Design, Automation and Test in Europe最新文献

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Power-Aware Testing and Test Strategies for Low Power Devices 低功耗器件的功耗感知测试和测试策略
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1109/DATE.2008.4484642
D. Gizopoulos, K. Roy, P. Girard, N. Nicolici, X. Wen
{"title":"Power-Aware Testing and Test Strategies for Low Power Devices","authors":"D. Gizopoulos, K. Roy, P. Girard, N. Nicolici, X. Wen","doi":"10.1109/DATE.2008.4484642","DOIUrl":"https://doi.org/10.1109/DATE.2008.4484642","url":null,"abstract":"Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124983288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 172
Hot topic: 3D integration or how to scale in the 21st century 热门话题:3D集成或如何在21世纪扩展
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403739
B. Bougard, P. Marchal, L. Benini, D. Keitel-Schulz, Neal Checka
{"title":"Hot topic: 3D integration or how to scale in the 21st century","authors":"B. Bougard, P. Marchal, L. Benini, D. Keitel-Schulz, Neal Checka","doi":"10.1145/1403375.1403739","DOIUrl":"https://doi.org/10.1145/1403375.1403739","url":null,"abstract":"3D integration offers numerous opportunities for design, and is probably the best hope for carrying ICs along (and even beyond) the path of Moore's Law in the 21st century. However, many questions still need to be answered to take advantage of 3D. First, what will become the mainstream 3D technology? Today, many technology options are proposed, but each having different cost, design and test implications. Secondly, how to make 3D designs reliable? Many unknowns still exist related to thermal load, reliability and signal integrity challenges. Finally, what about design solutions/methods and architectural modifications for 3D integration? The objective of this special session is to create a better understanding of forthcoming 3D technologies, their implication on design and test. An attempt will be made to roadmap 3D technologies and their design implications. This will enable R&D planning by design houses, EDA vendors, foundries and academia, paving the way for a widespread acceptance of 3D technologies.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133093958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Software for wireless networked embedded systems 无线联网嵌入式系统软件
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403464
J. Beutel, M. Beigl, A. Dunkels, K. Langendoen
{"title":"Software for wireless networked embedded systems","authors":"J. Beutel, M. Beigl, A. Dunkels, K. Langendoen","doi":"10.1145/1403375.1403464","DOIUrl":"https://doi.org/10.1145/1403375.1403464","url":null,"abstract":"Embedded systems driven by future applications will be tightly coupled with the increasing complexity of the real world. Consisting of myriads of wireless networked devices, of heterogeneous architectures, distributed and interacting in a number of ways and serving a multitude of purposes systems have to adapt and take advantage of conditions unpredictable at design time.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128612841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft Errors: System Effects, Protection Techniques and Case Studies 软错误:系统影响,保护技术和案例研究
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1109/DATE.2008.4484646
D. Gizopoulos, K. Roy, S. Mitra, P. Sanda
{"title":"Soft Errors: System Effects, Protection Techniques and Case Studies","authors":"D. Gizopoulos, K. Roy, S. Mitra, P. Sanda","doi":"10.1109/DATE.2008.4484646","DOIUrl":"https://doi.org/10.1109/DATE.2008.4484646","url":null,"abstract":"","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125336595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliable services in an imperfect world 不完美世界中的可靠服务
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403646
H. Kopetz
{"title":"Reliable services in an imperfect world","authors":"H. Kopetz","doi":"10.1145/1403375.1403646","DOIUrl":"https://doi.org/10.1145/1403375.1403646","url":null,"abstract":"With the ongoing trends of hardware complexity -- device density increases, reducing geometrics, lower switching threshholds etc - hardware increasingly exhibits transient faults. Software is not perfect and the increasing complexity results in Heisenbugs. Consequently it becomes a complex technological challenge to build dependable embedded systems that can accommodate and mitigate these facts of hardware and software transients such that the user perceived services are not seriously impacted.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125384269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Caution ahead: the road to design and manufacturing at 32 and 22 nm 请注意:32和22纳米的设计和制造之路
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403496
S. Turnoy, Peter Wintermayr, R. Aitken, R. Lauwereins, J. Weed, V. Kiefer, J. Hartmann
