ADVANCES IN APPLIED PHYSICS最新文献

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The analysis of the errors of the dynamic interferometry method in the control of local surface inhomogeneities of the nanometer level of the profiles of optical parts 分析了动态干涉法在光学零件纳米级轮廓局部表面不均匀性控制中的误差
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-11 DOI: 10.51368/2307-4469-2022-10-1-71-89
D. Denisov, M. Ustyugova, V. Frolova, Denis Mashoshin, Ismail Gafarov
{"title":"The analysis of the errors of the dynamic interferometry method \u0000in the control of local surface inhomogeneities of the nanometer level of the profiles of optical parts","authors":"D. Denisov, M. Ustyugova, V. Frolova, Denis Mashoshin, Ismail Gafarov","doi":"10.51368/2307-4469-2022-10-1-71-89","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-71-89","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129732752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influence of flash ignition mechanism of high-current pulsed xenon discharge on the optical degradation of the quartz shell in the UV region of the spectrum 大电流脉冲氙气放电的闪燃机理对石英壳紫外区光学降解的影响
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-11 DOI: 10.51368/2307-4469-2022-10-1-90-96
S. Kireev, S. Gavrish, S. Shashkovskiy
{"title":"Influence of flash ignition mechanism of high-current pulsed xenon discharge on the optical degradation of the quartz shell in the UV region of the spectrum","authors":"S. Kireev, S. Gavrish, S. Shashkovskiy","doi":"10.51368/2307-4469-2022-10-1-90-96","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-90-96","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121581703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of the test results of visualization means of various spectrum ranges for the detection of a fire source and a person in the fire training complex PTS «Ugolyok» 分析各种光谱范围的可视化手段的测试结果,用于检测火源和消防训练综合体PTS«Ugolyok»中的人员
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-11 DOI: 10.51368/2307-4469-2022-10-1-63-70
M. Aleshkov, S. Popov, N. Topolskiy, A. Mokshantsev, Kiril Mikhaylov, D. Afanasov, K. Samsonov, K. Khamidullin, L. Iftodi
{"title":"Analysis of the test results of visualization means of various spectrum ranges for the detection of a fire source and a person in the fire training complex PTS «Ugolyok»","authors":"M. Aleshkov, S. Popov, N. Topolskiy, A. Mokshantsev, Kiril Mikhaylov, D. Afanasov, K. Samsonov, K. Khamidullin, L. Iftodi","doi":"10.51368/2307-4469-2022-10-1-63-70","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-63-70","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126939784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Infrared reflectography of artworks with SWIR camera at wavelengths of 0.9–1.7 um 用SWIR相机对艺术品进行波长为0.9-1.7 um的红外反射
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-10 DOI: 10.51368/2307-4469-2022-10-1-23-33
V. Popov, D. Pershin, P. Khrabrov, E. Morozova, Vladimir Ponomarenko
{"title":"Infrared reflectography of artworks with SWIR camera at wavelengths of 0.9–1.7 um","authors":"V. Popov, D. Pershin, P. Khrabrov, E. Morozova, Vladimir Ponomarenko","doi":"10.51368/2307-4469-2022-10-1-23-33","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-23-33","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"272 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115963490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multilayer interference coatings on the basis of the layers of silicon and dioxide of silicon on the thinning InSb FPA with increased mechanical strength and reproducibility 多层干涉涂层在硅层和二氧化硅层的基础上减薄了InSb FPA,提高了机械强度和再现性
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-10 DOI: 10.51368/2307-4469-2022-10-1-14-22
Alekcey Lopukhin, K. Boltar, A. Grishina, S. Shishigin
{"title":"Multilayer interference coatings on the basis of the layers of silicon and dioxide of silicon on the thinning InSb FPA with increased mechanical strength and reproducibility","authors":"Alekcey Lopukhin, K. Boltar, A. Grishina, S. Shishigin","doi":"10.51368/2307-4469-2022-10-1-14-22","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-14-22","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"29 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129534232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The recent progress of the semiconductor silicon technology (a review) 半导体硅技术的最新进展(综述)
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-10 DOI: 10.51368/2307-4469-2022-10-1-34-52
A. Naumov, D. Orekhov, N. Kulchitsky
