themselves to earlier and simpler test routines. The entire mixed signal segment is hampered by the lack of design for testability methodologies and tools. In this field the concept of analog circuit testability is of fundamental importance. The aim of this work is to present a new symbolic approach for testability measurement of analog networks. The new method presents noteworthy advantages from a computational point of view with respect to previous techniques. In fact it does not require the computation of the sensitivities of the network functions but it is based only on the study of the network function symbolic coefficients. The new approach allows also the formulation of simple necessary conditions for maximum testability based only on the order of the network functions.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132028648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 39

CMOS integrated magnetic field source used as a reference in magnetic field sensors on common substrate CMOS集成磁场源作为基准，应用于常用基板上的磁场传感器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351921

J. Trontelj, L. Trontelj, R. Opara, A. Pletersek

引用次数: 9

A fully passive echo-canceler using a single microphone 使用单个麦克风的全被动回声消除器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351841

T. Tazawa, T. Hatashima, N. Ohnishi, N. Sugei

{"title":"A fully passive echo-canceler using a single microphone","authors":"T. Tazawa, T. Hatashima, N. Ohnishi, N. Sugei","doi":"10.1109/IMTC.1994.351841","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351841","url":null,"abstract":"There are many studies on removal or suppression of reverberation. Among them, the approach, in which the impulse-response in a room is measured beforehand, has obtained very satisfactory results. An impulse-response is, however, not invariant, and changes with time depending on the room temperature and humidity, and the relative location between a sound source and a set of microphones. It is troublesome to measure an impulse response exactly each time. So, we have tried to cancel echoes using only one acoustic signal with echoes, obtained through a single microphone. In order to cancel echoes, we have to determine both delay times and amplitude ratios between direct sound and each of reflected sounds. Delay times are obtained as peaks of cepstrum of acoustic signal. Each amplitude ratio is iteratively searched so that resultant recovered sound may have the shortest duration. In the case that there are a few reflected signals, the result of experiment with reverberated signal synthesized using CD sound shows good recovery of an original sound.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130237380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Variable light attenuator of improved air-gap type with extremely low returning light 具有极低回光的改进气隙型可变光衰减器

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351949

M. Takahashi

引用次数: 3

The ultrasonic NDT of adherent area between metal and nonmetal surfaces and the prediction of its destruction strength 金属与非金属表面附着区域的超声无损检测及其破坏强度预测

Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9) Pub Date : 1994-05-10 DOI: 10.1109/IMTC.1994.351793

Hongnian Lu, Yan Han, S. Song

{"title":"The ultrasonic NDT of adherent area between metal and nonmetal surfaces and the prediction of its destruction strength","authors":"Hongnian Lu, Yan Han, S. Song","doi":"10.1109/IMTC.1994.351793","DOIUrl":"https://doi.org/10.1109/IMTC.1994.351793","url":null,"abstract":"A new approach so-called multi-reflection scanning method by transverse ultrasonic wave is described for the NDT of adherent between metal and nonmetal surfaces. According to the adherent state, the destruction strength can be predicted by Bayesian inference. A skew probe scanning on the metal side is used to transform the longitudinal wave, dispatched by a PZT transducer, after entering the metal layer into transversal. Then the latter propagates in a zigzag path along the adhesive layer. The reflected wave strength are detected and integrated with respect to time. The relation between the adherent area along the scanned path and the time integral of reflected wave strength is found. The prediction model by Bayesian inference has been studied. As the adhesive process is fixed, the relation between the destruction strength of a part versus the measured adherent area proportion and their distribution can be established. Practice shows that, even the rate of spoilage as high as 60%, the software can strictly reject the spoils and maintain the probability of false rejection not exceed 7%.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134320274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0