2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)最新文献_第7页

A Ring Ocillator Based Reliability Monitor 基于环形振荡器的可靠性监视器

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596496

J. Deng, Xiaoxiao Wang

{"title":"A Ring Ocillator Based Reliability Monitor","authors":"J. Deng, Xiaoxiao Wang","doi":"10.1109/ICAM.2018.8596496","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596496","url":null,"abstract":"Due to the technology nodes further scale, variabilities continue to be a challenge for IC design. The variability is mainly classified as IR-drop, temperature change and aging. We mainly discussed the first two parts in this paper. Overheating can damage the chip permanently and excessive IR-Drop can greatly affect voltage sensitive digital blocks. In order to avoid these damages and make better adaptation, we need to differentiate these variabilities. In this paper, a 32nm ring oscillator based temperature sensor with IR-Drop monitor was presented. Different from traditional sensors, the proposed sensor can monitor IR-Drop in-field which avoid its effect on temperature measurement. The IR-Drop monitor is sensitive to variations larger than 100mV. Meanwhile, the temperature sensor block has a wide temperature measurement range. The sensor's temperature measurement period could be close to 10us,which helps to establish real-time thermal management. With its help, we can improve chip reliability. All these parts can be easily integrated into a chip due to its all-digital cells. The sensor occupies less than 0.0 1mm2 area and achieves a resolution of 0.5°C.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115377910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Repeated Strike Process Modeling of Very Fast Transient Overvoltage Induced by Disconnector Switch Operation in 252kV GIS 252kV GIS中隔离开关动作引起的快速瞬态过电压的重复冲击过程建模

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596554

Lin Zhao, Liya Ye, Shaoan Wang, H. Zhan, Yong Yang, Peng Jiang

引用次数: 0

Accurate Fault Location Method and Verification Test Analysis of High-Voltage Cable Hybrid Lines 高压电缆混合线路故障精确定位方法及验证试验分析

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596594

Junping Cao, Hang Jiang, Luyao Zhou, Shaohua Wang, Xiangxian Zhou, Te Li

{"title":"Accurate Fault Location Method and Verification Test Analysis of High-Voltage Cable Hybrid Lines","authors":"Junping Cao, Hang Jiang, Luyao Zhou, Shaohua Wang, Xiangxian Zhou, Te Li","doi":"10.1109/ICAM.2018.8596594","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596594","url":null,"abstract":"With the wide application of high-voltage cable-overhead hybrid line, it is difficult to determine the fault zone and accurately locate the fault point based on the line fault location method with uniform parameters. For this reason, this paper proposes a two-terminal fault exact positioning method based on wavelet theory. The power frequency transient signals of fault currents in the head and the end of high-voltage cable are collected to determine the polarity of the fault to locate the fault section. The fault current can be accurately located by collecting the double-ended traveling wave signal of the fault current. A 110 kV high voltage cable state simulation test platform was constructed to carry out fault simulation tests within and outside the high voltage cable line to verify the actual effect of the fault location method. The experimental verification shows that the two-terminal fault exact positioning method based on wavelet theory can accurately determine whether the fault point is located interval or outside the interval of high-voltage cable line, and achieve the precise positioning of fault points in the high-voltage cable interval. This method will effectively reduce the time of fault finding, and is of great significance for fast recovery of power supply.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126616475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

An 8-bit 400-MS/s Asynchronous SAR ADC with Single-ended/Differential Configurable Input Mode 一个8位400毫秒/秒异步SAR ADC，单端/差分可配置输入模式

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596574

Liang Zhang, Mingchao Chang, Qianwei Kuang, Dayu Zhang

引用次数: 2

Research and Design of Class D Amplifier at 1 MHz 1mhz D类放大器的研究与设计

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596608

Dong-Dong Hu, Xuesong Xie, Xiaoling Zhang, Shuai-Bing Qi

引用次数: 3

Propagation Characteristics of Acoustic Emission Signals in Multi Coupling Interface of the Engine 声发射信号在发动机多耦合界面中的传播特性

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596433

Ruiqi Zhang, Guoan Yang, Yan Wang

{"title":"Propagation Characteristics of Acoustic Emission Signals in Multi Coupling Interface of the Engine","authors":"Ruiqi Zhang, Guoan Yang, Yan Wang","doi":"10.1109/ICAM.2018.8596433","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596433","url":null,"abstract":"The engine is a significant and dynamic component of the aircraft. Because of the complicated structure and severe operating environment, the fault detection of the engine has always been the key and difficult issue in the field of reliability. Based on an engine and the acoustic emission technology, we propose a method of identifying fault types and determining different components in the engine by constructing the attenuation coefficient. There are several common faults of engines, and three different types of fault sources are generated experimentally in this work. Then the fault signal of the above fault sources propagating in different engine components are obtained. Finally, the acoustic emission characteristics of the fault signal are extracted and judged by the attenuation coefficient. The work effectively identifies different types of faults and studies the effects of different structural components on the propagation of fault acoustic emission signals, which provides a method for the use of acoustic emission technology to identify the faults types of the engine and to study the propagation characteristics of AE signals on the engine.*","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133143902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

One Method to Fit Biexponential Curve by Using Fourier Transform 用傅里叶变换拟合双指数曲线的一种方法

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596504

Zhenguo Wang, L. Ni, Shaohua Wang, Lei Ji, T. Lu, Yongtao Jin

引用次数: 1

Study on Statistical Evaluation of Supply Reliability for Distribution Network 配电网供电可靠性的统计评估研究

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596326

Feng Yuyao, Zhang Kaiyu, Min Bo, Yuan Qaunning

引用次数: 0

Feedback Linearization Control Scheme for DFIG with DC-Based Converter System 直流变换器DFIG系统的反馈线性化控制方法

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596607

Zehao Liu

引用次数: 0

An Arithmetic Unit and Multiplying Accumulation Unit of a Custom Floating Point Data Format 自定义浮点数据格式的算术单元和乘法累加单元

2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2018-11-01 DOI: 10.1109/ICAM.2018.8596674

Ang Lv, Chao Wang, L. Hou, Zhiyong Zeng, Jia Guo, Nan Jiang

引用次数: 2