{"title":"Caution ahead: the road to design and manufacturing at 32 and 22 nm","authors":"S. Turnoy, Peter Wintermayr, R. Aitken, R. Lauwereins, J. Weed, V. Kiefer, J. Hartmann","doi":"10.1145/1403375.1403496","DOIUrl":"https://doi.org/10.1145/1403375.1403496","url":null,"abstract":"At 32 and 22 nm, which manufacturing technology changes will be so revolutionary as to cause upheavals in the semiconductor supply chain and on design practices?","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"11 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127078201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Perspective on embedded systems: challenges, solutions and research priorities 嵌入式系统的观点:挑战、解决方案和研究重点
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403378
Dominique Vernay
{"title":"Perspective on embedded systems: challenges, solutions and research priorities","authors":"Dominique Vernay","doi":"10.1145/1403375.1403378","DOIUrl":"https://doi.org/10.1145/1403375.1403378","url":null,"abstract":"The societal demands in Europe for Health, Security & Safety, Energy & Environment, and the market demands in nomadic, transport, communications, entertainment products, ask for innovations and technical leadership. Enabling embedded Systems require new challenging solutions like multi-physics devices, millions of interconnected nodes, very low power for autonomy, trusted and safe operations, reliability.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128784292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Model-based-design is nice but... 基于模型的设计很好,但是……
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403510
H. Hanselmann
{"title":"Model-based-design is nice but...","authors":"H. Hanselmann","doi":"10.1145/1403375.1403510","DOIUrl":"https://doi.org/10.1145/1403375.1403510","url":null,"abstract":"Without Model-Based-Design (MBD) today's automotive embedded systems would not exist. However, MBD generates its own challenges. Tools and concepts are helping in many areas, but the user's needs often seem to outpace the capabilities of tools and processes, especially for large systems with complex software interacting across boundaries. System Design is underdeveloped. In this keynote, an assessment of the current situation is given as well as a vision of how developers should design and test systems in the future.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114353998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dependable embedded systems special day panel: issues and challenges in dependable embedded systems 可靠嵌入式系统专题专题小组:可靠嵌入式系统的问题和挑战
Design, Automation and Test in Europe Pub Date : 2008-03-10 DOI: 10.1145/1403375.1403712
N. Suri, C. Fetzer, J. Abraham, S. Poledna, A. Mendelson, S. Mitra
{"title":"Dependable embedded systems special day panel: issues and challenges in dependable embedded systems","authors":"N. Suri, C. Fetzer, J. Abraham, S. Poledna, A. Mendelson, S. Mitra","doi":"10.1145/1403375.1403712","DOIUrl":"https://doi.org/10.1145/1403375.1403712","url":null,"abstract":"Embedded Systems are pervasively appearing in virtually all walks of life - communication, computing, e-/m-commerce, leisure, medical, WSN, transportation, biometrics. The utility of these embedded systems and services is based, in large part, in our depending on their sustained functionality in spite of the encountered operational or malicious disruptions. As the number of transient and also permanent disruptions (given the decreasing device geometries, higher device density, lower voltage latching, faster clocks etc) is expected to increase substantially, this will not only be a key issue for the hardware community but also the systems community in general. Solutions using a combination of hardware and software might be more effective than hardware-only or software-only solutions.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129949578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Flying embedded: the industrial scene and challenges for embedded systems in aeronautics and space 嵌入式飞行:航空航天嵌入式系统的工业场景和挑战
Design, Automation and Test in Europe Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266638
J. Botti
{"title":"Flying embedded: the industrial scene and challenges for embedded systems in aeronautics and space","authors":"J. Botti","doi":"10.1145/1266366.1266638","DOIUrl":"https://doi.org/10.1145/1266366.1266638","url":null,"abstract":"This keynote address, given by an executive representative of the European aeronautics and space industry, introduces the strategic stakes and the international competitive landscape, for further development and understanding of the sizing dimensions of technology transfer all along the special day.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126001537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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