Proceedings of Annual Symposium on Fault Tolerant Computing最新文献_第4页

Limitations of VLSI implementation of delay-insensitive codes 延迟不敏感码的VLSI实现限制

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534608

V. Akella, N. Vaidya, G. Redinbo

{"title":"Limitations of VLSI implementation of delay-insensitive codes","authors":"V. Akella, N. Vaidya, G. Redinbo","doi":"10.1109/FTCS.1996.534608","DOIUrl":"https://doi.org/10.1109/FTCS.1996.534608","url":null,"abstract":"Implementation of delay-insensitive (DI) or unordered codes is the subject of this paper. We present two different architectures for decoding systematic DI codes: (a) an enumeration-based decoder, and (b) a comparison-based decoder. We argue that enumeration-based decoders are often impractical for many realistic codes. Comparison-based decoders that detect arrival of a code word by comparing the received check bit with check bits evaluated using the received data are practical but suffer from the following limitation. If the decoder is to be implemented using asynchronous logic, i.e., if the gate and wire delays are arbitrary (unbounded but finite), then it is impossible to design a comparison-based decoder for any code that is more efficient than a dual-rail code. In other words, the encoded word must contain at least twice as many bits as the data. The paper shows that comparison-based decoders for codes that have the requisite level of redundancy can be implemented using asynchronous logic. The paper also shows that, by relaxing the delay assumptions, it is possible to implement decoders for delay-insensitive codes that are more efficient than dual-rail codes.","PeriodicalId":191163,"journal":{"name":"Proceedings of Annual Symposium on Fault Tolerant Computing","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125728342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 17

Symbol error correcting codes for memory applications 存储器应用的符号纠错码

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534607

Scott Chen

引用次数: 33

Supporting nondeterministic execution in fault-tolerant systems 在容错系统中支持不确定性执行

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534611

J. Slye, E. Elnozahy

引用次数: 52

Dynamic test compaction for synchronous sequential circuits using static compaction techniques 用静态压实技术对同步顺序电路进行动态测试压实

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534594

I. Pomeranz, S. Reddy

{"title":"Dynamic test compaction for synchronous sequential circuits using static compaction techniques","authors":"I. Pomeranz, S. Reddy","doi":"10.1109/FTCS.1996.534594","DOIUrl":"https://doi.org/10.1109/FTCS.1996.534594","url":null,"abstract":"Short test sequences for synchronous sequential circuits are important in reducing test application time and memory requirements. In addition, dynamic test compaction, where heuristics to generate short test sequences are incorporated into the test generation process, may also reduce test generation time. This is due to the fact that a smaller number of test vectors needs to be generated. We present a dynamic test compaction procedure. The compaction heuristics we use are based on previously proposed static compaction techniques. Conventionally, static compaction is applied as a postprocessing step, after the test sequence has been generated. In the proposed procedure, static compaction techniques are used while the test sequence is being generated, to reduce the need for postprocessing, or static compaction. Compared to other dynamic compaction procedures that generate very short test sequences, the computational overhead involved in the proposed procedure is significantly lower, yet short test sequences are obtained. The proposed techniques can be incorporated into other test generation procedures, to reduce the test lengths they produce.","PeriodicalId":191163,"journal":{"name":"Proceedings of Annual Symposium on Fault Tolerant Computing","volume":"204 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133003872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 35

Technologies for designing dependable A/D converters 可靠A/D转换器的设计技术

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534629

K. Kawamura, T. Matsubara, Y. Koga

引用次数: 0

Self-checking and fail-safe LSIs by intra-chip redundancy 芯片内冗余的自检和故障安全lsi

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534628

N. Kanekawa, M. Nohmi, Yoshimichi Satoh, H. Satoh

引用次数: 12

An approach towards benchmarking of fault-tolerant commercial systems 对容错商业系统进行基准测试的方法

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534616

T. Tsai, R. Iyer, Doug Jewitt

引用次数: 130

Spare processor allocation for fault tolerance in torus-based multicomputers 基于环的多计算机容错备用处理器分配

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534613

M. M. Bae, B. Bose

引用次数: 22

A comparative analysis of event tupling schemes 事件耦合方案的比较分析

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534614

Michael F. Buckley, D. Siewiorek

引用次数: 40

Generation of an error set that emulates software faults based on field data 生成一个错误集，根据现场数据模拟软件故障

Proceedings of Annual Symposium on Fault Tolerant Computing Pub Date : 1996-06-25 DOI: 10.1109/FTCS.1996.534615

J. Christmansson, R. Chillarege

{"title":"Generation of an error set that emulates software faults based on field data","authors":"J. Christmansson, R. Chillarege","doi":"10.1109/FTCS.1996.534615","DOIUrl":"https://doi.org/10.1109/FTCS.1996.534615","url":null,"abstract":"A significant issue in fault injection experiments is that the injected faults are representative of software faults observed in the field. Another important issue is the time used, as we want experiments to be conducted without excessive time spent waiting for the consequences of a fault. An approach to accelerate the failure process would be to inject errors instead of faults, but this would require a mapping between representative software faults and injectable errors. Furthermore, it must be assured that the injected errors emulate software faults and not hardware faults. These issues were addressed in a study of software faults encountered in one release of a large IBM operating system product. The key results are: A general procedure that uses field data to generate a set of injectable errors, in which each error is defined by: error type, error location and injection condition. The procedure assures that the injected errors emulate software faults and not hardware faults. The faults are uniformly distributed (1.37 fault per module) over the affected modules. The distribution of error categories in the IBM operating system and the distribution of errors in the Tandem Guardian90 operating system reported previously were compared and found to be similar. This result adds a flavor of generality to the field data presented in the current paper.","PeriodicalId":191163,"journal":{"name":"Proceedings of Annual Symposium on Fault Tolerant Computing","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132912901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 165