{"title":"The recent progress of the semiconductor silicon technology \u0000(a review)","authors":"A. Naumov, D. Orekhov, N. Kulchitsky","doi":"10.51368/2307-4469-2022-10-1-34-52","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-34-52","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127750461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Photoluminescence of polymethyl methacrylate excited by a KrCl excilamp and a KrCl laser KrCl激光放大器和KrCl激光器激发的聚甲基丙烯酸甲酯的光致发光
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-10 DOI: 10.51368/2307-4469-2022-10-1-5-13
Alexander Burachenko, V. Tarasenko, D. Genin, Alekcey Puchikin
{"title":"Photoluminescence of polymethyl methacrylate excited by a KrCl excilamp and a KrCl laser","authors":"Alexander Burachenko, V. Tarasenko, D. Genin, Alekcey Puchikin","doi":"10.51368/2307-4469-2022-10-1-5-13","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-5-13","url":null,"abstract":",","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127810317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Specifics of measuring temperature-frequency characteristics of high-sensitive staring thermal imagers 高灵敏度凝视热成像仪测量温度-频率特性的细节
ADVANCES IN APPLIED PHYSICS Pub Date : 2022-03-10 DOI: 10.51368/2307-4469-2022-10-1-53-62
V. Ovsyannikov, Ya. V. Ovsyannikov
{"title":"Specifics of measuring temperature-frequency characteristics of high-sensitive staring thermal imagers","authors":"V. Ovsyannikov, Ya. V. Ovsyannikov","doi":"10.51368/2307-4469-2022-10-1-53-62","DOIUrl":"https://doi.org/10.51368/2307-4469-2022-10-1-53-62","url":null,"abstract":"","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122226210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mesa-structures and Focal Plane Arrays based on epitaxially grown InSb layers 基于外延生长InSb层的台面结构和焦平面阵列
ADVANCES IN APPLIED PHYSICS Pub Date : 2021-12-24 DOI: 10.51368/2307-4469-2021-9-6-513-522
K. Boltar, A. Lopuhin, P. Vlasov, N. Iakovleva
{"title":"Mesa-structures and Focal Plane Arrays based on epitaxially grown InSb layers","authors":"K. Boltar, A. Lopuhin, P. Vlasov, N. Iakovleva","doi":"10.51368/2307-4469-2021-9-6-513-522","DOIUrl":"https://doi.org/10.51368/2307-4469-2021-9-6-513-522","url":null,"abstract":"Aspects of epitaxially grown indium antimonide (InSb) on InSb substrates (InSb-on-InSb) by molecular beam epitaxy (MBE) for the 2D focal plane arrays fabrication process have been described. The epitaxial growth offers possibility for complex structure production, and then such structures suppose more effective control of the thermal generation charge carriers as the detector temperature is raised above 80 K. Investigations of mid-wave infrared (MWIR) 320256 FPAs with 30 μm pitch and 640512 FPAs with 15 μm pitch based on \u0000InSb-on-InSb layers have shown high performance: the average detectivity at T = 77 K more than 21011 cmW-1Hz1/2, the average value of noise equivalent temperature difference \u0000(NETD) with a cold aperture of 60o at T = 77K was in the range of 10–20 mK. High quality thermal imaging images were obtained in real time mode.","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121087470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ensuring uniform thickness of the conductive coating on the inner surface of the hemispherical resonator by magnetron sputtering 利用磁控溅射技术确保半球形谐振器内表面导电涂层厚度均匀
ADVANCES IN APPLIED PHYSICS Pub Date : 2021-12-24 DOI: 10.51368/2307-4469-2021-9-6-523-532
V. Kondratenko, G. Sagatelyan, A. Shishlov, Mikhail Bilinkin
{"title":"Ensuring uniform thickness of the conductive coating on the inner surface of the hemispherical resonator by magnetron sputtering","authors":"V. Kondratenko, G. Sagatelyan, A. Shishlov, Mikhail Bilinkin","doi":"10.51368/2307-4469-2021-9-6-523-532","DOIUrl":"https://doi.org/10.51368/2307-4469-2021-9-6-523-532","url":null,"abstract":"The possibilities of technological ensuring of the uniformity of thickness distribution of a thin-film metal coating produced by magnetron sputtering on the inner surface of a thinwalled silica resonator made in the shape of a hemisphere are considered. The possibility of minimizing the thickness of the coating by optimizing the diameter of the annular magnetron emission zone in combination with the distance from the resonator to the target made of sprayed material is shown. A further increase in the evenness of thickness of the coating \u0000is possible on the basis of the use of a fixed screen with a hole, the shape and location of which are calculated analytically, and the final configuration of the contour is specified empirically","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114754171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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