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2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)最新文献

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Effect of a Series of Voltage Pulses on Passive Components and Transistors 一系列电压脉冲对无源元件和晶体管的影响
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802284
A. Anikin, K. Epifantsev, A. Shemonaev, P. Skorobogatov
{"title":"Effect of a Series of Voltage Pulses on Passive Components and Transistors","authors":"A. Anikin, K. Epifantsev, A. Shemonaev, P. Skorobogatov","doi":"10.1109/MWENT55238.2022.9802284","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802284","url":null,"abstract":"The results of studies of capacitors and transistors under the influence of single and multiple voltage pulses are presented. It is shown that the impact of multiple electrical interference reduces the durability of the product compared to the impact of a single pulse.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127674232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Face Identification and Verification Under Computational and Security Constraints 计算和安全约束下的人脸识别与验证
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802397
N. Shevtsov
{"title":"Face Identification and Verification Under Computational and Security Constraints","authors":"N. Shevtsov","doi":"10.1109/MWENT55238.2022.9802397","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802397","url":null,"abstract":"Face verification methods have undergone significant changes through the last decade. Rapid increasing of hardware computing power allows engineers to create neural networks to solve face verification problems. Classical computer vision face verification such as Viola-Jones Algorithm or Haar cascades Algorithm were forced out by deep learning Siamese Networks approaches. Nowadays we are faced with the challenge of finding a balance between accuracy and performance. Many light-weighted “mobile” models have good computational performance but lower accuracy in unconstrained data. In this paper, we provide some ideas of modifying the MobileFaceNet approach to increase accuracy without falling the evaluation performance.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"237 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116385954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thermal Model of a Heterojunction Bipolar Transistor Taking into Account the Voltage Drop on the Emitter Fingers of Metallization 考虑金属化发射极端压降的异质结双极晶体管热模型
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802430
V. Sergeev, A. M. Hodakov
{"title":"Thermal Model of a Heterojunction Bipolar Transistor Taking into Account the Voltage Drop on the Emitter Fingers of Metallization","authors":"V. Sergeev, A. M. Hodakov","doi":"10.1109/MWENT55238.2022.9802430","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802430","url":null,"abstract":"A thermoelectric model of the structure of a heterojunction bipolar transistor is presented, taking into account a decrease in current density along the emitter metallization paths. To find the temperature field in the transistor structure, the solution of the nonlinear thermal conductivity problem was found by the numerical finite element method, using the COMSOL Multiphysics software environment. Numerical analysis has shown that this effect leads to a strong dependence of the maximum temperature and current density in the structure and the limiting functionality of the device on the topological parameters of the tracks. The results obtained can be used to optimize the design of heterojunction bipolar transistors.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126293270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laser scanning confocal IR microscopy for non-destructive testing of semiconductors 用于半导体无损检测的激光扫描共聚焦红外显微镜
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802329
D. Ukolov, A. Baluev, P. Gromova, A. Pechenkin, R. Mozhaev
{"title":"Laser scanning confocal IR microscopy for non-destructive testing of semiconductors","authors":"D. Ukolov, A. Baluev, P. Gromova, A. Pechenkin, R. Mozhaev","doi":"10.1109/MWENT55238.2022.9802329","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802329","url":null,"abstract":"The article discusses characteristics of the laser scanning confocal IR microscope being developed for applications of non-destructive testing of semiconductor structures. The existing methods and analysis facilities of integrated circuits are described. In this review, the method of laser confocal IR-microscopy is considered. The laser scanning confocal IR-microscope will make it possible to reconstruct the internal structure of an integrated circuit and identify its materials without special environmental conditions during research, for example, such as vacuum chamber or x-ray facility.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134388047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Automated Test Bench for Monitoring Electrical Parameters of Lithium-Ion Battery Charge Control Chips 锂离子电池充电控制芯片电气参数监测自动化试验台
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802287
Sergey Malyuchenko, Maya Belova, Daria V. Pechenkina
{"title":"Automated Test Bench for Monitoring Electrical Parameters of Lithium-Ion Battery Charge Control Chips","authors":"Sergey Malyuchenko, Maya Belova, Daria V. Pechenkina","doi":"10.1109/MWENT55238.2022.9802287","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802287","url":null,"abstract":"The article discusses the process of creating a test bench based on NI PSI equipment for monitoring electrical parameters and functioning of the charge control chip of a lithium-ion battery. The description of the MAX745 microchip under study, the measuring stand, and its main components are presented. The main blocks of software for monitoring the functioning of the object are considered. The efficiency of the developed measuring stand has been experimentally confirmed.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133133515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Building a Digital Twin for Industrial Internet of Things with Interoperability 构建具有互操作性的工业物联网数字孪生
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802304
Rabia Khan, Nyasha Tsiga, Kinan Ghanem
