2010 12th Biennial Baltic Electronics Conference最新文献

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Graphical interface for debugging RTL Networks-on-Chip 调试RTL片上网络的图形界面
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5630292
L. Moller, H. Jesus, F. Moraes, L. Indrusiak, T. Hollstein, M. Glesner
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引用次数: 6
Effective EFSM generation for HW/SW-design verification 有效的EFSM生成的硬件/ sw设计验证
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-11-11 DOI: 10.1109/BEC.2010.5631006
Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli
{"title":"Effective EFSM generation for HW/SW-design verification","authors":"Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli","doi":"10.1109/BEC.2010.5631006","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631006","url":null,"abstract":"The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127203537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-lockin detection of AC magnetic fields by fluxgate sensor 磁通门传感器的交流磁场单锁检测
2010 12th Biennial Baltic Electronics Conference Pub Date : 2010-10-01 DOI: 10.1109/BEC.2010.5631591
M. Janošek, S. Dado
{"title":"Single-lockin detection of AC magnetic fields by fluxgate sensor","authors":"M. Janošek, S. Dado","doi":"10.1109/BEC.2010.5631591","DOIUrl":"https://doi.org/10.1109/BEC.2010.5631591","url":null,"abstract":"We present a simple narrowband method to detect the amplitude of alternating magnetic fields by a fluxgate sensor using a single lock-in amplifier, improving the common method of using two phase sensitive demodulators (lock-in amplifiers). We eliminated the need for two phase-sensitivite demodulators by processing the reference signals of lock-in amplifier and of the fluxgate excitation unit. This setup can be used as a high-resolution, narrowband spectral analyzer of magnetic fields or as a system for measuring the AC response of magnetic markers. Two methods were introduced and tested; we achieved 2 kHz detecting noise spectral density of 80 pT/√Hz in the laboratory environment. The method is directly usable for any fluxgate sensor or magnetometer, where the reference signals are available. Using a slow feedback compensating-loop further improves the dynamic range of the instrument.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126431365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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