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IEEE Design & Test Publication Information IEEE 设计与测试出版物信息
IEEE Design & Test Pub Date : 2024-02-01 DOI: 10.1109/mdat.2023.3335431
{"title":"IEEE Design & Test Publication Information","authors":"","doi":"10.1109/mdat.2023.3335431","DOIUrl":"https://doi.org/10.1109/mdat.2023.3335431","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139685091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Design & Test Publication Information IEEE设计与测试出版信息
IEEE Design & Test Pub Date : 2023-02-01 DOI: 10.1109/mdat.2022.3231398
{"title":"IEEE Design & Test Publication Information","authors":"","doi":"10.1109/mdat.2022.3231398","DOIUrl":"https://doi.org/10.1109/mdat.2022.3231398","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127132163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TTTC News
IEEE Design & Test Pub Date : 2022-06-01 DOI: 10.1109/mdat.2022.3163648
S. Di Carlo
{"title":"TTTC News","authors":"S. Di Carlo","doi":"10.1109/mdat.2022.3163648","DOIUrl":"https://doi.org/10.1109/mdat.2022.3163648","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126025720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Memory Usage Estimation for Dataflow Model-based Software Development Methodology 基于数据流模型的软件开发方法的内存使用估算
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3286333
Kyonghwan Yoon, Eunji Jeong, Woosuk Kang, Soonhoi Ha
{"title":"Memory Usage Estimation for Dataflow Model-based Software Development Methodology","authors":"Kyonghwan Yoon, Eunji Jeong, Woosuk Kang, Soonhoi Ha","doi":"10.1109/mdat.2023.3286333","DOIUrl":"https://doi.org/10.1109/mdat.2023.3286333","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126799502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature 硬签名:一种使用日期手写签名的硬件水印方案
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3307576
Mahendra Rathor, Girraj Prasad Rathor
{"title":"Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature","authors":"Mahendra Rathor, Girraj Prasad Rathor","doi":"10.1109/mdat.2023.3307576","DOIUrl":"https://doi.org/10.1109/mdat.2023.3307576","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129395667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Five Years Teaching Ethics and Computing 五年伦理与计算机教学
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3277814
Chris Partridge, M. Gorin, E. Easley, Jesse Gray
{"title":"Five Years Teaching Ethics and Computing","authors":"Chris Partridge, M. Gorin, E. Easley, Jesse Gray","doi":"10.1109/mdat.2023.3277814","DOIUrl":"https://doi.org/10.1109/mdat.2023.3277814","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121360553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cell-Aware Test on Various Circuits in an Advanced 3nm Technology 先进3nm技术在各种电路上的细胞感知测试
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3294872
Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen
{"title":"Cell-Aware Test on Various Circuits in an Advanced 3nm Technology","authors":"Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen","doi":"10.1109/mdat.2023.3294872","DOIUrl":"https://doi.org/10.1109/mdat.2023.3294872","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122514999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ethics in Sustainability 可持续发展的伦理
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3283351
C. Bash, Kirk M. Bresniker, Paolo Faraboschi, Tiffani Jarnigan, D. Milojicic, Pam Wood
{"title":"Ethics in Sustainability","authors":"C. Bash, Kirk M. Bresniker, Paolo Faraboschi, Tiffani Jarnigan, D. Milojicic, Pam Wood","doi":"10.1109/mdat.2023.3283351","DOIUrl":"https://doi.org/10.1109/mdat.2023.3283351","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129432896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hardware Accelerators for Digital Signature Algorithms Dilithium and FALCON 数字签名算法的硬件加速器
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3305156
Luke Beckwith, D. Nguyen, K. Gaj
{"title":"Hardware Accelerators for Digital Signature Algorithms Dilithium and FALCON","authors":"Luke Beckwith, D. Nguyen, K. Gaj","doi":"10.1109/mdat.2023.3305156","DOIUrl":"https://doi.org/10.1109/mdat.2023.3305156","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116509752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions 高效SoC安全监控:质量属性和潜在解决方案
IEEE Design & Test Pub Date : 1900-01-01 DOI: 10.1109/mdat.2023.3292208
Mridha Md Mashahedur Rahman, Shams Tarek, K. Z. Azar, M. Tehranipoor, Farimah Farahmandi
{"title":"Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions","authors":"Mridha Md Mashahedur Rahman, Shams Tarek, K. Z. Azar, M. Tehranipoor, Farimah Farahmandi","doi":"10.1109/mdat.2023.3292208","DOIUrl":"https://doi.org/10.1109/mdat.2023.3292208","url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132249428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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