2010 12th Biennial Baltic Electronics Conference最新文献

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Catastrophic short and open fault detection in MOS current mode circuits: A case study MOS电流模式电路的突变短路和断路故障检测:一个案例研究
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5631512
A. Madian, H. Amer, A. Eldesouky
{"title":"Catastrophic short and open fault detection in MOS current mode circuits: A case study","authors":"A. Madian, H. Amer, A. Eldesouky","doi":"10.1109/BEC.2010.5631512","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631512","url":null,"abstract":"In this paper, the issue of testing analog MOS current mode circuits for catastrophic open and short faults has been addressed. A case study based on the 6-transistor transconductor circuit is discussed. The five-fault model is assumed per transistor, namely a short circuit between any two terminals as well as an open-circuited drain or source. DC testing is performed in order to reduce test cost instead of AC testing which requires expensive equipments. Only one fault is assumed to exist in the circuit under test. PSpice simulations have been carried out using the 0.18µm MOS model provided from MOSIS. The circuit has been simulated for fault-free condition and after injecting a single fault at a time into the circuit. The simulation results have been analyzed and compared. It is found that the total fault coverage is 93%.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133563484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
SVPWM method with the averaged pulse length versus conventional modulation method SVPWM方法与常规调制方法相比具有平均脉冲长度
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5630790
A. Baskys, V. Bleizgys, V. Gobis
{"title":"SVPWM method with the averaged pulse length versus conventional modulation method","authors":"A. Baskys, V. Bleizgys, V. Gobis","doi":"10.1109/BEC.2010.5630790","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630790","url":null,"abstract":"The efficiency of the AC induction motor used in the variable speed drive fed by the three-phase AC voltage formed using developed by authors Space Vector Pulse Width Modulation (SVPWM) method with the averaged pulse length has been investigated. The obtained results are compared with the results gained using a conventional SVPWM method. They show that the SVPWM method with the averaged pulse length provides higher motor efficiency as compared to the case when a conventional SVPWM method is employed.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131852867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Defect-oriented BIST quality analysis 缺陷导向的BIST质量分析
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5629724
H. Kruus, R. Ubar, J. Raik
{"title":"Defect-oriented BIST quality analysis","authors":"H. Kruus, R. Ubar, J. Raik","doi":"10.1109/BEC.2010.5629724","DOIUrl":"https://doi.org/10.1109/BEC.2010.5629724","url":null,"abstract":"In this paper, the efficiency of the built-in self-test pseudorandom patterns generated by an LFSR is investigated and compared for different fault classes. In particular, the need for defect-oriented testing is taken into account. Experimental research showed that the quality of BIST estimated using the SAF model can be too optimistic, and that extended fault classes for evaluation of BIST and determining the acceptable length of BIST sequences are needed.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133910191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Model-Driven development method of the virtual data warehouse 模型驱动的虚拟数据仓库开发方法
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5631007
Grzegorz Wierzowiecki, A. Wierzbicki
{"title":"Model-Driven development method of the virtual data warehouse","authors":"Grzegorz Wierzowiecki, A. Wierzbicki","doi":"10.1109/BEC.2010.5631007","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631007","url":null,"abstract":"The hypothesis of this work is that information systems development is possible with lower TCO (Total Cost of Ownership), if OLAP (On-Line Analytical Processing) data model is developed together with OLTP (On-Line Transaction Processing) data model and if those two models are in relation to each other. By using Model-Driven (MDA) development methods, that kind of combined model makes possible to deploy virtual data warehouse solution with automatically generated ETL (Extract, Transform, Load) business logic. The result of this work is the database meta-model, which stores OLAP and OLTP data models and relations between them. Composed method is base for the virtual data warehouse to provide same kind of functionality like classic and static OLAP dimensional database does.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121258487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Complementary multi guard ring JBS structures: Numerical analysis 互补多护环JBS结构:数值分析
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5630911
A. Koel, T. Rang, G. Rang
{"title":"Complementary multi guard ring JBS structures: Numerical analysis","authors":"A. Koel, T. Rang, G. Rang","doi":"10.1109/BEC.2010.5630911","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630911","url":null,"abstract":"The paper gives short overview of SiC based complementary multi guard ring JSB structures and the numerical model to be used in the analysis. The static U-I characteristics are under investigation. The geometry and temperature influence has been analyzed.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124219391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Arterial pulse waveform dependence on applied pressure 动脉脉搏波形对施加压力的依赖性
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5630888
K. Pilt, K. Meigas, M. Viigimaa, J. Kaik, R. Kattai, D. Karai
