K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris
{"title":"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond","authors":"K. Huang, Yu Liu, Nenad Korolija, J. Carulli, Y. Makris","doi":"10.1109/mdat.2023.3283349","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3283349","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}