IEEE Design & Test最新文献

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Area-Efficient LFSR-Based Stochastic Number Generators with Minimum Correlation 基于最小相关系数的面积高效lfsr随机数发生器
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3278619
S. A. Salehi
{"title":"Area-Efficient LFSR-Based Stochastic Number Generators with Minimum Correlation","authors":"S. A. Salehi","doi":"10.1109/mdat.2023.3278619","DOIUrl":"https://doi.org/10.1109/mdat.2023.3278619","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132935445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Randomized Testing of RISC-V CPUs using Direct Instruction Injection 使用直接指令注入的RISC-V cpu随机测试
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3262741
Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore
{"title":"Randomized Testing of RISC-V CPUs using Direct Instruction Injection","authors":"Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore","doi":"10.1109/mdat.2023.3262741","DOIUrl":"https://doi.org/10.1109/mdat.2023.3262741","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116662363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tipping the Balance: Imbalanced Classes in Deep Learning Side-channel Analysis 打破平衡:深度学习侧通道分析中的不平衡类
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3288808
S. Picek, Annelie Heuser, A. Jović, S. Bhasin, Francesco Regazzoni
{"title":"Tipping the Balance: Imbalanced Classes in Deep Learning Side-channel Analysis","authors":"S. Picek, Annelie Heuser, A. Jović, S. Bhasin, Francesco Regazzoni","doi":"10.1109/mdat.2023.3288808","DOIUrl":"https://doi.org/10.1109/mdat.2023.3288808","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126298539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond 检测回收电子产品的统计方法:从集成电路到pcb及其他
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3283349
K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris
{"title":"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond","authors":"K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris","doi":"10.1109/mdat.2023.3283349","DOIUrl":"https://doi.org/10.1109/mdat.2023.3283349","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115300802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Securing CRYSTALS-Kyber in FPGA Using Duplication and Clock Randomization 利用重复和时钟随机化在FPGA中保护CRYSTALS-Kyber
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3298805
M. Moraitis, Yanning Ji, Martin Brisfors, E. Dubrova, Niklas Lindskog, H¢ªakan Englund
{"title":"Securing CRYSTALS-Kyber in FPGA Using Duplication and Clock Randomization","authors":"M. Moraitis, Yanning Ji, Martin Brisfors, E. Dubrova, Niklas Lindskog, H¢ªakan Englund","doi":"10.1109/mdat.2023.3298805","DOIUrl":"https://doi.org/10.1109/mdat.2023.3298805","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121566267","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Safety Ethics for Design & Test of Automated Driving Features 自动驾驶特性设计与测试的安全伦理
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3281733
P. Koopman, William H. Widen
{"title":"Safety Ethics for Design & Test of Automated Driving Features","authors":"P. Koopman, William H. Widen","doi":"10.1109/mdat.2023.3281733","DOIUrl":"https://doi.org/10.1109/mdat.2023.3281733","url":null,"abstract":"— The highly tool-intensive design and validation of automated driving features brings with it significant opportunities to support ethical practices related to safety for testing and lifecycle support. This article shows how some basic principles from the IEEE 7000 standard on ethical concerns during system design can apply.","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128355810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FALCON: An FPGA Emulation Platform for Domain-Specific Systems-on-Chip (DSSoCs) 专用领域单片系统(dssoc)的FPGA仿真平台
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3291331
A. Krishnakumar, Hanguang Yu, T. Ajayi, A. Alper Goksoy, V. Pandey, J. Mack, Sahil Hassan, Kuan-Yu Chen, C. Chakrabarti, D. Bliss, A. Akoglu, Hun-Seok Kim, R. Dreslinski, D. Blaauw, U. Ogras
{"title":"FALCON: An FPGA Emulation Platform for Domain-Specific Systems-on-Chip (DSSoCs)","authors":"A. Krishnakumar, Hanguang Yu, T. Ajayi, A. Alper Goksoy, V. Pandey, J. Mack, Sahil Hassan, Kuan-Yu Chen, C. Chakrabarti, D. Bliss, A. Akoglu, Hun-Seok Kim, R. Dreslinski, D. Blaauw, U. Ogras","doi":"10.1109/mdat.2023.3291331","DOIUrl":"https://doi.org/10.1109/mdat.2023.3291331","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126713696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Furthering Moore’s Law Integration Benefits in the Chiplet Era 摩尔定律在芯片时代的进一步整合效益
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3302809
Rob Munoz
{"title":"Furthering Moore’s Law Integration Benefits in the Chiplet Era","authors":"Rob Munoz","doi":"10.1109/mdat.2023.3302809","DOIUrl":"https://doi.org/10.1109/mdat.2023.3302809","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125486555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Workload-Aware Periodic Interconnect BIST 工作负载感知周期对接BIST
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3298849
Somayeh Sadeghi-Kohan, S. Hellebrand, H. Wunderlich
{"title":"Workload-Aware Periodic Interconnect BIST","authors":"Somayeh Sadeghi-Kohan, S. Hellebrand, H. Wunderlich","doi":"10.1109/mdat.2023.3298849","DOIUrl":"https://doi.org/10.1109/mdat.2023.3298849","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126928437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Intellectual Property Protection of Deep Learning Systems via Hardware/Software Co-design 基于软硬件协同设计的深度学习系统知识产权保护
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3303435
Huili Chen, Cheng Fu, B. Rouhani, Jishen Zhao, F. Koushanfar
{"title":"Intellectual Property Protection of Deep Learning Systems via Hardware/Software Co-design","authors":"Huili Chen, Cheng Fu, B. Rouhani, Jishen Zhao, F. Koushanfar","doi":"10.1109/mdat.2023.3303435","DOIUrl":"https://doi.org/10.1109/mdat.2023.3303435","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134245259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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