{"title":"Building a Digital Twin for Industrial Internet of Things with Interoperability","authors":"Rabia Khan, Nyasha Tsiga, Kinan Ghanem","doi":"10.1109/MWENT55238.2022.9802304","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802304","url":null,"abstract":"For Internet-of-Things (IoT), 6G, interconnected world, high technological demand, big data and complexity is increasing the requirement of new algorithm designs, protocols and improvement in the existing systems. The fancy IoT term has started to evolve from academics to real life implementation. Tremendous number of organizations and industries require their systems to be upgraded. Industries, however, are in high need for the technological improvement due to the amount of data collected every day. The collection of data is meaningless without being analysed. A stand-alone industry with high amount of OT devices cannot efficiently deal with the data and its analysis, which bring the need for OT/IT convergence and digital twin in industries.This paper proposes the steps to build a Digital Twin (DT) for one of the Industrial Internet of Things (IIoT) setup. These steps include the collection of data on the site from OT devices, processing of data near site, OT/IT convergence, uploading of data to the cloud or the wireless transmission of data and inter-operability between the physical and DT. Within the processing of data, finding of implementation, some iterations for distributed and parallel computation, and the data processing method are also proposed.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131212546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modelling mobile robot navigation in 3D environments: camera-based stairs recognition in Gazebo 三维环境中移动机器人导航建模:Gazebo中基于摄像头的楼梯识别
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802368
Maksim Mustafin, T. Tsoy, E. Martínez-García, R. Meshcheryakov, E. Magid
{"title":"Modelling mobile robot navigation in 3D environments: camera-based stairs recognition in Gazebo","authors":"Maksim Mustafin, T. Tsoy, E. Martínez-García, R. Meshcheryakov, E. Magid","doi":"10.1109/MWENT55238.2022.9802368","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802368","url":null,"abstract":"The task of sensory-based autonomous navigation of mobile robots requires data fusion from multiple sources in order to properly detect and recognize environmental obstacles. One of important issues mobile robots deal in a typical multi-level indoor environment is a stair well detection and negotiation. This paper presents ROS-based stairs detection implementation using onboard cameras of the Russian mobile crawler robot Servosila Engineer. Virtual experiments were performed in Gazebo environment with a single camera and a stereo camera.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125713302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Durability of Intelligent Textile Fabrics and Composite Materials 智能纺织织物和复合材料的耐久性
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802330
M. Mitsik, M. V. Byrdina, I. M. Maltsev, Viktor P. Bezrukov
{"title":"Durability of Intelligent Textile Fabrics and Composite Materials","authors":"M. Mitsik, M. V. Byrdina, I. M. Maltsev, Viktor P. Bezrukov","doi":"10.1109/MWENT55238.2022.9802330","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802330","url":null,"abstract":"The paper considers new types of smart textile fabrics and composite materials from the point of view of calculating their strength, which can be used in the development of shell structures. Typical applications of passive, active and hyperintelligent materials are shown, their functions, capabilities, aesthetic qualities and ergonomic properties are considered. Methods of studying textile and composite materials strength as well as use as protective layers of intelligent clothing are considered within specific examples. Options of creating outer protective layers of interactive clothing by integrating graphene-based composite nanomaterials, carbon nanotubes, and various types of fibers into it are proposed. It is proposed to integrate smart sensors into the inner layers of clothing to evaluate the force and type of impact on the fabric at various points in the structure, which can report on the impact force close to the breaking force with a color or sound signal.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123711699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mathematical Methods for Describing the non-Gaussian Random Variables and Processes 描述非高斯随机变量和过程的数学方法
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802408
V. M. Artyushenko, V. I. Volovach, K. Lyapina, Alyona Igorevna Kutukova
{"title":"Mathematical Methods for Describing the non-Gaussian Random Variables and Processes","authors":"V. M. Artyushenko, V. I. Volovach, K. Lyapina, Alyona Igorevna Kutukova","doi":"10.1109/MWENT55238.2022.9802408","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802408","url":null,"abstract":"Mathematical methods for describing univariate and bivariate non-Gaussian random variables and processes in their modeling are considered. A decomposition of probability density functions (PDFs) using orthogonal polynomials is described for both univariate and bivariate PDFs. It is noted that, in both cases, decompositions using the specified orthogonal functions can be used in most cases. The area of application of the exponential PDF is shown. We give a representation of two-dimensional PDF in the form of an Edgeworth-type expansion by Hermite polynomials. The correlation between the correlation function and the bivariate PDF of a random process is shown. We analyze the representation of one-dimensional distributions by orthogonal Gramm-Charlier and Edgeworth series as well as of two-dimensional distributions in the form of a Hermite polynomial expansion. It is noted that Edgeworth’s series provides a better approximation of PDFs than the Gramm-Charlier series. It is shown that the coefficient of excess characterizes the shape of PDF. We consider the method of PDF decomposition by Laguerre polynomials which are used only for one-way PDFs. The field of Fourier series decomposition is determined. The formation and superposition methods used in the formation of random variables are described.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115553276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
IoT Standardization: An Overview of Organizations and Standards 物联网标准化:组织和标准概述
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2022-06-09 DOI: 10.1109/MWENT55238.2022.9802373
Ali Ebraheem, I. Ivanov
{"title":"IoT Standardization: An Overview of Organizations and Standards","authors":"Ali Ebraheem, I. Ivanov","doi":"10.1109/MWENT55238.2022.9802373","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802373","url":null,"abstract":"The Internet of Things is becoming more and more part of our lives. The growth in economic investment in IoT makes it a good subject for standardization. This article highlights the different international standardization efforts with special attention to the standardization efforts in Russia. An overview of the standard development organizations is presented with a glance at their structure, history, and standards.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127497471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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