2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)最新文献_第2页

Evolutionary recovery from radiation induced faults on reconfigurable devices 可重构器件辐射诱发故障的进化恢复

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368039

A. Stoica, T. Arslan, D. Keymeulen, V. Duong, R. Zebulum, I. Ferguson, T. Daud

{"title":"Evolutionary recovery from radiation induced faults on reconfigurable devices","authors":"A. Stoica, T. Arslan, D. Keymeulen, V. Duong, R. Zebulum, I. Ferguson, T. Daud","doi":"10.1109/AERO.2004.1368039","DOIUrl":"https://doi.org/10.1109/AERO.2004.1368039","url":null,"abstract":"Radiation hard technologies for electronics are the conventional approach for survivability in high radiation environments. This paper presents a novel approach based on evolvable hardware. The key idea is to reconfigure a programmable device, in-situ, to compensate, or bypass its degraded or damaged components. The paper demonstrates the approach using a JPL-developed reconfigurable device, a field programmable transistor array (FPTA), which shows recovery from radiation damage when reconfigured under the control of evolutionary algorithms. Experiments with total radiation dose up to 350 kRad show that while the functionality of a variety of circuits, including a rectifier and a digital to analog converter implemented on an FPTA-2 chip is degraded/lost at levels before 100 kRad, the correct functionality can be recovered through the proposed evolutionary approach. The evolutionary algorithm controls the state of about 1,500 switches that determine configurations on the FTPA-2 programmable device. Evolution is able to use the resources of the reconfigurable cells, even radiation damaged components, to synthesize a new solution.","PeriodicalId":208052,"journal":{"name":"2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126689950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Method of using thin metallic foils to minimize thermal transients and photoelectric effects in pressure measurements 在压力测量中使用薄金属箔最小化热瞬变和光电效应的方法

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368052

J. Booth, R. W. Milton, M.W. Kirkham

{"title":"Method of using thin metallic foils to minimize thermal transients and photoelectric effects in pressure measurements","authors":"J. Booth, R. W. Milton, M.W. Kirkham","doi":"10.1109/AERO.2004.1368052","DOIUrl":"https://doi.org/10.1109/AERO.2004.1368052","url":null,"abstract":"This paper discusses the development of a method to reduce the transient effects on piezoelectric pressure transducers used in the measurement of blast overpressure produced by non-conventional explosives. This method was developed during testing of high-energy and non-conventional explosives at the Aviation and Missile Research, Development and Engineering Center (AMRDEC) on the Redstone Arsenal in Huntsville, Alabama. There are two major contributors that negatively affect the quality of data gathered in the measurement of blast overpressures using piezoelectric pressure transducers. These undesirable effects are thermal and photoelectric transients generated in the explosive blast. These transients were found to obscure the data generated by causing a non-positive amplitude shift in the pressure-time curves when trying to measure the performance of non-conventional explosives. This paper explores the phenomenon in detail, utilizing graphical data derived from laboratory experiments to explain the problem and to illustrate how the use of this method may improve blast measurements.","PeriodicalId":208052,"journal":{"name":"2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127812527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Trajectory generation using a modified simple shooting method 弹道生成使用一种改进的简单射击方法

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368069

A. Trent, R. Venkataraman, D. Doman

引用次数: 14

Three dimensional imaging utilizing structured light 利用结构光的三维成像

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368060

C. Liebe, C. Padgett, J. Chang

引用次数: 8

A behavioral control approach to formation-keeping through an obstacle field 一种通过障碍物保持队形的行为控制方法

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1367602

R. Dougherty, V. Ochoa, Z. Randles, C. Kitts

引用次数: 29

Pb-free microelectronics assembly in aerospace applications 航空航天应用中的无铅微电子装配

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368042

A. Shapiro, J. Bonner, O. Ogunseitan, J.-D.M. Shphores, J. Schoenung

引用次数: 0

A new control allocation method that accounts for effector dynamics 考虑效应器动力学的一种新的控制分配方法

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368067

R. Venkataraman, M. Oppenheimer, D. Doman

引用次数: 11

A low weight/power/cost infrared Earth sensor 一种低重量/低功耗/低成本的红外地球传感器

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368068

G. Falbel

引用次数: 10

The l/f noise characteristics of a Schottky Junction Transistor: an ultra-low power, radiation hardened sub-threshold MESFET 肖特基结晶体管的l/f噪声特性:一种超低功耗、抗辐射亚阈值MESFET

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.4620172

R.J. Anderson, J. Spann, J. Yang, T. Thornton

引用次数: 1

Johnson noise thermometry for harsh environments 约翰逊噪声测温仪用于恶劣环境

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-13 DOI: 10.1109/AERO.2004.1368053

R. Kisner, C. Britton, U. Jagadish, J. Wilgen, M. Roberts, T. Blalock, D. Holcomb, M. Bobrek, M. Ericson

{"title":"Johnson noise thermometry for harsh environments","authors":"R. Kisner, C. Britton, U. Jagadish, J. Wilgen, M. Roberts, T. Blalock, D. Holcomb, M. Bobrek, M. Ericson","doi":"10.1109/AERO.2004.1368053","DOIUrl":"https://doi.org/10.1109/AERO.2004.1368053","url":null,"abstract":"The technology of temperature measurement appears to some to be a mature field. However, to many, requirements for improved performance and reliability are a driver for continual scientific and technology advancement. Although Johnson noise has been proposed as a thermometry method for several decades, it is only recently that digital and analog electronics have made it possible to economically fabricate measurement systems based on Johnson noise. Johnson noise, which is a result of fundamental physics, is caused by the random thermal motions of electrons in all conductors. Its fundamental nature allows us to construct temperature measurement systems that do not require periodic calibration. Thus long, unattended operating intervals are feasible. Several unique implementations of Johnson noise thermometry (JNT) are possible. One permits temperature measurement without contacting the measured surface nductive JNT. Another implementation measures the Johnson noise of a resistance element in contact with the measured surface - conductive JNT. The resistive element in conductive JNT can be an RTD. Apparatus have been recently fabricated demonstrating the practicality of both JNT implementations. A demonstration of conductive JNT is planned at a nuclear facility within two years. We present new hardware implementations that allow real-time calibration of the signals that have the potential of allowing a fully-integrated, physically small and robust system to be achieved.","PeriodicalId":208052,"journal":{"name":"2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)","volume":"296 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132952181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10