{"title":"Arterial pulse waveform dependence on applied pressure","authors":"K. Pilt, K. Meigas, M. Viigimaa, J. Kaik, R. Kattai, D. Karai","doi":"10.1109/BEC.2010.5630888","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630888","url":null,"abstract":"The arterial pulse waveform dependence on applied pressure was experimentally analyzed. An experimental device was built and tests were conducted. Pressure was applied to the brachial artery and the analysed photoplethysmographic waveform was registered from radial artery. The photoplethysmographic signal was analyzed by calculating the differences between pulse waveforms. In addition waveform amplitude and the slope of the rising front were studied. When the applied pressure was lowered to the level where the piezoelectric signal amplitude is near its maximum, the differences between pulse waveforms decrease. It was concluded that there is a critical pressure level and below this the waveform is no longer influenced.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115941941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Modelling of objects location data flow in communication networks 通信网络中对象定位数据流的建模
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5631624
I. Lagzdinytė
{"title":"Modelling of objects location data flow in communication networks","authors":"I. Lagzdinytė","doi":"10.1109/BEC.2010.5631624","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631624","url":null,"abstract":"This article analyzes location update problems in heterogeneous networks. Author propose location update scheme that evaluates the most important factors such as positioning uncertainty, desired accuracy of location data, the intensity of service users' queries and dynamic characteristics of the object. Simulation results show that proposals lead less intensity of location update messages to maintain accuracy of location information that is desired by service users.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122601931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of the model for the optical multiwavelength monitoring of creatinine in the spent dialysate 废透析液肌酐光学多波长监测模型的建立
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5629771
R. Tomson, I. Fridolin, F. Uhlin, J. Jerotskaja, K. Lauri, M. Luman
{"title":"Development of the model for the optical multiwavelength monitoring of creatinine in the spent dialysate","authors":"R. Tomson, I. Fridolin, F. Uhlin, J. Jerotskaja, K. Lauri, M. Luman","doi":"10.1109/BEC.2010.5629771","DOIUrl":"https://doi.org/10.1109/BEC.2010.5629771","url":null,"abstract":"The aim of the study was to develop a statistical model suitable for the estimation of creatinine concentration removed during dialysis through UV-absorbance. Ten uremic patients, three females and seven males, mean age 62.6 ± 18.6 years, on chronic thrice-weekly hemodialysis were included in the study. Double-beam spectrophotometer (Shimatsu UV-2401 PC, Japan) was used for the determination of UV-absorbance in the collected spent dialysate samples. Due to differences in independent variables included two multiwavelength models were developed using stepwise regression. The coefficient of determination, R2 was 0.8709 for the first and 0.8756 for the second model. The standard errors were 15.86 micromol/l and 16.01 micromol/l, respectively. In summary, the creatinine concentration removed during dialysis can be estimated with UV-absorbance technique.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131714441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Snoring seconds detection with EMFi sensor strips 打鼾秒检测与EMFi传感器条
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5630889
Jarmo Alametsa, J. Viik, E. Huupponen, A. Kulkas, A. Varri, S. Himanen
{"title":"Snoring seconds detection with EMFi sensor strips","authors":"Jarmo Alametsa, J. Viik, E. Huupponen, A. Kulkas, A. Varri, S. Himanen","doi":"10.1109/BEC.2010.5630889","DOIUrl":"https://doi.org/10.1109/BEC.2010.5630889","url":null,"abstract":"In this work strip Electromechanical Film (EMFi) sensors were used to detect snoring seconds by utilizing the frequency band of a snoring vibration recorded on the skin of a sleeping person. Detected snoring frequency with the same person recorded with EMFi sensor strips was inside the 55 – 75 Hz area and this frequency area was used to detect the snoring seconds. The same frequency was detected with all the EMFi strip sensors differing mainly in the amplitude of the detected frequency. The amplitude of the snoring frequency was proportional to the recording location on the skin of a person. As a result, EMFi sensor strips can also be used to detect snoring seconds thus making it possible to deduct the amount of electrodes.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125580856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Linearity study of a self-balancing capacitive half-bridge sensor interface 自平衡电容式半桥传感器接口的线性研究
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5629804
M. Yucetas, L. Aaltonen, K. Halonen
{"title":"Linearity study of a self-balancing capacitive half-bridge sensor interface","authors":"M. Yucetas, L. Aaltonen, K. Halonen","doi":"10.1109/BEC.2010.5629804","DOIUrl":"https://doi.org/10.1109/BEC.2010.5629804","url":null,"abstract":"This paper investigates the sources of non-linearity of a self-balancing capacitive half-bridge sensor interface. It has been shown that the linearity of the interface output with respect to input acceleration is infinity at DC input signals when half-bridge sensor element is assumed as parallel plate capacitor pair. The linearity degrades as the input signal frequency gets higher. The source of the non-linearity is found out to be the phase difference between senor sensor element displacement and the interface output voltage. The analytical expression for the HD3 of the interface is derived. It has been seen that to increase the linearity of the interface, the phase difference can be decreased by increasing the cut-off frequency of the interface loop.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126707749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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