{"title":"Furthering Moore’s Law Integration Benefits in the Chiplet Era","authors":"Rob Munoz","doi":"10.1109/mdat.2023.3302809","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":226420,"journal":{"name":"IEEE Design & Test","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3302809","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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