Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli
{"title":"有效的EFSM生成的硬件/ sw设计验证","authors":"Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli","doi":"10.1109/BEC.2010.5631006","DOIUrl":null,"url":null,"abstract":"The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effective EFSM generation for HW/SW-design verification\",\"authors\":\"Michele Bertasi, G. Di Guglielmo, F. Fummi, G. Pravadelli\",\"doi\":\"10.1109/BEC.2010.5631006\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.\",\"PeriodicalId\":228594,\"journal\":{\"name\":\"2010 12th Biennial Baltic Electronics Conference\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 12th Biennial Baltic Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BEC.2010.5631006\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 12th Biennial Baltic Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2010.5631006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effective EFSM generation for HW/SW-design verification
The paper presents an automatic procedure for generating a particular kind of extended finite state machine, which allows a more uniform exploration of the state space of a design under verification. The proposed approach avoids the transition-incompatibility problem which typically arises in actual HW/SW-system descriptions. A EFSM-based ATPG, which exploits such a model, is able to more uniformly analyze the state space of the system with respect to using a generic EFSM.