Defect-oriented BIST quality analysis

Abstract

In this paper, the efficiency of the built-in self-test pseudorandom patterns generated by an LFSR is investigated and compared for different fault classes. In particular, the need for defect-oriented testing is taken into account. Experimental research showed that the quality of BIST estimated using the SAF model can be too optimistic, and that extended fault classes for evaluation of BIST and determining the acceptable length of BIST sequences are needed.