Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore
{"title":"Randomized Testing of RISC-V CPUs using Direct Instruction Injection","authors":"Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno Van der Maas, Matthew Naylor, M. Roe, Robert N. M. Watson, P. Neumann, Simon W. Moore","doi":"10.1109/mdat.2023.3262741","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3262741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}