Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen
{"title":"Cell-Aware Test on Various Circuits in an Advanced 3nm Technology","authors":"Zhan Gao, Min-Chun Hu, R. Baert, B. Chehab, J. Swenton, Santosh Malagi, J. Huisken, K. Goossens, E. Marinissen","doi":"10.1109/mdat.2023.3294872","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":"186 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3294872","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}